R. Esteban, R. Vogelgesang, and K. Kern, “Simulation of optical near and far
fields of dielectric apertureless scanning
probes,” Nanotechnology 17, 475–482 (2006).
[Crossref]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
Z. H. Kim and S. R. Leone, “High-resolution apertureless
near-field optical imaging using gold nanosphere
probes,” J. Phys. Chem. B 110, 19,804–19,809 (2006).
N. Ocelic, A. Huber, and R. Hillenbrand, “Pseudoheterodyne detection for
background-free near-field spec-troscopy,” Appl. Phys. Lett. 89, (2006).
[Crossref]
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
S. C. Schneider, S. Grafstrom, and L. M. Eng, “Scattering near-field optical
microscopy of optically anisotropicsystems,” Phys. Rev. B 71, (2005).
[Crossref]
Z. H. Kim, B. Liu, and S. R. Leone, “Nanometer-scale optical imaging of
epitaxially grown GaN and InN islands using apertureless near-field
microscopy,” J. Phys. Chem. B 109, 8503–8508 (2005).
[Crossref]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by
spectral signature in scattering infrared near-field
microscopy,” Appl. Phys. Lett. 85, 5064–5066 (2004).
[Crossref]
F. Keilmann and R. Hillenbrand, “Near-field microscopy by elastic
light scattering from a tip,” Philos.
Trans. R. Soc. Lond. Ser. A-Math. Phys. Eng. Sci. 362, 787–805 (2004).
[Crossref]
N. Ocelic and R. Hillenbrand, “Subwavelength-scale tailoring of
surface phonon polaritons by focused ion-beam
implantation,” Nat. Mater. 3, 606–609 (2004).
[Crossref]
[PubMed]
S. V. Sukhov, “Role of multipole moment of the
probe in apertureless near-field optical
microscopy,” Ultrami-croscopy 101, 111–122 (2004).
[Crossref]
T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanomechanical resonance tuning and
phase effects in optical near-field interaction,” Nano Lett. 4, 1669–1672 (2004).
[Crossref]
L. Stebounova, B. B. Akhremitchev, and G. C. Walker, “Enhancement of the weak scattered
signal in apertureless near-field scanning infrared
microscopy,” Rev. Sci. Instrum. 74, 3670–3674 (2003).
[Crossref]
M. B. Raschke and C. Lienau, “Apertureless near-field optical
microscopy: Tip-sample coupling in elastic light
scattering,” Appl. Phys. Lett. 83, 5089–5091 (2003).
[Crossref]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Performance of visible and
mid-infrared scattering-type near-field optical
microscopes,” J. Microsc.-Oxf. 210, 311–314 (2003).
[Crossref]
R. Hillenbrand and F. Keilmann, “Material-specific mapping of
metal/semiconductor/dielectric nanosystems at 10 nm resolution by
backscattering near-field optical microscopy,” Appl. Phys. Lett. 80, 25–27 (2002).
[Crossref]
R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light-matter
interaction at the nanometre scale,” Nature 418, 159–162 (2002).
[Crossref]
[PubMed]
N. Calander and M. Willander, “Theory of surface-plasmon resonance
optical-field enhancement at prolate spheroids,” J. Appl. Phys. 92, 4878–4884 (2002).
[Crossref]
Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, “Strength of the electric field in
apertureless near-field optical microscopy,” J. Appl. Phys. 89, 5774–5778 (2001).
[Crossref]
I. V. Lindell, G. Dassios, and K. I. Nikoskinen, “Electrostatic image theory for the
conducting prolate spheroid,” J. Phys.
D-Appl. Phys. 34, 2302–2307 (2001).
[Crossref]
J. L. Bohn, D. J. Nesbitt, and A. Gallagher, “Field enhancement in apertureless
near-field scanning optical microscopy,” J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 18, 2998–3006 (2001).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
M. Labardi, S. Patane, and M. Allegrini, “Artifact-free near-field optical
imaging by apertureless microscopy,” Appl. Phys. Lett. 77, 621–623 (2000).
[Crossref]
R. Hillenbrand and F. Keilmann, “Complex optical constants on a
subwavelength scale,” Phys. Rev. Lett. 85, 3029–3032 (2000).
[Crossref]
[PubMed]
B. Knoll and F. Keilmann, “Enhanced dielectric contrast in
scattering-type scanning near-field optical
microscopy,” Opt. Commun. 182, 321–328 (2000).
[Crossref]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
B. Knoll and F. Keilmann, “Infrared conductivity mapping for
nanoelectronics,” Appl. Phys. Lett. 77, 3980–3982 (2000).
[Crossref]
B. Knoll and F. Keilmann, “Near-field probing of vibrational
absorption for chemical microscopy,” Nature 399, 134–137 (1999).
[Crossref]
H. Hatano and S. Kawata, “Applicability of deconvolution and
nonlinear optimization for reconstructing optical images from near-field
optical microscope images,” J.
Microsc.-Oxf. 194, 230 – 234 (1999).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
B. Knoll and F. Keilmann, “Electromagnetic fields in the cutoff
regime of tapered metallic waveguides,” Opt. Commun. 162, 177–181 (1999).
[Crossref]
R. Bachelot, G. Wurtz, and P. Royer, “An application of the apertureless
scanning near-field optical microscopy: imaging a GaAlAs laser diode in
operation,” Appl. Phys. Lett. 73, 3333–3335 (1998).
