S. W. Hell, “Microscopy and its focal switch,” Nat. Methods 6(1), 24–32 (2009).
[Crossref]
[PubMed]
B. R. Boruah and M. A. A. Neil, “Far field computation of an arbitrarily polarized beam using fast Fourier thrnsforms,” Opt. Commun. 282(24), 4660–4667 (2009).
[Crossref]
S. H. Deng, L. Liu, Y. Cheng, R. X. Li, and Z. Z. Xu, “Investigation of the influence of the aberration induced by a plane interface on STED microscopy,” Opt. Express 17(3), 1714–1725 (2009).
[Crossref]
[PubMed]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Effect of primary spherical aberration on high-numericalaperture focusing of a Laguerre-Gaussian beam,” J. Opt. Soc. Am. A 25(6), 1307–1318 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of a vortex carrying beam with Gaussian background by an apertured system in presence of coma,” Opt. Commun. 281(5), 923–934 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of linearly-, and circularly polarized Gaussian background vortex beams by a high numerical aperture system afflicted with third-order astigmatism,” Opt. Commun. 281(24), 5939–5948 (2008).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
S. W. Hell, “Far-Field Optical Nanoscopy,” Science 316(5828), 1153–1158 (2007).
[Crossref]
[PubMed]
J. Keller, A. Schönle, and S. W. Hell, “Efficient fluorescence inhibition patterns for RESOLFT microscopy,” Opt. Express 15(6), 3361–3371 (2007).
[Crossref]
[PubMed]
P. Dedecker, B. Muls, J. Hofkens, J. Enderlein, and J. Hotta, “Orientational effects in the excitation and de-excitation of single molecules interacting with donut-mode laser beams,” Opt. Express 15(6), 3372–3383 (2007).
[Crossref]
[PubMed]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
Y. Roichman, A. Waldron, E. Gardel, and D. G. Grier, “Optical traps with geometric aberrations,” Appl. Opt. 45(15), 3425–3429 (2006).
[Crossref]
[PubMed]
B. R. Boruah and M. A. A. Neil, “Susceptibility to and correction of azimuthal aberrations in singular light beams,” Opt. Express 14(22), 10377–10385 (2006).
[Crossref]
[PubMed]
V. Westphal and S. W. Hell, “Nanoscale resolution in the focal plane of an optical microscope,” Phys. Rev. Lett. 94(14), 143903 (2005).
[Crossref]
[PubMed]
D. P. Biss and T. G. Brown, “Primary aberrations in focused radially polarized vortex beams,” Opt. Express 12(3), 384–393 (2004).
[Crossref]
[PubMed]
P. Török and P. R. T. Munro, “The use of Gauss-Laguerre vector beams in STED microscopy,” Opt. Express 12(15), 3605–3617 (2004).
[Crossref]
[PubMed]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
T. A. Klar, E. Engel, and S. W. Hell, “Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 64(6), 066613 (2001).
[Crossref]
[PubMed]
R. Kant, “An analytical method of vector diffraction for focusing optical systems with Seidel aberrations II: Astigmatism and coma,” J. Mod. Opt. 42(2), 299–320 (1995).
[Crossref]
R. Kant, “An analytical solution of vector diffraction for focusing optical systems with Seidel aberrations I. Spherical aberration, curvature of field, and distortion,” J. Mod. Opt. 40(11), 2293–2310 (1993).
[Crossref]
B. Richards and E. Wolf, “Electromagnetic diffraction in optical systems II: Structure of the image field in an aplanatic system,” Proc. R. Soc. Lond. A Math. Phys. Sci. 253(1274), 358–379 (1959).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
T. A. Klar, E. Engel, and S. W. Hell, “Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 64(6), 066613 (2001).
[Crossref]
[PubMed]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
S. W. Hell, “Microscopy and its focal switch,” Nat. Methods 6(1), 24–32 (2009).
[Crossref]
[PubMed]
J. Keller, A. Schönle, and S. W. Hell, “Efficient fluorescence inhibition patterns for RESOLFT microscopy,” Opt. Express 15(6), 3361–3371 (2007).
