Abstract

A conventional PCSA ellipsometer has been used to measure the transverse Kerr magnetooptic effect. The ellipsometer null was first obtained, and the ellipsometric ψ and Δ were determined from this measurement. Then measurements were made as a function of polarizer angle while A = ±ψ. The magnetic field applied to the sample was square wave modulated, and both the dc and the modulated light intensities were measured. dI/I was a linear function of cosϕ/(1 ∓ sinϕ), where ϕ = Δ − 2P. The ordinate intercept and the slope of the resulting straight line were the real and imaginary parts, respectively, of drp/rp. From ψ, Δ, and drp/rp the material quantities n¯ and Q¯ could be calculated.

© 1979 Optical Society of America

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