Abstract

The holographic microscopy technique is a strong contender for dynamic three-dimensional (3D) measurement of small particles (typically smaller than 5μm) in microchannels. However, there is a big challenge to accurately measure the size of such small particles. The traditional hologram reconstruction method was numerically investigated. It is found that the error level, especially for the size measurement, is higher than expected, even in an ideal situation without consideration of noise. An alternative way based on Lorenz–Mie (LM) calculations was then presented. The intensity distribution of the fringe pattern on the particle hologram is directly used and compared with the ones calculated using an LM-based program. Various cases for particle sizes from 0.5to5μm and recording distances from 5to500μm are tested. The results show that the accuracy in particle sizing can be significantly improved.

© 2009 Optical Society of America

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References

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S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

2007 (2)

S. Kim and S. J. Lee, J. Micromech. Microeng. 17, 2157 (2007).
[CrossRef]

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

2006 (2)

J. Sheng, E. Malkiel, and J. Katz, Appl. Opt. 45, 3893 (2006).
[CrossRef] [PubMed]

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

2005 (1)

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

2003 (3)

2000 (1)

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).
[CrossRef]

1990 (1)

1984 (1)

1908 (1)

G. Mie, Ann. Phys. 25, 377 (1908).
[CrossRef]

Allano, D.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

M. Malek, S. Coetmellec, D. Allano, and D. Lebrun, Opt. Commun. 223, 263 (2003).
[CrossRef]

F. Slimani, G. Grehan, G. Gouesbet, and D. Allano, Appl. Opt. 23, 4140 (1984).
[CrossRef] [PubMed]

Benkouider, A. M.

Cen, K. F.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

Chevaillier, J.-P.

Coetmellec, S.

M. Malek, S. Coetmellec, D. Allano, and D. Lebrun, Opt. Commun. 223, 263 (2003).
[CrossRef]

Coëtmellec, S.

Colomb, T.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Cuche, E.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Depeursinge, C.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Emery, Y.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Fabre, J.

Gouesbet, G.

Grehan, G.

Gréhan, G.

Hiroyuki, K.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

Ito, T.

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Kanamori, H.

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Katz, J.

Kazuho, S.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

Kim, S.

S. Kim and S. J. Lee, J. Micromech. Microeng. 17, 2157 (2007).
[CrossRef]

Kunugi, T.

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Lebrun, D.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

D. Lebrun, A. M. Benkouider, and S. Coëtmellec, Opt. Express 11, 224 (2003).
[CrossRef] [PubMed]

M. Malek, S. Coetmellec, D. Allano, and D. Lebrun, Opt. Commun. 223, 263 (2003).
[CrossRef]

Lee, S. J.

S. Kim and S. J. Lee, J. Micromech. Microeng. 17, 2157 (2007).
[CrossRef]

Magistretti, P.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Malek, M.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

M. Malek, S. Coetmellec, D. Allano, and D. Lebrun, Opt. Commun. 223, 263 (2003).
[CrossRef]

Malkiel, E.

Marquet, P.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Meng, H.

Mie, G.

G. Mie, Ann. Phys. 25, 377 (1908).
[CrossRef]

Murata, S.

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).
[CrossRef]

Pan, G.

Patte-Rouland, B.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

Pu, S. L.

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

Rappaz, B.

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Satake, S.-I.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Sato, K.

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Sheng, J.

Slimani, F.

Takafumi, A.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

Taniguchi, J.

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Tomoaki, K.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

Tomoyoshi, I.

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

Yasuda, N.

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).
[CrossRef]

Ann. Phys. (1)

G. Mie, Ann. Phys. 25, 377 (1908).
[CrossRef]

Appl. Opt. (4)

Exp. Fluids (1)

S. L. Pu, D. Allano, B. Patte-Rouland, M. Malek, D. Lebrun, and K. F. Cen, Exp. Fluids 39, 1 (2005).
[CrossRef]

J. Heat Transfer (1)

S.-I. Satake, A. Takafumi, K. Hiroyuki, K. Tomoaki, S. Kazuho, and I. Tomoyoshi, J. Heat Transfer 130, 042413 (2008).
[CrossRef]

J. Micromech. Microeng. (1)

S. Kim and S. J. Lee, J. Micromech. Microeng. 17, 2157 (2007).
[CrossRef]

J. Phys.: Conf. Ser. (1)

Y. Emery, E. Cuche, T. Colomb, C. Depeursinge, B. Rappaz, P. Marquet, and P. Magistretti, J. Phys.: Conf. Ser. 61, 1317 (2007).
[CrossRef]

Meas. Sci. Technol. (1)

S.-I. Satake, T. Kunugi, K. Sato, T. Ito, H. Kanamori, and J. Taniguchi, Meas. Sci. Technol. 17, 1647 (2006).
[CrossRef]

Opt. Commun. (1)

M. Malek, S. Coetmellec, D. Allano, and D. Lebrun, Opt. Commun. 223, 263 (2003).
[CrossRef]

Opt. Express (1)

Opt. Laser Technol. (1)

S. Murata and N. Yasuda, Opt. Laser Technol. 32, 567 (2000).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Error analysis of location and size measurements using traditional reconstruction methods in holographic microscopy. (a) Absolute error on obtained particle depth position as a function of C F , (b) relative error on obtained particle size as a function of C F .

Fig. 2
Fig. 2

Radial intensity variations of the fringe patterns for the particles with different size and different recording distance.

Fig. 3
Fig. 3

Sketch (standard deviation map) of depth position and size determinations by LM calculations. Wavelength, 532 nm ; particle size, 3.5 μ m ; recording distance, 95 μ m .

Fig. 4
Fig. 4

Error analysis of location and size measurements by LM calculations in holographic microscopy with an rms error threshold of 0.002. (a) Absolute error of obtained particle depth position as a function of C F , (b) relative error of obtained particle size as a function of C F .

Equations (1)

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C F = π d 2 4 λ z .

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