Abstract

A nontomography approach for the measurement of angular-dependent coherent-scatter cross section of x rays (E4080keV) is described. It is shown that an analyzer crystal, which is proposed to be used for the sampling of the cross section, simultaneously provides information about the location of the scattering volume inside the object. A numerical simulation demonstrates that this method can be applied for nondestructive analysis of an object’s internal structure.

© 2011 Optical Society of America

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