[Crossref]
L. Novotny, E. J. Sanchez, and X. S. Xie, “Near-field optical imaging using
metal tips illuminated by higher-order Hermite-Gaussian
beams,” Ultramicroscopy 71, 21–29 (1998).
[Crossref]
O. J. F. Martin and C. Girard, “Controlling and tuning strong
optical field gradients at a local probe microscope tip
apex,” Appl. Phys. Lett. 70, 705–707 (1997).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and A. Viljanen, “Electrostatic image method for the
anisotropic half space,” IEE Proc.-Sci.
Meas. Technol. 144, 156 – 162 (1997).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and M. J. Flykt, “Electrostatic image theory for an
anisotropic half-space slightly deviating from transverse
isotropy,” Radio Sci. 31, 1361 – 1368 (1996).
[Crossref]
A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara, “Infrared-reflection-mode near-field
microscopy using an apertureless probe with a resolution of
lambda/600,” Opt. Lett. 21, 1315–1317 (1996).
[Crossref]
[PubMed]
H. Harima, S. Nakashima, and T. Uemura, “Raman-scattering from anisotropic
LO-phonon-plasmon-coupled mode in n-type 4H-SiC and
6H-SiC,” J. Appl. Phys. 78, 1996–2005 (1995).
[Crossref]
J. C. E. Sten and I. V. Lindell, “An electrostatic image solution for
the conducting prolate spheroid,” J.
Electro-magn. Waves Appl. 9, 599 – 609 (1995).
F. Zenhausern, Y. Martin, and H. Wickramasinghe, “Scanning interferometric
apertureless microscopy - optical imaging at 10 angstrom
resolution,” Science 269, 1083–1085 (1995).
[Crossref]
[PubMed]
D. V. Redzic, “An electrostatic problem - a
point-charge outside a prolate dielectric
spheroid,” Am. J. Phys. 62, 1118 – 1121 (1994).
[Crossref]
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
F. Zenhausern, M. Oboyle, and H. Wickramasinghe, “Apertureless near-field optical
microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
[Crossref]
Y. Inouye and S. Kawata, “Near-field scanning optical
microscope with a metallic probe tip,” Opt. Lett. 19, 159–161 (1994).
[Crossref]
[PubMed]
F. Engelbrecht and R. Helbig, “Effect of crystal anisotropy on the
infrared reflectivity of 6H-SiC,” Phys.
Rev. B 48, 15,698 – 15,707 (1993).
[Crossref]
D. V. Redzic, “Image of a moving spheroidal
conductor,” Am. J. Phys. 60, 506–508 (1992).
[Crossref]
W. Denk and D. Pohl, “Near-field optics - microscopy with
nanometer-size fields,” J. Vac. Sci.
Technol. B 9, 510–513 (1991).
[Crossref]
A. Wokaun, “Surface enhancement of
optical-fields - mechanism and applications,” Mol. Phys. 56, 1 – 33 (1985).
[Crossref]
P. Aravind and H. Metiu, “The effects of the interaction
between resonances in the electromagnetic response of a sphere-plane
structure - applications to surface enhanced
spectroscopy,” Surf. Sci. 124, 506–528 (1983).
[Crossref]
M. A. Ordal et al., “Optical properties of the
metals Al, Co,Cu,Au,Fe,Pb,Ni,Pd,Pt,Ag,Ti and W in the infrared and far
infrared,” Appl. Opt. 22, (1983).
[Crossref]
[PubMed]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation damping in
surface-enhanced Raman-scattering,” Phys.
Rev. Lett. 48, 957 – 960 (1982).
[Crossref]
J. Gersten and A. Nitzan, “Electromagnetic theory of enhanced
Raman-scattering by molecules adsorbed on rough
surfaces,” J. Chem. Phys. 73, 3023–3037 (1980).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
J. Aizpurua, personal communication (2005).
L. Stebounova, B. B. Akhremitchev, and G. C. Walker, “Enhancement of the weak scattered
signal in apertureless near-field scanning infrared
microscopy,” Rev. Sci. Instrum. 74, 3670–3674 (2003).
[Crossref]
M. Labardi, S. Patane, and M. Allegrini, “Artifact-free near-field optical
imaging by apertureless microscopy,” Appl. Phys. Lett. 77, 621–623 (2000).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
P. Aravind and H. Metiu, “The effects of the interaction
between resonances in the electromagnetic response of a sphere-plane
structure - applications to surface enhanced
spectroscopy,” Surf. Sci. 124, 506–528 (1983).
[Crossref]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
R. Bachelot, G. Wurtz, and P. Royer, “An application of the apertureless
scanning near-field optical microscopy: imaging a GaAlAs laser diode in
operation,” Appl. Phys. Lett. 73, 3333–3335 (1998).
[Crossref]
A. Lahrech, R. Bachelot, P. Gleyzes, and A. C. Boccara, “Infrared-reflection-mode near-field
microscopy using an apertureless probe with a resolution of
lambda/600,” Opt. Lett. 21, 1315–1317 (1996).
[Crossref]
[PubMed]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
J. L. Bohn, D. J. Nesbitt, and A. Gallagher, “Field enhancement in apertureless
near-field scanning optical microscopy,” J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 18, 2998–3006 (2001).
[Crossref]
C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small
Particles (John Wiley & Sons Inc, 1998).
