Abstract

We have experimentally confirmed sensitivity enhancement of a nanowire-based surface plasmon resonance (SPR) sensor structure. Gold nanowires with periods of 200 and 500nm were fabricated, respectively, by electron-beam and interference lithography on a gold/SF10 substrate. Sensitivity enhancement was measured to be 44% compared with a conventional thin-film-based SPR structure for nanowires of 200nm period and 31% for 500nm when evaluated using ethanol at a varied concentration. This result is consistent with numerical data. Surface roughness is responsible for sensitivity reduction by more than 10%. More significant sensitivity improvement can be achieved by inducing strong localized plasmon coupling with finer nanowires.

© 2007 Optical Society of America

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References

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E. Hutter and J. H. Fendler, Adv. Mater. (Weinheim, Ger.) 16, 1685 (2004).
[CrossRef]

2001

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

2000

1996

P. Mulvaney, Langmuir 12, 788 (1996).
[CrossRef]

1995

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters (Springer-Verlag, 1995).

1986

Byun, K. M.

Fendler, J. H.

E. Hutter and J. H. Fendler, Adv. Mater. (Weinheim, Ger.) 16, 1685 (2004).
[CrossRef]

Gaylord, T. K.

Hutter, E.

E. Hutter and J. H. Fendler, Adv. Mater. (Weinheim, Ger.) 16, 1685 (2004).
[CrossRef]

Kalyuzhny, G.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

Kim, D.

Kim, S. J.

Kobayashi, T.

Kreibig, U.

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters (Springer-Verlag, 1995).

Lipson, S. G.

Moharam, M. G.

Mulvaney, P.

P. Mulvaney, Langmuir 12, 788 (1996).
[CrossRef]

Okamoto, T.

Ran, B.

Rubinstein, I.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

Schneeweiss, M. A.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

Shanzer, A.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

Vaskevich, A.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

Vollmer, M.

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters (Springer-Verlag, 1995).

Yamaguchi, I.

Yoon, S. J.

Adv. Mater. (Weinheim, Ger.)

E. Hutter and J. H. Fendler, Adv. Mater. (Weinheim, Ger.) 16, 1685 (2004).
[CrossRef]

J. Am. Chem. Soc.

G. Kalyuzhny, M. A. Schneeweiss, A. Shanzer, A. Vaskevich, and I. Rubinstein, J. Am. Chem. Soc. 123, 3177 (2001).
[CrossRef] [PubMed]

J. Opt. Soc. Am. A

Langmuir

P. Mulvaney, Langmuir 12, 788 (1996).
[CrossRef]

Opt. Express

Opt. Lett.

Other

U. Kreibig and M. Vollmer, Optical Properties of Metal Clusters (Springer-Verlag, 1995).

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Figures (3)

Fig. 1
Fig. 1

(a) Schematic profile of a nanowire-based SPR chip and (b) scanning electron image of the sample with Λ = 500 nm .

Fig. 2
Fig. 2

Δ θ SPR of a nanowire-based SPR chip at (a) Λ = 500 nm and (b) Λ = 200 nm , in comparison with a conventional one without nanowires. The solid and dotted lines represent linear fits of experimental and numerical results, respectively.

Fig. 3
Fig. 3

Calculated SEF as a function of nanowire periods, assuming a rectangular profile with f = 50 % . The squares represent measured data.

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