Abstract

We propose an imaging principle that employs a radially polarized zeroth-order Bessel beam in the illlumination system of the localized surface plasmon microscope. The illumination system enables the microscope to visualize a refractive index distribution on a substrate fabricated in the Kretschmann configuration by the measurement of reflected intensity. The experimentally observed image of a particle reveals that the spatial resolution reaches the optical diffraction limit. The proposed principle can contribute to increase the imaging speed of localized surface plasmon microscopy by use of a beam scanning device.

© 2009 Optical Society of America

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2007 (1)

2004 (1)

2003 (1)

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

2000 (1)

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

1998 (1)

1997 (1)

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

1995 (2)

S. Masuda, T. Nose, and S. Sato, Opt. Rev. 2, 211 (1995).
[CrossRef]

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

1994 (1)

C. E. H. Berger, R. P. H. Kooyman, and J. Greve, Rev. Sci. Instrum. 65, 2829 (1994).
[CrossRef]

1990 (1)

W. Hickel and W. Knoll, Thin Solid Films 187, 349 (1990).
[CrossRef]

1988 (1)

B. Rothenhäusler and W. Knoll, Nature 332, 615 (1988).
[CrossRef]

1987 (1)

1968 (1)

E. Kretschmann and H. Raether, Z. Naturforsch. A 23, 2135 (1968).

Berger, C. E. H.

C. E. H. Berger, R. P. H. Kooyman, and J. Greve, Rev. Sci. Instrum. 65, 2829 (1994).
[CrossRef]

Corn, R. M.

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Durnin, J.

Frutos, A. G.

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Greve, J.

C. E. H. Berger, R. P. H. Kooyman, and J. Greve, Rev. Sci. Instrum. 65, 2829 (1994).
[CrossRef]

Hickel, W.

W. Hickel and W. Knoll, Thin Solid Films 187, 349 (1990).
[CrossRef]

Horiguchi, N.

Jordan, C. E.

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Kano, H.

Kawata, S.

Knoll, W.

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

W. Hickel and W. Knoll, Thin Solid Films 187, 349 (1990).
[CrossRef]

B. Rothenhäusler and W. Knoll, Nature 332, 615 (1988).
[CrossRef]

Kooyman, R. P. H.

C. E. H. Berger, R. P. H. Kooyman, and J. Greve, Rev. Sci. Instrum. 65, 2829 (1994).
[CrossRef]

Kretschmann, E.

E. Kretschmann and H. Raether, Z. Naturforsch. A 23, 2135 (1968).

Lawall, R.

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

Liley, M.

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

Masuda, S.

S. Masuda, T. Nose, and S. Sato, Opt. Rev. 2, 211 (1995).
[CrossRef]

Miyaji, G.

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Miyanaga, N.

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Mizuguchi, S.

Nomura, D.

Nose, T.

S. Masuda, T. Nose, and S. Sato, Opt. Rev. 2, 211 (1995).
[CrossRef]

Ohbayashi, K.

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Okahata, Y.

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

Piscevic, D.

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

Raether, H.

E. Kretschmann and H. Raether, Z. Naturforsch. A 23, 2135 (1968).

H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer, 1988).

Rothenhäusler, B.

B. Rothenhäusler and W. Knoll, Nature 332, 615 (1988).
[CrossRef]

Sato, S.

S. Masuda, T. Nose, and S. Sato, Opt. Rev. 2, 211 (1995).
[CrossRef]

Shibuya, H.

Smith, L. M.

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Sueda, K.

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Thiel, A. J.

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Tsubakimoto, K.

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Veith, M.

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

Watanabe, K.

Anal. Chem. (1)

A. J. Thiel, A. G. Frutos, C. E. Jordan, R. M. Corn, and L. M. Smith, Anal. Chem. 69, 4948 (1997).
[CrossRef]

Appl. Opt. (2)

Appl. Surf. Sci. (1)

D. Piscevic, R. Lawall, M. Veith, M. Liley, Y. Okahata, and W. Knoll, Appl. Surf. Sci. 90, 425 (1995).
[CrossRef]

J. Opt. Soc. Am. A (1)

J. Opt. Soc. Am. B (1)

Nature (1)

B. Rothenhäusler and W. Knoll, Nature 332, 615 (1988).
[CrossRef]

Opt. Commun. (1)

H. Kano and W. Knoll, Opt. Commun. 182, 11 (2000).
[CrossRef]

Opt. Rev. (1)

S. Masuda, T. Nose, and S. Sato, Opt. Rev. 2, 211 (1995).
[CrossRef]

Rev. Laser Eng. (1)

G. Miyaji, K. Ohbayashi, K. Sueda, K. Tsubakimoto, and N. Miyanaga, Rev. Laser Eng. 32, 259 (2003).
[CrossRef]

Rev. Sci. Instrum. (1)

C. E. H. Berger, R. P. H. Kooyman, and J. Greve, Rev. Sci. Instrum. 65, 2829 (1994).
[CrossRef]

Thin Solid Films (1)

W. Hickel and W. Knoll, Thin Solid Films 187, 349 (1990).
[CrossRef]

Z. Naturforsch. A (1)

E. Kretschmann and H. Raether, Z. Naturforsch. A 23, 2135 (1968).

Other (1)

H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer, 1988).

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Figures (5)

Fig. 1
Fig. 1

Illumination setup of the localized SP microscope employing a zeroth-order Bessel beam.

Fig. 2
Fig. 2

Measurement principle of refractive index variation. The signal of the variation can be obtained from reflectance at the incident angle θ i .

Fig. 3
Fig. 3

Optical setup of the localized SP microscope with the radially polarized Bessel beam illumination.

Fig. 4
Fig. 4

Intensity distributions at the exit pupil of the objective lens with (a) slightly misaligned and (b) optimized conditions.

Fig. 5
Fig. 5

(a) Observed result of a latex particle with the diameter of 175 nm . (b) Calculated result of electric field intensity on the metal surface.

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