Abstract

We demonstrate in situ characterization of a spatially varying polarization state of an optical field at the focus of a scanning third-harmonic generation (THG) optical microscope. Polarization projections are measured by forming THG images of a polystyrene microsphere scanned through the focused beam and combined in a noniterative phase-retrieval algorithm. Controlled spatially varying polarization states are introduced by imaging spatially inhomogeneous polarization distributions constructed with reflective spatial light modulator to the focal plane of a microscope objective.

© 2009 Optical Society of America

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