Expand this Topic clickable element to expand a topic
OSA Publishing

OSA Publishing is the largest peer-reviewed collection of optics and photonics information in the world.

Recently Published
Ground Simulation Method for Arbitrary Distance Optical Transmission of a Free-Space Laser Communication System Based on an Optical Fiber Nanoprobe

Jianmin Wang, Gang Wang, Rumeng Bai, Bin Li, and Ye Zhou
J. Opt. Commun. Netw. 9(12) 1136-1144 (2017)

Interferometric synthetic aperture microscopy for extended focus optical coherence microscopy

Séverine Coquoz, Arno Bouwens, Paul J. Marchand, Jérôme Extermann, and Theo Lasser
Opt. Express 25(24) 30807-30819 (2017)

Automated multimodal spectral histopathology for quantitative diagnosis of residual tumour during basal cell carcinoma surgery

Radu Boitor, Kenny Kong, Dustin Shipp, Sandeep Varma, Alexey Koloydenko, Kusum Kulkarni, Somaia Elsheikh, Tom Bakker Schut, Peter Caspers, Gerwin Puppels, Martin van der Wolf, Elena Sokolova, T. E. C. Nijsten, Brogan Salence, Hywel Williams, and Ioan Notingher
Biomed. Opt. Express 8(12) 5749-5766 (2017)

Optics & Photonics News (OPN) is the Optical Society's monthly news magazine.

Subscription is a benefit of Optical Society (OSA) membership. Join Now.

Top Downloads for October 2017
  1. Bio-inspired color-polarization imager for real-time in situ imaging
  2. Single-shot multispectral imaging with a monochromatic camera
  3. Optical constants and structural properties of thin gold films
  4. Toward all-fiber supercontinuum spanning the mid-infrared
  5. Highly flexible and stretchable optical strain sensing for human motion detection
Top Downloads By Journal >
Announcements

More Announcements >

Spotlight on Optics
Photonic lantern kW-class fiber amplifier
Summary by James R. Taylor

Limitations in the power scaling of both solid state and fiber lasers are characterized by severe transverse mode...

Mapping the aberrations of a wide-field spectrograph using a photonic comb
Summary by Bert A. Pasquale and Edward J. Wollack

The current generation of astronomical instrumentation requires new levels of precision to achieve their scientific...

Determination of refractive index and layer thickness of nm-thin films via ellipsometry
Summary by Johann Toudert

Determining both the refractive index and thickness of few-nm films by ellipsometry is no longer impossible. Measuring...

Visit Spotlight on Optics >

Select as filters


    Select Topics Cancel
    © Copyright 2017 | The Optical Society. All Rights Reserved