Abstract

A refractometric sensor resorting to a vertically coupled polymeric microdisk resonator was demonstrated, estimating the refractive index (RI) of an analyte by monitoring the resonant wavelength shift in its transfer characteristics. The disk resonator was especially overlaid with a high RI TiO2 film, thereby reinforcing the interaction of the evanescent field of its guided mode with the analyte. The sensitivity of the sensor was theoretically and experimentally confirmed to be enhanced by adjusting the overlay thickness. The fabricated sensor provided the maximum sensitivity of 294nm/RIU (refractive index unit) with the 40-nm-thick overlay, which is equivalent to an improvement of 150% compared with the case without the overlay.

© 2009 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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  11. Fimmwave, Photon Design, http://www.photond.com.
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    [CrossRef]

2008 (1)

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

2007 (2)

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

K. D. Vos, I. Bartolozzi, E. Schacht, P. Bienstman, and R. Baets, Opt. Express 15, 7610 (2007).
[CrossRef] [PubMed]

2006 (2)

S. Y. Cho and N. M. Jokerst, IEEE Photon. Technol. Lett. 18, 2096 (2006).
[CrossRef]

C. Y. Chao, W. Fung, and L. J. Guo, IEEE J. Sel. Top. Quantum Electron. 12, 134 (2006).
[CrossRef]

2003 (1)

C. Y. Chao and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

2002 (1)

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

2001 (1)

2000 (1)

1992 (1)

Y. Liu, P. Hering, and M. O. Scully, Appl. Phys. B 54, 18 (1992).
[CrossRef]

Baets, R.

Bartolozzi, I.

Bienstman, P.

Boyd, R. W.

Casamassima, B.

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

Chao, C. Y.

C. Y. Chao, W. Fung, and L. J. Guo, IEEE J. Sel. Top. Quantum Electron. 12, 134 (2006).
[CrossRef]

C. Y. Chao and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

Cho, S. Y.

S. Y. Cho and N. M. Jokerst, IEEE Photon. Technol. Lett. 18, 2096 (2006).
[CrossRef]

De Leonardis, F.

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

Dell'Olio, F.

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

Fung, W.

C. Y. Chao, W. Fung, and L. J. Guo, IEEE J. Sel. Top. Quantum Electron. 12, 134 (2006).
[CrossRef]

Guo, L. J.

C. Y. Chao, W. Fung, and L. J. Guo, IEEE J. Sel. Top. Quantum Electron. 12, 134 (2006).
[CrossRef]

C. Y. Chao and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

Heebner, J. E.

Hering, P.

Y. Liu, P. Hering, and M. O. Scully, Appl. Phys. B 54, 18 (1992).
[CrossRef]

Itoh, K.

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Z. Qi, K. Itoh, and M. Murabayashi, Opt. Lett. 25, 1427 (2000).
[CrossRef]

Jokerst, N. M.

S. Y. Cho and N. M. Jokerst, IEEE Photon. Technol. Lett. 18, 2096 (2006).
[CrossRef]

Kim, G. D.

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

Kim, K. D.

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

Kim, W. K.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Kwon, S. W.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Lavers, C. R.

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Lee, H. M.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Lee, H. S.

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

Lee, H. Y.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Lee, S. D.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Lee, S. S.

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Liu, Y.

Y. Liu, P. Hering, and M. O. Scully, Appl. Phys. B 54, 18 (1992).
[CrossRef]

Matsuda, N.

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Murabayashi, M.

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Z. Qi, K. Itoh, and M. Murabayashi, Opt. Lett. 25, 1427 (2000).
[CrossRef]

Passaro, V.

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

Qi, Z.

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Z. Qi, K. Itoh, and M. Murabayashi, Opt. Lett. 25, 1427 (2000).
[CrossRef]

Schacht, E.

Scully, M. O.

Y. Liu, P. Hering, and M. O. Scully, Appl. Phys. B 54, 18 (1992).
[CrossRef]

Son, G. S.

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Vos, K. D.

Yang, W. S.

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Appl. Opt. (1)

Appl. Phys. B (1)

Y. Liu, P. Hering, and M. O. Scully, Appl. Phys. B 54, 18 (1992).
[CrossRef]

Appl. Phys. Lett. (1)

C. Y. Chao and L. J. Guo, Appl. Phys. Lett. 83, 1527 (2003).
[CrossRef]

IEEE J. Sel. Top. Quantum Electron. (1)

C. Y. Chao, W. Fung, and L. J. Guo, IEEE J. Sel. Top. Quantum Electron. 12, 134 (2006).
[CrossRef]

IEEE Photon. Technol. Lett. (1)

S. Y. Cho and N. M. Jokerst, IEEE Photon. Technol. Lett. 18, 2096 (2006).
[CrossRef]

Opt. Commun. (1)

G. D. Kim, G. S. Son, H. S. Lee, K. D. Kim, and S. S. Lee, Opt. Commun. 281, 4644 (2008).
[CrossRef]

Opt. Express (1)

Opt. Lett. (1)

Sens. Actuators B (1)

Z. Qi, N. Matsuda, K. Itoh, M. Murabayashi, and C. R. Lavers, Sens. Actuators B 81, 254 (2002).
[CrossRef]

Sensors (1)

V. Passaro, F. Dell'Olio, B. Casamassima, and F. De Leonardis, Sensors 7, 508 (2007).
[CrossRef]

Other (2)

G. S. Son, S. W. Kwon, W. K. Kim, W. S. Yang, H. M. Lee, H. Y. Lee, S. D. Lee, and S. S. Lee, in Proceedings of SPIE Photonics West (SPIE, 2009), paper 7218-44.

Fimmwave, Photon Design, http://www.photond.com.

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Figures (4)

Fig. 1
Fig. 1

Configuration of the proposed refractometric sensor based on a polymeric microdisk resonator.

Fig. 2
Fig. 2

Guided-mode profiles as a function of the thickness of a Ti O 2 high RI overlay.

Fig. 3
Fig. 3

Measurement results for the refractometric sensor with the change in the RI of the analyte: (a) transition in the transfer curve for the TE mode, (b) transition in the transfer curve for the TM mode, (c) resonant wavelength shift for the TE mode, (d) resonant wavelength shift for the TM mode.

Fig. 4
Fig. 4

Improvement in the sensitivity with respect to the Ti O 2 overlay thickness. Solid and dotted curves, theoretical results.

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