J. Henry, “Accuracy issues in chemical and dimensional metrology in the SEM and TEM,” Meas. Sci. Technol. 18, 2755–2761 (2007).

[Crossref]

P. Kotowski, “Fractal dimension of metallic fracture surface,” Int. J. Fract. 141, 269–286 (2006).

[Crossref]

A. Helalizadeh, H. Muller-Steinhagen, and M. Jamialahmadi, “Application of fractal theory for characterisation of crystalline deposits,” Chem. Eng. Sci. 61, 2069–2078 (2006).

[Crossref]

D. K. Goswami and B. N. Dev, “Nanoscale self-affine surface smoothing by ion bombardment,” Phys. Rev. B 68, 033401 (2003).

[Crossref]

V. Krishnakumar and A. K. Asundi, “Defocus measurement using spackle correlation,” J. Mod. Opt. 48, 935–940 (2001).

S. S. Chen, J. M. Keller, and R. M. Crownover, “On the calculation of fractal features from images,” IEEE T. Pattern Anal. 15, 1087–1090 (1993).

[Crossref]

N. Sarkar and B. B. Chaudhuri, “An efficient approach to estimate fractal dimension of textural images,” Pattern Recogn. 25, 1035–1044 (1992).

[Crossref]

V. Krishnakumar and A. K. Asundi, “Defocus measurement using spackle correlation,” J. Mod. Opt. 48, 935–940 (2001).

R. N. Bracewell, Fourier Analysis and Imaging, (Kluwer, New York, 2003).

N. Sarkar and B. B. Chaudhuri, “An efficient approach to estimate fractal dimension of textural images,” Pattern Recogn. 25, 1035–1044 (1992).

[Crossref]

S. S. Chen, J. M. Keller, and R. M. Crownover, “On the calculation of fractal features from images,” IEEE T. Pattern Anal. 15, 1087–1090 (1993).

[Crossref]

S. S. Chen, J. M. Keller, and R. M. Crownover, “On the calculation of fractal features from images,” IEEE T. Pattern Anal. 15, 1087–1090 (1993).

[Crossref]

D. K. Goswami and B. N. Dev, “Nanoscale self-affine surface smoothing by ion bombardment,” Phys. Rev. B 68, 033401 (2003).

[Crossref]

G. Franceschetti and D. Riccio, Scattering, Natural Surfaces and Fractals, (Elsevier, 2007).

J. W. Goodman, Introduction to Fourier Optics, (McGraw-Hill, New York, 1996).

D. K. Goswami and B. N. Dev, “Nanoscale self-affine surface smoothing by ion bombardment,” Phys. Rev. B 68, 033401 (2003).

[Crossref]

A. Helalizadeh, H. Muller-Steinhagen, and M. Jamialahmadi, “Application of fractal theory for characterisation of crystalline deposits,” Chem. Eng. Sci. 61, 2069–2078 (2006).

[Crossref]

J. Henry, “Accuracy issues in chemical and dimensional metrology in the SEM and TEM,” Meas. Sci. Technol. 18, 2755–2761 (2007).

[Crossref]

A. Helalizadeh, H. Muller-Steinhagen, and M. Jamialahmadi, “Application of fractal theory for characterisation of crystalline deposits,” Chem. Eng. Sci. 61, 2069–2078 (2006).

[Crossref]

S. S. Chen, J. M. Keller, and R. M. Crownover, “On the calculation of fractal features from images,” IEEE T. Pattern Anal. 15, 1087–1090 (1993).

[Crossref]

P. Kotowski, “Fractal dimension of metallic fracture surface,” Int. J. Fract. 141, 269–286 (2006).

[Crossref]

V. Krishnakumar and A. K. Asundi, “Defocus measurement using spackle correlation,” J. Mod. Opt. 48, 935–940 (2001).

B. B. Mandelbrot, The Fractal Geometry of Nature, (W. H. Freeman, San Francisco, New York, 1982).

A. Helalizadeh, H. Muller-Steinhagen, and M. Jamialahmadi, “Application of fractal theory for characterisation of crystalline deposits,” Chem. Eng. Sci. 61, 2069–2078 (2006).

[Crossref]

G. Franceschetti and D. Riccio, Scattering, Natural Surfaces and Fractals, (Elsevier, 2007).

N. Sarkar and B. B. Chaudhuri, “An efficient approach to estimate fractal dimension of textural images,” Pattern Recogn. 25, 1035–1044 (1992).

[Crossref]

A. Helalizadeh, H. Muller-Steinhagen, and M. Jamialahmadi, “Application of fractal theory for characterisation of crystalline deposits,” Chem. Eng. Sci. 61, 2069–2078 (2006).

[Crossref]

S. S. Chen, J. M. Keller, and R. M. Crownover, “On the calculation of fractal features from images,” IEEE T. Pattern Anal. 15, 1087–1090 (1993).

[Crossref]

P. Kotowski, “Fractal dimension of metallic fracture surface,” Int. J. Fract. 141, 269–286 (2006).

[Crossref]

V. Krishnakumar and A. K. Asundi, “Defocus measurement using spackle correlation,” J. Mod. Opt. 48, 935–940 (2001).

J. Henry, “Accuracy issues in chemical and dimensional metrology in the SEM and TEM,” Meas. Sci. Technol. 18, 2755–2761 (2007).

[Crossref]

N. Sarkar and B. B. Chaudhuri, “An efficient approach to estimate fractal dimension of textural images,” Pattern Recogn. 25, 1035–1044 (1992).

[Crossref]

D. K. Goswami and B. N. Dev, “Nanoscale self-affine surface smoothing by ion bombardment,” Phys. Rev. B 68, 033401 (2003).

[Crossref]

B. B. Mandelbrot, The Fractal Geometry of Nature, (W. H. Freeman, San Francisco, New York, 1982).

R. N. Bracewell, Fourier Analysis and Imaging, (Kluwer, New York, 2003).

J. W. Goodman, Introduction to Fourier Optics, (McGraw-Hill, New York, 1996).

G. Franceschetti and D. Riccio, Scattering, Natural Surfaces and Fractals, (Elsevier, 2007).

http://cse.naro.affrc.go.jp/sasaki/fractal/fractal-e.html.