[Crossref]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
N. Calander and M. Willander, “Theory of surface-plasmon resonance
optical-field enhancement at prolate spheroids,” J. Appl. Phys. 92, 4878–4884 (2002).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
I. V. Lindell, G. Dassios, and K. I. Nikoskinen, “Electrostatic image theory for the
conducting prolate spheroid,” J. Phys.
D-Appl. Phys. 34, 2302–2307 (2001).
[Crossref]
W. Denk and D. Pohl, “Near-field optics - microscopy with
nanometer-size fields,” J. Vac. Sci.
Technol. B 9, 510–513 (1991).
[Crossref]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
S. C. Schneider, S. Grafstrom, and L. M. Eng, “Scattering near-field optical
microscopy of optically anisotropicsystems,” Phys. Rev. B 71, (2005).
[Crossref]
F. Engelbrecht and R. Helbig, “Effect of crystal anisotropy on the
infrared reflectivity of 6H-SiC,” Phys.
Rev. B 48, 15,698 – 15,707 (1993).
[Crossref]
R. Esteban, R. Vogelgesang, and K. Kern, “Simulation of optical near and far
fields of dielectric apertureless scanning
probes,” Nanotechnology 17, 475–482 (2006).
[Crossref]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and M. J. Flykt, “Electrostatic image theory for an
anisotropic half-space slightly deviating from transverse
isotropy,” Radio Sci. 31, 1361 – 1368 (1996).
[Crossref]
J. L. Bohn, D. J. Nesbitt, and A. Gallagher, “Field enhancement in apertureless
near-field scanning optical microscopy,” J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 18, 2998–3006 (2001).
[Crossref]
J. Gersten and A. Nitzan, “Electromagnetic theory of enhanced
Raman-scattering by molecules adsorbed on rough
surfaces,” J. Chem. Phys. 73, 3023–3037 (1980).
[Crossref]
O. J. F. Martin and C. Girard, “Controlling and tuning strong
optical field gradients at a local probe microscope tip
apex,” Appl. Phys. Lett. 70, 705–707 (1997).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation damping in
surface-enhanced Raman-scattering,” Phys.
Rev. Lett. 48, 957 – 960 (1982).
[Crossref]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
S. C. Schneider, S. Grafstrom, and L. M. Eng, “Scattering near-field optical
microscopy of optically anisotropicsystems,” Phys. Rev. B 71, (2005).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, “Strength of the electric field in
apertureless near-field optical microscopy,” J. Appl. Phys. 89, 5774–5778 (2001).
[Crossref]
H. Harima, S. Nakashima, and T. Uemura, “Raman-scattering from anisotropic
LO-phonon-plasmon-coupled mode in n-type 4H-SiC and
6H-SiC,” J. Appl. Phys. 78, 1996–2005 (1995).
[Crossref]
H. Hatano and S. Kawata, “Applicability of deconvolution and
nonlinear optimization for reconstructing optical images from near-field
optical microscope images,” J.
Microsc.-Oxf. 194, 230 – 234 (1999).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
F. Engelbrecht and R. Helbig, “Effect of crystal anisotropy on the
infrared reflectivity of 6H-SiC,” Phys.
Rev. B 48, 15,698 – 15,707 (1993).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
N. Ocelic, A. Huber, and R. Hillenbrand, “Pseudoheterodyne detection for
background-free near-field spec-troscopy,” Appl. Phys. Lett. 89, (2006).
[Crossref]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
F. Keilmann and R. Hillenbrand, “Near-field microscopy by elastic
light scattering from a tip,” Philos.
Trans. R. Soc. Lond. Ser. A-Math. Phys. Eng. Sci. 362, 787–805 (2004).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by
spectral signature in scattering infrared near-field
microscopy,” Appl. Phys. Lett. 85, 5064–5066 (2004).
[Crossref]
N. Ocelic and R. Hillenbrand, “Subwavelength-scale tailoring of
surface phonon polaritons by focused ion-beam
implantation,” Nat. Mater. 3, 606–609 (2004).
[Crossref]
[PubMed]
T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanomechanical resonance tuning and
phase effects in optical near-field interaction,” Nano Lett. 4, 1669–1672 (2004).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Performance of visible and
mid-infrared scattering-type near-field optical
microscopes,” J. Microsc.-Oxf. 210, 311–314 (2003).
[Crossref]
R. Hillenbrand and F. Keilmann, “Material-specific mapping of
metal/semiconductor/dielectric nanosystems at 10 nm resolution by
backscattering near-field optical microscopy,” Appl. Phys. Lett. 80, 25–27 (2002).
[Crossref]
R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light-matter
interaction at the nanometre scale,” Nature 418, 159–162 (2002).
[Crossref]
[PubMed]
R. Hillenbrand and F. Keilmann, “Complex optical constants on a
subwavelength scale,” Phys. Rev. Lett. 85, 3029–3032 (2000).
[Crossref]
[PubMed]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
N. Ocelic, A. Huber, and R. Hillenbrand, “Pseudoheterodyne detection for
background-free near-field spec-troscopy,” Appl. Phys. Lett. 89, (2006).
[Crossref]
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
A. Huber et al., “Simultaneous infrared
material recognition and conductivity mapping by nanoscale near-field
microscopy,” Adv. Mater. (in press).
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small
Particles (John Wiley & Sons Inc, 1998).
[Crossref]
J. D. Jackson, Classical Electrodynamics (Wiley & Sons, 1998).
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by
spectral signature in scattering infrared near-field
microscopy,” Appl. Phys. Lett. 85, 5064–5066 (2004).