[Crossref]
[PubMed]
S. W. Hell, “Far-Field Optical Nanoscopy,” Science 316(5828), 1153–1158 (2007).
[Crossref]
[PubMed]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
V. Westphal and S. W. Hell, “Nanoscale resolution in the focal plane of an optical microscope,” Phys. Rev. Lett. 94(14), 143903 (2005).
[Crossref]
[PubMed]
T. A. Klar, E. Engel, and S. W. Hell, “Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 64(6), 066613 (2001).
[Crossref]
[PubMed]
S. W. Hell and J. Wichmann, “Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy,” Opt. Lett. 19(11), 780–782 (1994).
[Crossref]
[PubMed]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
R. Kant, “An analytical method of vector diffraction for focusing optical systems with Seidel aberrations II: Astigmatism and coma,” J. Mod. Opt. 42(2), 299–320 (1995).
[Crossref]
R. Kant, “An analytical solution of vector diffraction for focusing optical systems with Seidel aberrations I. Spherical aberration, curvature of field, and distortion,” J. Mod. Opt. 40(11), 2293–2310 (1993).
[Crossref]
J. Keller, A. Schönle, and S. W. Hell, “Efficient fluorescence inhibition patterns for RESOLFT microscopy,” Opt. Express 15(6), 3361–3371 (2007).
[Crossref]
[PubMed]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
T. A. Klar, E. Engel, and S. W. Hell, “Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 64(6), 066613 (2001).
[Crossref]
[PubMed]
B. Richards and E. Wolf, “Electromagnetic diffraction in optical systems II: Structure of the image field in an aplanatic system,” Proc. R. Soc. Lond. A Math. Phys. Sci. 253(1274), 358–379 (1959).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of linearly-, and circularly polarized Gaussian background vortex beams by a high numerical aperture system afflicted with third-order astigmatism,” Opt. Commun. 281(24), 5939–5948 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Effect of primary spherical aberration on high-numericalaperture focusing of a Laguerre-Gaussian beam,” J. Opt. Soc. Am. A 25(6), 1307–1318 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of a vortex carrying beam with Gaussian background by an apertured system in presence of coma,” Opt. Commun. 281(5), 923–934 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of a vortex carrying beam with Gaussian background by an apertured system in presence of coma,” Opt. Commun. 281(5), 923–934 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Effect of primary spherical aberration on high-numericalaperture focusing of a Laguerre-Gaussian beam,” J. Opt. Soc. Am. A 25(6), 1307–1318 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of linearly-, and circularly polarized Gaussian background vortex beams by a high numerical aperture system afflicted with third-order astigmatism,” Opt. Commun. 281(24), 5939–5948 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of linearly-, and circularly polarized Gaussian background vortex beams by a high numerical aperture system afflicted with third-order astigmatism,” Opt. Commun. 281(24), 5939–5948 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Effect of primary spherical aberration on high-numericalaperture focusing of a Laguerre-Gaussian beam,” J. Opt. Soc. Am. A 25(6), 1307–1318 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of a vortex carrying beam with Gaussian background by an apertured system in presence of coma,” Opt. Commun. 281(5), 923–934 (2008).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
V. Westphal and S. W. Hell, “Nanoscale resolution in the focal plane of an optical microscope,” Phys. Rev. Lett. 94(14), 143903 (2005).
[Crossref]
[PubMed]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
B. Richards and E. Wolf, “Electromagnetic diffraction in optical systems II: Structure of the image field in an aplanatic system,” Proc. R. Soc. Lond. A Math. Phys. Sci. 253(1274), 358–379 (1959).
[Crossref]
R. Kant, “An analytical solution of vector diffraction for focusing optical systems with Seidel aberrations I. Spherical aberration, curvature of field, and distortion,” J. Mod. Opt. 40(11), 2293–2310 (1993).
[Crossref]
R. Kant, “An analytical method of vector diffraction for focusing optical systems with Seidel aberrations II: Astigmatism and coma,” J. Mod. Opt. 42(2), 299–320 (1995).
