Abstract

The x-ray wavefront downstream of a Fresnel zone plate (FZP) was characterized using a two-dimensional grating interferometer. Transverse wavefront slope maps, measured using a raster phase-stepping scan, allowed accurate phase reconstruction of the x-ray beam. Wavefront measurements revealed that the wavefront error is very sensitive to the input beam entering the FZP. A small stack of one-dimensional compound refractive lenses was used to introduce astigmatism in the probing x-ray beam to investigate the contribution of the incoming beam in contrast to the optical aberrations. Experimental data were shown to be consistent with theoretical calculations.

© 2013 Optical Society of America

X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer

S. Berujon, H. Wang, I. Pape, K. Sawhney, S. Rutishauser, and C. David
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Quantitative X-ray wavefront measurements of Fresnel zone plate and K-B mirrors using phase retrieval

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Coherent x-ray wavefront reconstruction of a partially illuminated Fresnel zone plate

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Ion beam lithography for Fresnel zone plates in X-ray microscopy

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Hard X-ray nano-holotomography with a Fresnel zone plate

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Opt. Express 28(25) 37514-37525 (2020)