[Crossref]
F. Keilmann and R. Hillenbrand, “Near-field microscopy by elastic
light scattering from a tip,” Philos.
Trans. R. Soc. Lond. Ser. A-Math. Phys. Eng. Sci. 362, 787–805 (2004).
[Crossref]
T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanomechanical resonance tuning and
phase effects in optical near-field interaction,” Nano Lett. 4, 1669–1672 (2004).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Performance of visible and
mid-infrared scattering-type near-field optical
microscopes,” J. Microsc.-Oxf. 210, 311–314 (2003).
[Crossref]
R. Hillenbrand and F. Keilmann, “Material-specific mapping of
metal/semiconductor/dielectric nanosystems at 10 nm resolution by
backscattering near-field optical microscopy,” Appl. Phys. Lett. 80, 25–27 (2002).
[Crossref]
R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light-matter
interaction at the nanometre scale,” Nature 418, 159–162 (2002).
[Crossref]
[PubMed]
B. Knoll and F. Keilmann, “Enhanced dielectric contrast in
scattering-type scanning near-field optical
microscopy,” Opt. Commun. 182, 321–328 (2000).
[Crossref]
R. Hillenbrand and F. Keilmann, “Complex optical constants on a
subwavelength scale,” Phys. Rev. Lett. 85, 3029–3032 (2000).
[Crossref]
[PubMed]
B. Knoll and F. Keilmann, “Infrared conductivity mapping for
nanoelectronics,” Appl. Phys. Lett. 77, 3980–3982 (2000).
[Crossref]
B. Knoll and F. Keilmann, “Electromagnetic fields in the cutoff
regime of tapered metallic waveguides,” Opt. Commun. 162, 177–181 (1999).
[Crossref]
B. Knoll and F. Keilmann, “Near-field probing of vibrational
absorption for chemical microscopy,” Nature 399, 134–137 (1999).
[Crossref]
R. Esteban, R. Vogelgesang, and K. Kern, “Simulation of optical near and far
fields of dielectric apertureless scanning
probes,” Nanotechnology 17, 475–482 (2006).
[Crossref]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
Z. H. Kim and S. R. Leone, “High-resolution apertureless
near-field optical imaging using gold nanosphere
probes,” J. Phys. Chem. B 110, 19,804–19,809 (2006).
Z. H. Kim, B. Liu, and S. R. Leone, “Nanometer-scale optical imaging of
epitaxially grown GaN and InN islands using apertureless near-field
microscopy,” J. Phys. Chem. B 109, 8503–8508 (2005).
[Crossref]
B. Knoll and F. Keilmann, “Enhanced dielectric contrast in
scattering-type scanning near-field optical
microscopy,” Opt. Commun. 182, 321–328 (2000).
[Crossref]
B. Knoll and F. Keilmann, “Infrared conductivity mapping for
nanoelectronics,” Appl. Phys. Lett. 77, 3980–3982 (2000).
[Crossref]
B. Knoll and F. Keilmann, “Electromagnetic fields in the cutoff
regime of tapered metallic waveguides,” Opt. Commun. 162, 177–181 (1999).
[Crossref]
B. Knoll and F. Keilmann, “Near-field probing of vibrational
absorption for chemical microscopy,” Nature 399, 134–137 (1999).
[Crossref]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
M. Labardi, S. Patane, and M. Allegrini, “Artifact-free near-field optical
imaging by apertureless microscopy,” Appl. Phys. Lett. 77, 621–623 (2000).
[Crossref]
Z. H. Kim and S. R. Leone, “High-resolution apertureless
near-field optical imaging using gold nanosphere
probes,” J. Phys. Chem. B 110, 19,804–19,809 (2006).
Z. H. Kim, B. Liu, and S. R. Leone, “Nanometer-scale optical imaging of
epitaxially grown GaN and InN islands using apertureless near-field
microscopy,” J. Phys. Chem. B 109, 8503–8508 (2005).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation damping in
surface-enhanced Raman-scattering,” Phys.
Rev. Lett. 48, 957 – 960 (1982).
[Crossref]
M. B. Raschke and C. Lienau, “Apertureless near-field optical
microscopy: Tip-sample coupling in elastic light
scattering,” Appl. Phys. Lett. 83, 5089–5091 (2003).
[Crossref]
I. V. Lindell, G. Dassios, and K. I. Nikoskinen, “Electrostatic image theory for the
conducting prolate spheroid,” J. Phys.
D-Appl. Phys. 34, 2302–2307 (2001).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and A. Viljanen, “Electrostatic image method for the
anisotropic half space,” IEE Proc.-Sci.
Meas. Technol. 144, 156 – 162 (1997).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and M. J. Flykt, “Electrostatic image theory for an
anisotropic half-space slightly deviating from transverse
isotropy,” Radio Sci. 31, 1361 – 1368 (1996).
[Crossref]
J. C. E. Sten and I. V. Lindell, “An electrostatic image solution for
the conducting prolate spheroid,” J.
Electro-magn. Waves Appl. 9, 599 – 609 (1995).
Z. H. Kim, B. Liu, and S. R. Leone, “Nanometer-scale optical imaging of
epitaxially grown GaN and InN islands using apertureless near-field
microscopy,” J. Phys. Chem. B 109, 8503–8508 (2005).
[Crossref]
O. J. F. Martin and C. Girard, “Controlling and tuning strong
optical field gradients at a local probe microscope tip
apex,” Appl. Phys. Lett. 70, 705–707 (1997).
