Abstract

A simple and cost-effective method for real-time imaging in confocal microscopy is proposed. Spectrally encoded slit confocal microscopy (SESCoM) uses a spectral encoding technique together with a confocal slit aperture to achieve two-dimensional images. Simulation and experimental results of the SESCoM’s axial and lateral performances are presented. The measured FWHM of the axial response is 1.15μm when an objective with a NA of 0.95 is used. FWHMs of the lateral line spread functions are measured to be 236 and 244nm along the x and y directions, respectively. Both the axial and the lateral experimental results agree well with the simulation results.

© 2006 Optical Society of America

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References

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2005 (2)

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

2002 (1)

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

1999 (1)

1998 (1)

1996 (1)

R. H. Webb, Rep. Prog. Phys. 59, 427 (1996).
[CrossRef]

Beaudoin, F.

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Bouma, B. E.

Cho, H.

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Desplats, R.

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Donaldson, L.

Gmitro, A. F.

Gweon, D.

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Hopkins, M. F.

Kang, D.

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Kim, J.

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Le Touze, C.

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Lellouchi, D.

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Pawley, J. B.

J. B. Pawley, Handbook of Biological Confocal Microscopy, 2nd ed. (Plenum, 1995).

Perdu, P.

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Rouse, A. R.

Sabharwal, Y. S.

Serup, J.

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

Sheppard, C. J. R.

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (BIOS Scientific, 1997).

Shotton, D. M.

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (BIOS Scientific, 1997).

Sohn, Y.

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Suihko, C.

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

Swindle, L. D.

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

Tearney, G. J.

Thomas, S. G.

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

Webb, R. H.

Appl. Opt. (1)

Microelectron. Reliab. (1)

D. Lellouchi, F. Beaudoin, C. Le Touze, P. Perdu, and R. Desplats, Microelectron. Reliab. 42, 1815 (2002).
[CrossRef]

Opt. Lett. (1)

Proc. SPIE (1)

J. Kim, D. Kang, D. Gweon, Y. Sohn, and H. Cho, in Proc. SPIE 6049, 604906 (2005).
[CrossRef]

Rep. Prog. Phys. (1)

R. H. Webb, Rep. Prog. Phys. 59, 427 (1996).
[CrossRef]

Skin Res. Technol. (1)

C. Suihko, L. D. Swindle, S. G. Thomas, and J. Serup, Skin Res. Technol. 11, 254 (2005).
[CrossRef] [PubMed]

Other (2)

C. J. R. Sheppard and D. M. Shotton, Confocal Laser Scanning Microscopy (BIOS Scientific, 1997).

J. B. Pawley, Handbook of Biological Confocal Microscopy, 2nd ed. (Plenum, 1995).

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Figures (4)

Fig. 1
Fig. 1

Schematic of SESCoM.

Fig. 2
Fig. 2

Experimental and theoretical axial responses.

Fig. 3
Fig. 3

SESCoM image of a 10 μ m pitch standard specimen.

Fig. 4
Fig. 4

Experimental LSFs and theoretical PSFs.

Metrics