OSA Publishing

15 October 1983, Volume 22, Issue 20, pp. 3137-3304   31 articles

Patents Patter

Appl. Opt. 22(20), 3137-3228 (1983)  View: PDF

Polishing precision optical components: a technique for rigid stress-free blocking

Appl. Opt. 22(20), 3144-3146 (1983)  View: HTML | PDF

Angular tolerance on Dove prisms

Appl. Opt. 22(20), 3146-3147 (1983)  View: HTML | PDF

Photoacoustic measurement of water vapor and CO2 absorption coefficients at HF laser wavelengths

Appl. Opt. 22(20), 3148-3149 (1983)  View: HTML | PDF

Electrooptical matrix multiplication using the twos complement arithmetic for improved accuracy: erratum

Appl. Opt. 22(20), 3149-3149 (1983)  View: HTML | PDF

Generalized equations for the resolution of laser scanners

Appl. Opt. 22(20), 3149_1-3151 (1983)  View: HTML | PDF

Gaussian beam ray-equivalent modeling and optical design: erratum

Appl. Opt. 22(20), 3151-3151 (1983)  View: HTML | PDF

New class of materials for optical isolators

Appl. Opt. 22(20), 3152-3154 (1983)  View: HTML | PDF

Measurement of the magnetooptical constants of reactive metals

Appl. Opt. 22(20), 3155-3159 (1983)  View: HTML | PDF

Erase rates in photorefractive materials with two photoactive species

Appl. Opt. 22(20), 3160-3164 (1983)  View: HTML | PDF

Reversible optical storage on a low-doped Te-based chalcogenide film with a capping layer

Appl. Opt. 22(20), 3165-3168 (1983)  View: HTML | PDF

Thermal-wave detection and thin-film thickness measurements with laser beam deflection

Appl. Opt. 22(20), 3169-3176 (1983)  View: HTML | PDF

Measuring refractive index and thickness of thin films: a new technique

Appl. Opt. 22(20), 3177-3181 (1983)  View: HTML | PDF

Lower emissivity limits indicated for high temperature selective surfaces

Appl. Opt. 22(20), 3182-3190 (1983)  View: HTML | PDF

Determination of optical constants of thin film coating materials based on inverse synthesis

Appl. Opt. 22(20), 3191-3200 (1983)  View: HTML | PDF

Oxidation effect on the optical properties of copper discontinuous films

Appl. Opt. 22(20), 3201-3203 (1983)  View: HTML | PDF

Infrared optical properties of electron-beam evaporated silicon oxynitride films

Appl. Opt. 22(20), 3204-3206 (1983)  View: HTML | PDF

Optical elements with ultrahigh spatial-frequency surface corrugations

Appl. Opt. 22(20), 3220-3228 (1983)  View: HTML | PDF

Improvement in the transmission of iodine-polyvinyl alcohol polarizers

Appl. Opt. 22(20), 3229-3231 (1983)  View: HTML | PDF

Finite fringe shadow moire slope mapping of diffusive objects

Appl. Opt. 22(20), 3232-3235 (1983)  View: HTML | PDF

Monte Carlo simulation of the performance of PMMA luminescent solar collectors

Appl. Opt. 22(20), 3236-3241 (1983)  View: HTML | PDF

Achromatic and sharp real imaging of a point by a single aspheric lens

Appl. Opt. 22(20), 3242-3248 (1983)  View: HTML | PDF

Variable anamorphic lens for a 35-mm SLR

Appl. Opt. 22(20), 3249-3257 (1983)  View: HTML | PDF

Optical range finder for 1.5–10-m distances

Appl. Opt. 22(20), 3258-3264 (1983)  View: HTML | PDF

Accurate determination of the vapor pressure of potassium using optical absorption

Appl. Opt. 22(20), 3265-3270 (1983)  View: HTML | PDF

Books

Appl. Opt. 22(20), 3270-3304 (1983)  View: HTML | PDF

Tunable VUV light generation for the low-level resonant ionization detection of krypton

Appl. Opt. 22(20), 3271-3275 (1983)  View: HTML | PDF

Laser-induced damage in optical materials: thirteenth ASTM symposium

Appl. Opt. 22(20), 3276-3296 (1983)  View: HTML | PDF

Lensless one-step rainbow holography using a synthesized masking slit

Appl. Opt. 22(20), 3300-3304 (1983)  View: HTML | PDF

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