[Crossref]
F. Zenhausern, Y. Martin, and H. Wickramasinghe, “Scanning interferometric
apertureless microscopy - optical imaging at 10 angstrom
resolution,” Science 269, 1083–1085 (1995).
[Crossref]
[PubMed]
Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, “Strength of the electric field in
apertureless near-field optical microscopy,” J. Appl. Phys. 89, 5774–5778 (2001).
[Crossref]
P. Aravind and H. Metiu, “The effects of the interaction
between resonances in the electromagnetic response of a sphere-plane
structure - applications to surface enhanced
spectroscopy,” Surf. Sci. 124, 506–528 (1983).
[Crossref]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
H. Harima, S. Nakashima, and T. Uemura, “Raman-scattering from anisotropic
LO-phonon-plasmon-coupled mode in n-type 4H-SiC and
6H-SiC,” J. Appl. Phys. 78, 1996–2005 (1995).
[Crossref]
J. L. Bohn, D. J. Nesbitt, and A. Gallagher, “Field enhancement in apertureless
near-field scanning optical microscopy,” J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 18, 2998–3006 (2001).
[Crossref]
I. V. Lindell, G. Dassios, and K. I. Nikoskinen, “Electrostatic image theory for the
conducting prolate spheroid,” J. Phys.
D-Appl. Phys. 34, 2302–2307 (2001).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and A. Viljanen, “Electrostatic image method for the
anisotropic half space,” IEE Proc.-Sci.
Meas. Technol. 144, 156 – 162 (1997).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and M. J. Flykt, “Electrostatic image theory for an
anisotropic half-space slightly deviating from transverse
isotropy,” Radio Sci. 31, 1361 – 1368 (1996).
[Crossref]
J. Gersten and A. Nitzan, “Electromagnetic theory of enhanced
Raman-scattering by molecules adsorbed on rough
surfaces,” J. Chem. Phys. 73, 3023–3037 (1980).
[Crossref]
L. Novotny, E. J. Sanchez, and X. S. Xie, “Near-field optical imaging using
metal tips illuminated by higher-order Hermite-Gaussian
beams,” Ultramicroscopy 71, 21–29 (1998).
[Crossref]
F. Zenhausern, M. Oboyle, and H. Wickramasinghe, “Apertureless near-field optical
microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
[Crossref]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
N. Ocelic, A. Huber, and R. Hillenbrand, “Pseudoheterodyne detection for
background-free near-field spec-troscopy,” Appl. Phys. Lett. 89, (2006).
[Crossref]
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
N. Ocelic and R. Hillenbrand, “Subwavelength-scale tailoring of
surface phonon polaritons by focused ion-beam
implantation,” Nat. Mater. 3, 606–609 (2004).
[Crossref]
[PubMed]
N. Ocelic, “Quantitative near-field
phonon-polariton spectroscopy,” Ph.D.
thesis, Technical University Munich (2007).
M. A. Ordal et al., “Optical properties of the
metals Al, Co,Cu,Au,Fe,Pb,Ni,Pd,Pt,Ag,Ti and W in the infrared and far
infrared,” Appl. Opt. 22, (1983).
[Crossref]
[PubMed]
M. Labardi, S. Patane, and M. Allegrini, “Artifact-free near-field optical
imaging by apertureless microscopy,” Appl. Phys. Lett. 77, 621–623 (2000).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
W. Denk and D. Pohl, “Near-field optics - microscopy with
nanometer-size fields,” J. Vac. Sci.
Technol. B 9, 510–513 (1991).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
M. B. Raschke and C. Lienau, “Apertureless near-field optical
microscopy: Tip-sample coupling in elastic light
scattering,” Appl. Phys. Lett. 83, 5089–5091 (2003).
[Crossref]
D. V. Redzic, “An electrostatic problem - a
point-charge outside a prolate dielectric
spheroid,” Am. J. Phys. 62, 1118 – 1121 (1994).
[Crossref]
D. V. Redzic, “Image of a moving spheroidal
conductor,” Am. J. Phys. 60, 506–508 (1992).
[Crossref]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
R. Bachelot, G. Wurtz, and P. Royer, “An application of the apertureless
scanning near-field optical microscopy: imaging a GaAlAs laser diode in
operation,” Appl. Phys. Lett. 73, 3333–3335 (1998).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
L. Novotny, E. J. Sanchez, and X. S. Xie, “Near-field optical imaging using
metal tips illuminated by higher-order Hermite-Gaussian
beams,” Ultramicroscopy 71, 21–29 (1998).
[Crossref]
S. C. Schneider, S. Grafstrom, and L. M. Eng, “Scattering near-field optical
microscopy of optically anisotropicsystems,” Phys. Rev. B 71, (2005).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
L. Stebounova, B. B. Akhremitchev, and G. C. Walker, “Enhancement of the weak scattered
signal in apertureless near-field scanning infrared
microscopy,” Rev. Sci. Instrum. 74, 3670–3674 (2003).
[Crossref]
J. C. E. Sten and I. V. Lindell, “An electrostatic image solution for
the conducting prolate spheroid,” J.
Electro-magn. Waves Appl. 9, 599 – 609 (1995).
S. V. Sukhov, “Role of multipole moment of the
probe in apertureless near-field optical
microscopy,” Ultrami-croscopy 101, 111–122 (2004).
[Crossref]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by
spectral signature in scattering infrared near-field
microscopy,” Appl. Phys. Lett. 85, 5064–5066 (2004).