[Crossref]
K. I. Willig, J. Keller, M. Bossi, and S. W. Hell, “STED microscopy resolves nanoparticle assemblies,” N. J. Phys. 8(6), 106 (2006).
[Crossref]
S. W. Hell, “Microscopy and its focal switch,” Nat. Methods 6(1), 24–32 (2009).
[Crossref]
[PubMed]
B. R. Boruah and M. A. A. Neil, “Far field computation of an arbitrarily polarized beam using fast Fourier thrnsforms,” Opt. Commun. 282(24), 4660–4667 (2009).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of a vortex carrying beam with Gaussian background by an apertured system in presence of coma,” Opt. Commun. 281(5), 923–934 (2008).
[Crossref]
R. K. Singh, P. Senthilkumaran, and K. Singh, “Focusing of linearly-, and circularly polarized Gaussian background vortex beams by a high numerical aperture system afflicted with third-order astigmatism,” Opt. Commun. 281(24), 5939–5948 (2008).
[Crossref]
N. Bokor, Y. Iketaki, T. Watanabe, K. Daigoku, N. Davidson, and M. Fujii, “On polarization effects in fluorescence depletion microscopy,” Opt. Commun. 272(1), 263–268 (2007).
[Crossref]
B. R. Boruah and M. A. A. Neil, “Susceptibility to and correction of azimuthal aberrations in singular light beams,” Opt. Express 14(22), 10377–10385 (2006).
[Crossref]
[PubMed]
J. Keller, A. Schönle, and S. W. Hell, “Efficient fluorescence inhibition patterns for RESOLFT microscopy,” Opt. Express 15(6), 3361–3371 (2007).
[Crossref]
[PubMed]
P. Dedecker, B. Muls, J. Hofkens, J. Enderlein, and J. Hotta, “Orientational effects in the excitation and de-excitation of single molecules interacting with donut-mode laser beams,” Opt. Express 15(6), 3372–3383 (2007).
[Crossref]
[PubMed]
S. H. Deng, L. Liu, Y. Cheng, R. X. Li, and Z. Z. Xu, “Investigation of the influence of the aberration induced by a plane interface on STED microscopy,” Opt. Express 17(3), 1714–1725 (2009).
[Crossref]
[PubMed]
D. P. Biss and T. G. Brown, “Primary aberrations in focused radially polarized vortex beams,” Opt. Express 12(3), 384–393 (2004).
[Crossref]
[PubMed]
P. Török and P. R. T. Munro, “The use of Gauss-Laguerre vector beams in STED microscopy,” Opt. Express 12(15), 3605–3617 (2004).
[Crossref]
[PubMed]
T. A. Klar, E. Engel, and S. W. Hell, “Breaking Abbe’s diffraction resolution limit in fluorescence microscopy with stimulated emission depletion beams of various shapes,” Phys. Rev. E Stat. Nonlin. Soft Matter Phys. 64(6), 066613 (2001).
[Crossref]
[PubMed]
V. Westphal and S. W. Hell, “Nanoscale resolution in the focal plane of an optical microscope,” Phys. Rev. Lett. 94(14), 143903 (2005).
[Crossref]
[PubMed]
B. Richards and E. Wolf, “Electromagnetic diffraction in optical systems II: Structure of the image field in an aplanatic system,” Proc. R. Soc. Lond. A Math. Phys. Sci. 253(1274), 358–379 (1959).
[Crossref]
T. Watanabe, M. Fujii, Y. Watanabe, N. Toyama, and Y. Iketaki, “Generation of a doughnut-shaped beam using a spiral phase plate,” Rev. Sci. Instrum. 75(12), 5131–5135 (2004).
[Crossref]
S. W. Hell, “Far-Field Optical Nanoscopy,” Science 316(5828), 1153–1158 (2007).
[Crossref]
[PubMed]
M. Born, and E. Wolf, Principles of Optics, (Cambridge University Press, Cambridge, UK, 1999).