Abstract

We present a novel noncontact, photothermal technique, based on the focus error signal of a commercial CD pickup head that allows direct determination of absorption in thin films. Combined with extinction methods, this technique yields the scattering contribution to the losses. Surface plasmon polaritons are excited using the Kretschmann configuration in thin Au films of varying thickness. By measuring the extinction and absorption simultaneously, it is shown that dielectric constants and thickness retrieval leads to inconsistencies if the model does not account for scattering.

© 2009 Optical Society of America

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  1. W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
    [CrossRef]
  2. X. Caide and S. Sui, Sens. Actuators B 66, 174 (2000).
    [CrossRef]
  3. R. L. Rich and D. G. Myszka, J. Mol. Recognit. 19, 478 (2006).
    [CrossRef] [PubMed]
  4. T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
    [CrossRef]
  5. W. L. Barnes and J. R. Sambles, Solid State Commun. 55, 921 (1985).
    [CrossRef]
  6. S. Negm and Hassan Talaat, Solid State Commun. 84, 133 (1992).
    [CrossRef]
  7. K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
    [CrossRef]
  8. O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
    [CrossRef]
  9. S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
    [CrossRef]
  10. David R. Lide, Handbook of Chemistry and Physics (CRC Press, 1992-1993).
  11. Michael Bass, Handbook of Optics Volume II (McGraw-Hill, 1995).

2008

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
[CrossRef]

2006

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 19, 478 (2006).
[CrossRef] [PubMed]

2001

K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
[CrossRef]

2000

X. Caide and S. Sui, Sens. Actuators B 66, 174 (2000).
[CrossRef]

1999

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

1992

S. Negm and Hassan Talaat, Solid State Commun. 84, 133 (1992).
[CrossRef]

1985

W. L. Barnes and J. R. Sambles, Solid State Commun. 55, 921 (1985).
[CrossRef]

1981

T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
[CrossRef]

Arakawa, E. T.

T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
[CrossRef]

Balzarotti, F.

O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
[CrossRef]

Barnes, W. L.

W. L. Barnes and J. R. Sambles, Solid State Commun. 55, 921 (1985).
[CrossRef]

Bass, Michael

Michael Bass, Handbook of Optics Volume II (McGraw-Hill, 1995).

Bragas, A. V.

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

Caide, X.

X. Caide and S. Sui, Sens. Actuators B 66, 174 (2000).
[CrossRef]

Chu, C.

K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
[CrossRef]

Coy, J. A.

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

Fan, K.

K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
[CrossRef]

Inagaki, T.

T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
[CrossRef]

Ju, J. J.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Kagami, K.

T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
[CrossRef]

Kim, J.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Kim, J. T.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Kim, M.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Landi, S. M.

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

Lee, W.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Lide, David R.

David R. Lide, Handbook of Chemistry and Physics (CRC Press, 1992-1993).

Martínez, O. E.

O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
[CrossRef]

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

Minogolo, N.

O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
[CrossRef]

Mou, J.

K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
[CrossRef]

Myszka, D. G.

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 19, 478 (2006).
[CrossRef] [PubMed]

Negm and Hassan Talaat, S.

S. Negm and Hassan Talaat, Solid State Commun. 84, 133 (1992).
[CrossRef]

Park, H. Y.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Park, S.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

Rich, R. L.

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 19, 478 (2006).
[CrossRef] [PubMed]

Sambles, J. R.

W. L. Barnes and J. R. Sambles, Solid State Commun. 55, 921 (1985).
[CrossRef]

Sui, S.

X. Caide and S. Sui, Sens. Actuators B 66, 174 (2000).
[CrossRef]

Appl. Phys. B

O. E. Martínez, F. Balzarotti, and N. Minogolo, Appl. Phys. B 90, 69 (2008).
[CrossRef]

J. Appl. Phys.

W. Lee, J. Kim, H. Y. Park, S. Park, M. Kim, J. T. Kim and J. J. Ju, J. Appl. Phys. 103, 073717 (2008).
[CrossRef]

J. Mol. Recognit.

R. L. Rich and D. G. Myszka, J. Mol. Recognit. 19, 478 (2006).
[CrossRef] [PubMed]

Meas. Sci. Technol.

K. Fan, C. Chu, and J. Mou, Meas. Sci. Technol. 12, 2137 (2001).
[CrossRef]

Phys. Rev. B

T. Inagaki, K. Kagami, and E. T. Arakawa, Phys. Rev. B 24, 3644 (1981).
[CrossRef]

Sens. Actuators B

X. Caide and S. Sui, Sens. Actuators B 66, 174 (2000).
[CrossRef]

Solid State Commun.

W. L. Barnes and J. R. Sambles, Solid State Commun. 55, 921 (1985).
[CrossRef]

S. Negm and Hassan Talaat, Solid State Commun. 84, 133 (1992).
[CrossRef]

Ultramicroscopy

S. M. Landi, A. V. Bragas, J. A. Coy, and O. E. Martínez, Ultramicroscopy 77, 207 (1999).
[CrossRef]

Other

David R. Lide, Handbook of Chemistry and Physics (CRC Press, 1992-1993).

Michael Bass, Handbook of Optics Volume II (McGraw-Hill, 1995).

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Figures (3)

Fig. 1
Fig. 1

Experimental setup: a TIRM with a CD pickup head mounted on top as a photothermal detector. L1, L2, and the beam splitter are part of the commercial TIRM.

Fig. 2
Fig. 2

(a) Analysis of light interaction with the sample. A beam strikes the sample with an angle beyond the critical angle, thus generating an evanescent wave that penetrates the film. This evanescent wave excites a surface plasmon. Scattering takes place on the surface of the thin metal film. (b) Heat-flow analysis for a thin film considering a Gaussian heat source.

Fig. 3
Fig. 3

Experimental data for reflection, absorption and scattering on Au films of different thickness: (a) 25.5 ± 1.5 nm , (b) 19.5 ± 1.5 nm , (c) 35.5 ± 1.5 nm . In (a) we can see that the angles of maximum scattering and absorption do not coincide.

Equations (1)

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Q ̇ film Q ̇ glass = κ film d κ glass ρ ,

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