A method is described for measuring the dielectric tensor of perpendicularly magnetized metal films that are overcoated with a protective transparent layer. It uses a combination of ellipsometric and polar Kerr measurements and employs a series of consistency checks to ensure the accuracy of the data analysis. As an example, the technique is applied to an amorphous terbium-iron alloy that was overcoated in situ with silicon dioxide.
© 1983 Optical Society of America
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