[Crossref]
T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanomechanical resonance tuning and
phase effects in optical near-field interaction,” Nano Lett. 4, 1669–1672 (2004).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Performance of visible and
mid-infrared scattering-type near-field optical
microscopes,” J. Microsc.-Oxf. 210, 311–314 (2003).
[Crossref]
R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light-matter
interaction at the nanometre scale,” Nature 418, 159–162 (2002).
[Crossref]
[PubMed]
H. Harima, S. Nakashima, and T. Uemura, “Raman-scattering from anisotropic
LO-phonon-plasmon-coupled mode in n-type 4H-SiC and
6H-SiC,” J. Appl. Phys. 78, 1996–2005 (1995).
[Crossref]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and A. Viljanen, “Electrostatic image method for the
anisotropic half space,” IEE Proc.-Sci.
Meas. Technol. 144, 156 – 162 (1997).
[Crossref]
R. Esteban, R. Vogelgesang, and K. Kern, “Simulation of optical near and far
fields of dielectric apertureless scanning
probes,” Nanotechnology 17, 475–482 (2006).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
L. Stebounova, B. B. Akhremitchev, and G. C. Walker, “Enhancement of the weak scattered
signal in apertureless near-field scanning infrared
microscopy,” Rev. Sci. Instrum. 74, 3670–3674 (2003).
[Crossref]
F. Zenhausern, Y. Martin, and H. Wickramasinghe, “Scanning interferometric
apertureless microscopy - optical imaging at 10 angstrom
resolution,” Science 269, 1083–1085 (1995).
[Crossref]
[PubMed]
F. Zenhausern, M. Oboyle, and H. Wickramasinghe, “Apertureless near-field optical
microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
[Crossref]
Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, “Strength of the electric field in
apertureless near-field optical microscopy,” J. Appl. Phys. 89, 5774–5778 (2001).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
N. Calander and M. Willander, “Theory of surface-plasmon resonance
optical-field enhancement at prolate spheroids,” J. Appl. Phys. 92, 4878–4884 (2002).
[Crossref]
A. Wokaun, “Surface enhancement of
optical-fields - mechanism and applications,” Mol. Phys. 56, 1 – 33 (1985).
[Crossref]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation damping in
surface-enhanced Raman-scattering,” Phys.
Rev. Lett. 48, 957 – 960 (1982).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
R. Bachelot, G. Wurtz, and P. Royer, “An application of the apertureless
scanning near-field optical microscopy: imaging a GaAlAs laser diode in
operation,” Appl. Phys. Lett. 73, 3333–3335 (1998).
[Crossref]
L. Novotny, E. J. Sanchez, and X. S. Xie, “Near-field optical imaging using
metal tips illuminated by higher-order Hermite-Gaussian
beams,” Ultramicroscopy 71, 21–29 (1998).
[Crossref]
F. Zenhausern, Y. Martin, and H. Wickramasinghe, “Scanning interferometric
apertureless microscopy - optical imaging at 10 angstrom
resolution,” Science 269, 1083–1085 (1995).
[Crossref]
[PubMed]
F. Zenhausern, M. Oboyle, and H. Wickramasinghe, “Apertureless near-field optical
microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
[Crossref]
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
D. V. Redzic, “An electrostatic problem - a
point-charge outside a prolate dielectric
spheroid,” Am. J. Phys. 62, 1118 – 1121 (1994).
[Crossref]
D. V. Redzic, “Image of a moving spheroidal
conductor,” Am. J. Phys. 60, 506–508 (1992).
[Crossref]
M. A. Ordal et al., “Optical properties of the
metals Al, Co,Cu,Au,Fe,Pb,Ni,Pd,Pt,Ag,Ti and W in the infrared and far
infrared,” Appl. Opt. 22, (1983).
[Crossref]
[PubMed]
F. Zenhausern, M. Oboyle, and H. Wickramasinghe, “Apertureless near-field optical
microscope,” Appl. Phys. Lett. 65, 1623–1625 (1994).
[Crossref]
N. Ocelic, A. Huber, and R. Hillenbrand, “Pseudoheterodyne detection for
background-free near-field spec-troscopy,” Appl. Phys. Lett. 89, (2006).
[Crossref]
R. Bachelot, G. Wurtz, and P. Royer, “An application of the apertureless
scanning near-field optical microscopy: imaging a GaAlAs laser diode in
operation,” Appl. Phys. Lett. 73, 3333–3335 (1998).
[Crossref]
A. Huber, N. Ocelic, D. Kazantsev, and R. Hillenbrand, “Near-field imaging of mid-infrared
surface phonon polariton propagation,” Appl. Phys. Lett. 87, (2005).
[Crossref]
O. J. F. Martin and C. Girard, “Controlling and tuning strong
optical field gradients at a local probe microscope tip
apex,” Appl. Phys. Lett. 70, 705–707 (1997).
[Crossref]
T. Taubner, R. Hillenbrand, and F. Keilmann, “Nanoscale polymer recognition by
spectral signature in scattering infrared near-field
microscopy,” Appl. Phys. Lett. 85, 5064–5066 (2004).
[Crossref]
B. Knoll and F. Keilmann, “Infrared conductivity mapping for
nanoelectronics,” Appl. Phys. Lett. 77, 3980–3982 (2000).
[Crossref]
M. B. Raschke and C. Lienau, “Apertureless near-field optical
microscopy: Tip-sample coupling in elastic light
scattering,” Appl. Phys. Lett. 83, 5089–5091 (2003).
