Abstract

We report a miniaturized inline Fabry-Perot interferometer directly fabricated on a single-mode optical fiber with a femtosecond laser. The device had a loss of 16 dB and an interference visibility exceeding 14 dB. The device was tested and survived in high temperatures up to 1100°C. With an accessible cavity and all-glass structure, the new device is attractive for sensing applications in high-temperature harsh environments.

© 2008 Optical Society of America

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  1. C. E. Lee and H. F. Taylor, Electron. Lett. 24, 193 (1988).
  2. R. O. Claus, M. F. Gunther, A. Wang, and K. A. Murphy, J. Smart Mater. Struct. 1, 237 (1992).
  3. A. Wang, H. Xiao, J. Wang, Z. Wang, W. Zhao, and R. G. May, J. Lightwave Technol. 19, 1495 (2001).
    [CrossRef]
  4. H. Xiao, J. Deng, G. Pickrell, R. G. May, and A. Wang, J. Lightwave Technol. 21, 2276 (2003).
    [CrossRef]
  5. V. Bhatia, K. A. Murphy, R. O. Claus, M. E. Jones, J. L. Grace, T. A. Tran, and J. A. Greene, Meas. Sci. Technol. 7, 58 (1996).
    [CrossRef]
  6. Y. Zhang, X. Chen, Y. Wang, K. L. Cooper, and A. Wang, J. Lightwave Technol. 25, 1797 (2007).
    [CrossRef]
  7. M. Li, S. Menon, J. P. Nibarger, and G. N. Gibson, Phys. Rev. Lett. 82, 2394 (1999).
    [CrossRef]
  8. L. Jiang and H. L. Tsai, J. Appl. Phys. 100, 023116 (2005).
    [CrossRef]
  9. K. M. Davis, K. Miura, N. Sugimoto, and K. Hirao, Opt. Lett. 21, 1729 (1996).
  10. A. Szameit, D. Bloemer, J. Burghoff, T. Pertsch, S. Nolte, F. Lederer, and A. Tuennermann, Appl. Phys. B 82, 507 (2006).
    [CrossRef]
  11. H. Sun, F. He, Z. Zhou, Y. Cheng, Z. Xu, K. Sugioka, and K. Midorikawa, Opt. Lett. 32, 1536 (2007).
    [CrossRef]
  12. E. Hecht, Optics, 4th ed. (Addison Wesley, 2002).
  13. B. Qi, G. R. Pickrell, J. Xu, P. Zhang, Y. Duan, W. Peng, Z. Huang, W. Huo, H. Xiao, R. G. May, and A. Wang, Opt. Eng. 42, 3165 (2003).
    [CrossRef]

2007 (2)

2006 (1)

A. Szameit, D. Bloemer, J. Burghoff, T. Pertsch, S. Nolte, F. Lederer, and A. Tuennermann, Appl. Phys. B 82, 507 (2006).
[CrossRef]

2005 (1)

L. Jiang and H. L. Tsai, J. Appl. Phys. 100, 023116 (2005).
[CrossRef]

2003 (2)

B. Qi, G. R. Pickrell, J. Xu, P. Zhang, Y. Duan, W. Peng, Z. Huang, W. Huo, H. Xiao, R. G. May, and A. Wang, Opt. Eng. 42, 3165 (2003).
[CrossRef]

H. Xiao, J. Deng, G. Pickrell, R. G. May, and A. Wang, J. Lightwave Technol. 21, 2276 (2003).
[CrossRef]

2001 (1)

1999 (1)

M. Li, S. Menon, J. P. Nibarger, and G. N. Gibson, Phys. Rev. Lett. 82, 2394 (1999).
[CrossRef]

1996 (2)

V. Bhatia, K. A. Murphy, R. O. Claus, M. E. Jones, J. L. Grace, T. A. Tran, and J. A. Greene, Meas. Sci. Technol. 7, 58 (1996).
[CrossRef]

K. M. Davis, K. Miura, N. Sugimoto, and K. Hirao, Opt. Lett. 21, 1729 (1996).

1992 (1)

R. O. Claus, M. F. Gunther, A. Wang, and K. A. Murphy, J. Smart Mater. Struct. 1, 237 (1992).

1988 (1)

C. E. Lee and H. F. Taylor, Electron. Lett. 24, 193 (1988).

Appl. Phys. B (1)

A. Szameit, D. Bloemer, J. Burghoff, T. Pertsch, S. Nolte, F. Lederer, and A. Tuennermann, Appl. Phys. B 82, 507 (2006).
[CrossRef]

Electron. Lett. (1)

C. E. Lee and H. F. Taylor, Electron. Lett. 24, 193 (1988).

J. Appl. Phys. (1)

L. Jiang and H. L. Tsai, J. Appl. Phys. 100, 023116 (2005).
[CrossRef]

J. Lightwave Technol. (3)

J. Smart Mater. Struct. (1)

R. O. Claus, M. F. Gunther, A. Wang, and K. A. Murphy, J. Smart Mater. Struct. 1, 237 (1992).

Meas. Sci. Technol. (1)

V. Bhatia, K. A. Murphy, R. O. Claus, M. E. Jones, J. L. Grace, T. A. Tran, and J. A. Greene, Meas. Sci. Technol. 7, 58 (1996).
[CrossRef]

Opt. Eng. (1)

B. Qi, G. R. Pickrell, J. Xu, P. Zhang, Y. Duan, W. Peng, Z. Huang, W. Huo, H. Xiao, R. G. May, and A. Wang, Opt. Eng. 42, 3165 (2003).
[CrossRef]

Opt. Lett. (2)

Phys. Rev. Lett. (1)

M. Li, S. Menon, J. P. Nibarger, and G. N. Gibson, Phys. Rev. Lett. 82, 2394 (1999).
[CrossRef]

Other (1)

E. Hecht, Optics, 4th ed. (Addison Wesley, 2002).

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