Abstract
Recently developed spatial light modulator (SLM)-based differential interference contrast (DIC) microscopy [Opt. Lett. 34, 2988 (2009)] reveals flexibility on the implementation of DIC imaging. However, its numerical aperture (spatial resolution) is limited to maintain sufficient interference contrast, because it requires two beams to interfere. We present a structured illumination (SI) SLM-based DIC microscopy to effectively improve the lateral resolution of the SLM-based DIC microscopy. The SI field is generated and controlled by an adjustable grating displayed on an SLM. The SI SLM-based DIC expands the bandwidth of the coherent transfer function of the SLM-based DIC imaging system, thus improving the spatial resolution. The reconstructed SI SLM-based DIC image exhibits lateral resolution of approximately 208 nm, doubling that of the common SLM-based DIC image (approximately 415 nm). SI SLM-based DIC microscopy has the potential for achieving high-resolution quantitative phase images.
© 2013 Optical Society of America
Full Article | PDF ArticleMore Like This
Jianling Chen, Yan Xu, Xiaohua Lv, Xiaomin Lai, and Shaoqun Zeng
Opt. Express 21(1) 112-121 (2013)
Timothy J. McIntyre, Christian Maurer, Stefan Bernet, and Monika Ritsch-Marte
Opt. Lett. 34(19) 2988-2990 (2009)
Timothy J. McIntyre, Christian Maurer, Stephanie Fassl, Saranjam Khan, Stefan Bernet, and Monika Ritsch-Marte
Opt. Express 18(13) 14063-14078 (2010)