[Crossref]
R. Hillenbrand and F. Keilmann, “Material-specific mapping of
metal/semiconductor/dielectric nanosystems at 10 nm resolution by
backscattering near-field optical microscopy,” Appl. Phys. Lett. 80, 25–27 (2002).
[Crossref]
M. Labardi, S. Patane, and M. Allegrini, “Artifact-free near-field optical
imaging by apertureless microscopy,” Appl. Phys. Lett. 77, 621–623 (2000).
[Crossref]
H. Mutschke, A. C. Andersen, D. Clement, T. Henning, and G. Peiter, “Infrared properties of SiC
particles,” Astron. Astrophys. 345, 187–202 (1999).
M. B. Raschke, L. Molina, T. Elsaesser, D. H. Kim, W. Knoll, and K. Hinrichs, “Apertureless near-field vibra-tional
imaging of block-copolymer nanostructures with ultrahigh spatial
resolution,” ChemPhysChem 6, 2197–2203 (2005).
[Crossref]
[PubMed]
I. V. Lindell, K. I. Nikoskinen, and A. Viljanen, “Electrostatic image method for the
anisotropic half space,” IEE Proc.-Sci.
Meas. Technol. 144, 156 – 162 (1997).
[Crossref]
H. Harima, S. Nakashima, and T. Uemura, “Raman-scattering from anisotropic
LO-phonon-plasmon-coupled mode in n-type 4H-SiC and
6H-SiC,” J. Appl. Phys. 78, 1996–2005 (1995).
[Crossref]
N. Calander and M. Willander, “Theory of surface-plasmon resonance
optical-field enhancement at prolate spheroids,” J. Appl. Phys. 92, 4878–4884 (2002).
[Crossref]
Y. C. Martin, H. F. Hamann, and H. K. Wickramasinghe, “Strength of the electric field in
apertureless near-field optical microscopy,” J. Appl. Phys. 89, 5774–5778 (2001).
[Crossref]
J. N. Walford, J. A. Porto, R. Carminati, J. J. Greffet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, “Influence of tip modulation on image
formation in scanning near-field optical
microscopy,” J. Appl. Phys. 89, 5159–5169 (2001).
[Crossref]
J. Gersten and A. Nitzan, “Electromagnetic theory of enhanced
Raman-scattering by molecules adsorbed on rough
surfaces,” J. Chem. Phys. 73, 3023–3037 (1980).
[Crossref]
J. C. E. Sten and I. V. Lindell, “An electrostatic image solution for
the conducting prolate spheroid,” J.
Electro-magn. Waves Appl. 9, 599 – 609 (1995).
T. Taubner, R. Hillenbrand, and F. Keilmann, “Performance of visible and
mid-infrared scattering-type near-field optical
microscopes,” J. Microsc.-Oxf. 210, 311–314 (2003).
[Crossref]
H. Hatano and S. Kawata, “Applicability of deconvolution and
nonlinear optimization for reconstructing optical images from near-field
optical microscope images,” J.
Microsc.-Oxf. 194, 230 – 234 (1999).
[Crossref]
J. L. Bohn, D. J. Nesbitt, and A. Gallagher, “Field enhancement in apertureless
near-field scanning optical microscopy,” J. Opt. Soc. Am. A-Opt. Image Sci. Vis. 18, 2998–3006 (2001).
[Crossref]
Z. H. Kim, B. Liu, and S. R. Leone, “Nanometer-scale optical imaging of
epitaxially grown GaN and InN islands using apertureless near-field
microscopy,” J. Phys. Chem. B 109, 8503–8508 (2005).
[Crossref]
Z. H. Kim and S. R. Leone, “High-resolution apertureless
near-field optical imaging using gold nanosphere
probes,” J. Phys. Chem. B 110, 19,804–19,809 (2006).
I. V. Lindell, G. Dassios, and K. I. Nikoskinen, “Electrostatic image theory for the
conducting prolate spheroid,” J. Phys.
D-Appl. Phys. 34, 2302–2307 (2001).
[Crossref]
W. Denk and D. Pohl, “Near-field optics - microscopy with
nanometer-size fields,” J. Vac. Sci.
Technol. B 9, 510–513 (1991).
[Crossref]
A. Wokaun, “Surface enhancement of
optical-fields - mechanism and applications,” Mol. Phys. 56, 1 – 33 (1985).
[Crossref]
T. Taubner, F. Keilmann, and R. Hillenbrand, “Nanomechanical resonance tuning and
phase effects in optical near-field interaction,” Nano Lett. 4, 1669–1672 (2004).
[Crossref]
A. Huber, N. Ocelic, T. Taubner, and R. Hillenbrand, “Nanoscale resolved infrared probing
of crystal structure and of plasmon-phonon
coupling,” Nano Lett. 6, 774–778 (2006).
[Crossref]
[PubMed]
M. Brehm, T. Taubner, R. Hillenbrand, and F. Keilmann, “Infrared spectroscopic mapping of
single nanoparticles and viruses at nanoscale
resolution,” Nano Lett. 6, 1307–1310 (2006).
[Crossref]
[PubMed]
R. Esteban, R. Vogelgesang, and K. Kern, “Simulation of optical near and far
fields of dielectric apertureless scanning
probes,” Nanotechnology 17, 475–482 (2006).
