Abstract

We present a full-field phase microscopy technique for quantitative nanoscale surface profiling of samples in reflection. This technique utilizes swept-source optical coherence tomography in a full-field common path interferometer for phase-stable cross-sectional acquisition without scanning. Subwavelength variations in surface sample features are measured without interference from spurious reflections by processing the interferometric phase at a selected depth plane, providing a 1.3nm stability for high signal-to-noise ratio surface features. Nanoscale imaging was demonstrated by measuring the location of receptor sites on a DNA assay biochip and the surface topography of erythrocytes in a blood smear.

© 2006 Optical Society of America

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2005

2004

2003

2001

1995

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. Elzaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Akkin, T.

Badizadegan, K.

Bouma, B. E.

Cense, B.

Choma, M. A.

Chu, M. C.

Creazzo, T. L.

Dasari, R. R.

de Boer, J. F.

DeBoer, J. F.

Deflores, L. P.

Drexler, W.

B. Povazay, A. Unterhuber, B. Hermann, R. Leitgeb, and W. Drexler, in Proc. SPIE 5861, 208 (2005).

Ellerbee, A. K.

Elzaiat, S. Y.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. Elzaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Fang-Yen, C.

Feld, M. S.

Fercher, A. F.

Grajciar, B.

Hahn, M. S.

Hermann, B.

B. Povazay, A. Unterhuber, B. Hermann, R. Leitgeb, and W. Drexler, in Proc. SPIE 5861, 208 (2005).

Hitzenberger, C. K.

R. Leitgeb, C. K. Hitzenberger, and A. F. Fercher, Opt. Express 11, 889 (2003).
[CrossRef] [PubMed]

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. Elzaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Ikeda, T.

Iwai, H.

Izatt, J. A.

Joo, C.

Kamp, G.

A. F. Fercher, C. K. Hitzenberger, G. Kamp, and S. Y. Elzaiat, Opt. Commun. 117, 43 (1995).
[CrossRef]

Leitgeb, R.

B. Povazay, A. Unterhuber, B. Hermann, R. Leitgeb, and W. Drexler, in Proc. SPIE 5861, 208 (2005).

R. Leitgeb, C. K. Hitzenberger, and A. F. Fercher, Opt. Express 11, 889 (2003).
[CrossRef] [PubMed]

Leitgeb, R. A.

Park, B. H.

Pierce, M. C.

Pircher, M.

Popescu, G.

Povazay, B.

B. Povazay, A. Unterhuber, B. Hermann, R. Leitgeb, and W. Drexler, in Proc. SPIE 5861, 208 (2005).

Sarunic, M. V.

Seung, H. S.

Tearney, G. J.

Unterhuber, A.

B. Povazay, A. Unterhuber, B. Hermann, R. Leitgeb, and W. Drexler, in Proc. SPIE 5861, 208 (2005).

Vaughan, J.

Wax, A.

Yang, C.

Yun, S. H.

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Figures (4)

Fig. 1
Fig. 1

Full-field swept-source OCT setup with a 4 f common path interferometer. The lenses used had focal lengths f C = 30 mm , f BS = 100 mm , f OBJ = 2.9 mm , f CCD = 75 mm . R denotes the surface for the reference reflection.

Fig. 2
Fig. 2

Processing steps to acquire phase-sensitive data using the full-field swept-source OCT system. Each interferogram is interpolated, windowed, and zero padded prior to performing a fast Fourier transform. Subwavelength variations are observed as variations in the phase at a particular depth slice.

Fig. 3
Fig. 3

A, surface map of a U.S. Air Force resolution target acquired with low-resolution optics showing elements 3–5 from group 4. B, Lateral resolution of the high-resolution optical setup, illustrated in Fig. 1, is demonstrated by imaging elements 5 and 6 of group 7 (203 and 228 cycles mm , respectively).

Fig. 4
Fig. 4

A, FF SS PM image of human red blood cells. B, surface profile of a printed DNA array.

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