Abstract

A new algorithm for the automatic recognition of peak and baseline regions in spectra is presented. It is part of a study to devise a baseline correction method that is particularly suitable for the simple and fast treatment of large amounts of data of the same type, such as those coming from high-throughput instruments, images, process monitoring, etc. This algorithm is based on the continuous wavelet transform, and its parameters are automatically determined using the criteria of Shannon entropy and the statistical distribution of noise, requiring virtually no user intervention. It was assessed on simulated spectra with different noise levels and baseline amplitudes, successfully recognizing the baseline points in all cases but for a few extremely weak and noisy signals. It can be combined with various fitting methods for baseline estimation and correction. In this work, it was used together with an iterative polynomial fitting to successfully process a real Raman image of 40 000 pixels in about 2.5 h.

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