[Crossref]
N. Ocelic and R. Hillenbrand, “Subwavelength-scale tailoring of
surface phonon polaritons by focused ion-beam
implantation,” Nat. Mater. 3, 606–609 (2004).
[Crossref]
[PubMed]
B. Knoll and F. Keilmann, “Near-field probing of vibrational
absorption for chemical microscopy,” Nature 399, 134–137 (1999).
[Crossref]
R. Hillenbrand, T. Taubner, and F. Keilmann, “Phonon-enhanced light-matter
interaction at the nanometre scale,” Nature 418, 159–162 (2002).
[Crossref]
[PubMed]
B. Knoll and F. Keilmann, “Enhanced dielectric contrast in
scattering-type scanning near-field optical
microscopy,” Opt. Commun. 182, 321–328 (2000).
[Crossref]
I. S. Averbukh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior, “Coherent near field optical
microscopy,” Opt. Commun. 174, 33–41 (2000).
[Crossref]
R. Fikri, D. Barchiesi, F. H’Dhili, R. Bachelot, A. Vial, and P. Royer, “Modeling recent experiments of
aperture-less near-field optical microscopy using 2D finite element
method,” Opt. Commun. 221, 13–22 (2003).
[Crossref]
B. Knoll and F. Keilmann, “Electromagnetic fields in the cutoff
regime of tapered metallic waveguides,” Opt. Commun. 162, 177–181 (1999).
[Crossref]
F. Keilmann and R. Hillenbrand, “Near-field microscopy by elastic
light scattering from a tip,” Philos.
Trans. R. Soc. Lond. Ser. A-Math. Phys. Eng. Sci. 362, 787–805 (2004).
[Crossref]
J. S. Samson, G. Wollny, E. Brundermann, A. Bergner, A. Hecker, G. Schwaab, A. D. Wieck, and M. Havenith, “Setup of a scanning near field
infrared microscope (SNIM): Imaging of sub-surface nano-structures in
gallium-doped silicon,” Phys. Chem. Chem.
Phys. 8, 753 – 758 (2006).
[Crossref]
[PubMed]
J. Renger, S. Grafstrom, L. M. Eng, and R. Hillenbrand, “Resonant light scattering by
near-field-induced phonon polaritons,” Phys. Rev. B 71, (2005).
S. C. Schneider, S. Grafstrom, and L. M. Eng, “Scattering near-field optical
microscopy of optically anisotropicsystems,” Phys. Rev. B 71, (2005).
[Crossref]
M. Hofmann, A. Zywietz, K. Karch, and F. Bechstedt, “Lattice-dynamics of SiC polytypes
within the bond-charge model,” Phys. Rev.
B 50, 13,401–13,411 (1994).
[Crossref]
F. Engelbrecht and R. Helbig, “Effect of crystal anisotropy on the
infrared reflectivity of 6H-SiC,” Phys.
Rev. B 48, 15,698 – 15,707 (1993).
[Crossref]
A. Cvitkovic, N. Ocelic, J. Aizpurua, R. Guckenberger, and R. Hillenbrand, “Infrared imaging of single
nanopar-ticles via strong field enhancement in a scanning
nanogap,” Phys. Rev. Lett. 97, (2006).
[Crossref]
[PubMed]
R. Hillenbrand and F. Keilmann, “Complex optical constants on a
subwavelength scale,” Phys. Rev. Lett. 85, 3029–3032 (2000).
[Crossref]
[PubMed]
A. Wokaun, J. P. Gordon, and P. F. Liao, “Radiation damping in
surface-enhanced Raman-scattering,” Phys.
Rev. Lett. 48, 957 – 960 (1982).
[Crossref]
I. V. Lindell, K. I. Nikoskinen, and M. J. Flykt, “Electrostatic image theory for an
anisotropic half-space slightly deviating from transverse
isotropy,” Radio Sci. 31, 1361 – 1368 (1996).
[Crossref]
L. Stebounova, B. B. Akhremitchev, and G. C. Walker, “Enhancement of the weak scattered
signal in apertureless near-field scanning infrared
microscopy,” Rev. Sci. Instrum. 74, 3670–3674 (2003).
[Crossref]
F. Zenhausern, Y. Martin, and H. Wickramasinghe, “Scanning interferometric
apertureless microscopy - optical imaging at 10 angstrom
resolution,” Science 269, 1083–1085 (1995).
[Crossref]
[PubMed]
P. Aravind and H. Metiu, “The effects of the interaction
between resonances in the electromagnetic response of a sphere-plane
structure - applications to surface enhanced
spectroscopy,” Surf. Sci. 124, 506–528 (1983).
[Crossref]
S. V. Sukhov, “Role of multipole moment of the
probe in apertureless near-field optical
microscopy,” Ultrami-croscopy 101, 111–122 (2004).
[Crossref]
L. Novotny, E. J. Sanchez, and X. S. Xie, “Near-field optical imaging using
metal tips illuminated by higher-order Hermite-Gaussian
beams,” Ultramicroscopy 71, 21–29 (1998).
[Crossref]
A. Huber et al., “Simultaneous infrared
material recognition and conductivity mapping by nanoscale near-field
microscopy,” Adv. Mater. (in press).
J. Aizpurua, personal communication (2005).
C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small
Particles (John Wiley & Sons Inc, 1998).
[Crossref]
J. D. Jackson, Classical Electrodynamics (Wiley & Sons, 1998).
N. Ocelic, “Quantitative near-field
phonon-polariton spectroscopy,” Ph.D.
thesis, Technical University Munich (2007).