Abstract
Photonics-based technologies rely on ever smaller devices and systems, which
require accurate control of 3-D electromagnetic fields. Many microscopy techniques
can map field characteristics by collecting radiation that is either coupled through
or scattered off a subwavelength probe. What makes optical measurements challenging
is that detecting radiation typically involves a photon-to-electron conversion.
Moreover, guiding or scattering light at subwavelength scales involves interactions
with metallic structures leading to thermal effects. We have proposed a way to
overcome these challenges while maintaining the attributes of near-field scanning
optical microscopy (NSOM). We showed that the mechanical action of light, i.e., the
optically induced forces (OIF) exerted on a scanning probe, can be exploited for
quantifying properties of electromagnetic fields.
© 2012 Optical Society of America
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