Abstract
We demonstrate ultra-low propagation loss, lithographic precision, and wafer-scale manufacturing for high-density Si3N4 photonic integrated circuits using an efficient DUV-based subtractive approach. We show a propagation loss as low as 1.4 dB/m at 1.55 µm.
© 2024 The Author(s)
PDF ArticleMore Like This
Xinru Ji, Rui Ning Wang, Zheru Qiu, and Tobias J. Kippenberg
ce_8_2 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2023
Xinru Ji, Rui Ning Wang, Zheru Qiu, and Tobias J. Kippenberg
AM2R.2 CLEO: Applications and Technology (CLEO:A&T) 2023
L. Youssef, H. El Dirani, C. Petit-Etienne, S. Kerdiles, P. Grosse, C. Sciancalepore, and E. Pargon
FTh3C.5 Frontiers in Optics (FiO) 2019