We demonstrate a method for substantially improving the axial resolution of terahertz time-of-flight measurements by analyzing the time-dependent polarization direction of an elliptically polarized single-cycle terahertz electromagnetic (T-ray) pulse. We show that, at its most sensitive, the technique has an axial resolution of () with a subsecond measurement time, and very clear T-ray topographic images are obtained. Such a very high axial resolution of the T-ray topography opens the way for novel industrial and biomedical applications such as fine metalworking and corneal inspection in a safe manner.
© 2012 Optical Society of AmericaFull Article | PDF Article
John A. Rogers, Adrian Gh. Podoleanu, George M. Dobre, David A. Jackson, and Fred W. Fitzke
Opt. Express 9(10) 533-545 (2001)
Christopher Bowd, Linda M. Zangwill, Eytan Z. Blumenthal, Cristiana Vasile, Andreas G. Boehm, Parag A. Gokhale, Kourosh Mohammadi, Payam Amini, Timothy M. Sankary, and Robert N. Weinreb
J. Opt. Soc. Am. A 19(1) 197-207 (2002)
Michael Pircher, Erich Götzinger, Rainer Leitgeb, Harald Sattmann, Oliver Findl, and Christoph. K. Hitzenberger
Opt. Express 12(24) 5940-5951 (2004)