A big problem in low-coherence interference microscopy is the degradation of the coherence signal caused by shift of the angular and temporal spectrum gates. It limits the depth of field in confocal optical coherence microscopy and degrades images of sample inner structure in most interference microscopy techniques. To overcome this problem we propose numerical correction of the coherence gate in application to full-field swept-source interference microscopy. The proposed technique allows three-dimensional sample imaging without mechanical movement of the microscope components and is also capable of determining separately the geometrical thickness and the refractive index of the sample layers, when the sample contains a transversal pattern. The applicability of the proposed technique is verified with numerical simulation.
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