Abstract

The use of phase-contrast spectral optical coherence tomography to measure two orthogonal displacement components on a slice within a scattering medium is demonstrated. This is achieved by combining sequential oblique illumination of the object and recording two interferograms before plus two after the deformation. The proposed technique is illustrated with results from a sample undergoing simple shear. Depth-resolved out-of-plane and in-plane sensitivities of 0.14 and 4.2μm per fringe are demonstrated up to a depth of 400μm in a water-based polymer.

© 2009 Optical Society of America

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References

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  1. P. Rastogi, Optical Measurement Techniques and Applications (Artech House, 1997).
  2. A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
    [CrossRef]
  3. G. Gülker, K. D. Hinsch, and A. Kraft, in Speckle Metrology, K.Gastinger, O.J.Løckberg, and S.Winther, eds., Proc. SPIE4933, 53 (2003).
  4. K. Gastinger, S. Winther, and K. D. Hinsch, in Speckle Metrology, K.Gastinger, O.J.Løkberg, and S.Winther, eds., Proc. SPIE4933, 59 (2003).
  5. P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
    [CrossRef]
  6. P. D. Ruiz, J. M. Huntley, and R. D. Wildman, Appl. Opt. 44, 3945 (2005).
    [CrossRef] [PubMed]
  7. M. De la Torre Ibarra, P. D. Ruiz, and J. M. Huntley, Opt. Express 14, 9643 (2006).
    [CrossRef] [PubMed]
  8. P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
    [CrossRef]
  9. J. M. Huntley, in Digital Speckle Pattern Interferometry and Related Techniques, P.K.Rastogi, ed. (Wiley, 2001), p. 59.

2006 (2)

M. De la Torre Ibarra, P. D. Ruiz, and J. M. Huntley, Opt. Express 14, 9643 (2006).
[CrossRef] [PubMed]

P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
[CrossRef]

2005 (1)

2004 (1)

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

2003 (1)

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

De la Torre Ibarra, M.

Drexler, W.

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

Fercher, A. F.

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

Gastinger, K.

K. Gastinger, S. Winther, and K. D. Hinsch, in Speckle Metrology, K.Gastinger, O.J.Løkberg, and S.Winther, eds., Proc. SPIE4933, 59 (2003).

Gülker, G.

G. Gülker, K. D. Hinsch, and A. Kraft, in Speckle Metrology, K.Gastinger, O.J.Løckberg, and S.Winther, eds., Proc. SPIE4933, 53 (2003).

Hinsch, K. D.

G. Gülker, K. D. Hinsch, and A. Kraft, in Speckle Metrology, K.Gastinger, O.J.Løckberg, and S.Winther, eds., Proc. SPIE4933, 53 (2003).

K. Gastinger, S. Winther, and K. D. Hinsch, in Speckle Metrology, K.Gastinger, O.J.Løkberg, and S.Winther, eds., Proc. SPIE4933, 59 (2003).

Hitzenberger, C. K.

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

Huntley, J. M.

P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
[CrossRef]

M. De la Torre Ibarra, P. D. Ruiz, and J. M. Huntley, Opt. Express 14, 9643 (2006).
[CrossRef] [PubMed]

P. D. Ruiz, J. M. Huntley, and R. D. Wildman, Appl. Opt. 44, 3945 (2005).
[CrossRef] [PubMed]

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

J. M. Huntley, in Digital Speckle Pattern Interferometry and Related Techniques, P.K.Rastogi, ed. (Wiley, 2001), p. 59.

Kraft, A.

G. Gülker, K. D. Hinsch, and A. Kraft, in Speckle Metrology, K.Gastinger, O.J.Løckberg, and S.Winther, eds., Proc. SPIE4933, 53 (2003).

Lasser, T.

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

Maranon, A.

P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
[CrossRef]

Rastogi, P.

P. Rastogi, Optical Measurement Techniques and Applications (Artech House, 1997).

Ruiz, P. D.

M. De la Torre Ibarra, P. D. Ruiz, and J. M. Huntley, Opt. Express 14, 9643 (2006).
[CrossRef] [PubMed]

P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
[CrossRef]

P. D. Ruiz, J. M. Huntley, and R. D. Wildman, Appl. Opt. 44, 3945 (2005).
[CrossRef] [PubMed]

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

Wildman, R. D.

P. D. Ruiz, J. M. Huntley, and R. D. Wildman, Appl. Opt. 44, 3945 (2005).
[CrossRef] [PubMed]

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

Winther, S.

K. Gastinger, S. Winther, and K. D. Hinsch, in Speckle Metrology, K.Gastinger, O.J.Løkberg, and S.Winther, eds., Proc. SPIE4933, 59 (2003).

Zhou, Y.

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

Appl. Opt. (1)

J. Opt. A (1)

P. D. Ruiz, Y. Zhou, J. M. Huntley, and R. D. Wildman, J. Opt. A 6, 679 (2004).
[CrossRef]

Opt. Express (1)

Proc. R. Soc., Math. Physic. Eng. Sci. (1)

P. D. Ruiz, J. M. Huntley, and A. Maranon, Proc. R. Soc., Math. Physic. Eng. Sci. 462, 2481 (2006).
[CrossRef]

Rep. Prog. Phys. (1)

A. F. Fercher, W. Drexler, C. K. Hitzenberger, and T. Lasser, Rep. Prog. Phys. 66, 239 (2003).
[CrossRef]

Other (4)

G. Gülker, K. D. Hinsch, and A. Kraft, in Speckle Metrology, K.Gastinger, O.J.Løckberg, and S.Winther, eds., Proc. SPIE4933, 53 (2003).

K. Gastinger, S. Winther, and K. D. Hinsch, in Speckle Metrology, K.Gastinger, O.J.Løkberg, and S.Winther, eds., Proc. SPIE4933, 59 (2003).

P. Rastogi, Optical Measurement Techniques and Applications (Artech House, 1997).

J. M. Huntley, in Digital Speckle Pattern Interferometry and Related Techniques, P.K.Rastogi, ed. (Wiley, 2001), p. 59.

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Figures (4)

Fig. 1
Fig. 1

(a) Top view of a phase contrast spectral OCT system for measuring displacements with dual sensitivity showing L1, L2, fixed collimators; cylindrical lenses; cL1, cL2, L3, L4, spherical lenses; NF, neutral density filter; TM, tilting mirror; BS, beam splitter; G, grating; and S, sample. (b) Unfolded side view of the illumination beam.

Fig. 2
Fig. 2

Oblique illumination of polymer layer S constrained between two glass plates G 1 and G 2 .

Fig. 3
Fig. 3

(a) In-plane and (b) out-of-plane wrapped phase (black and white represent π and π, respectively) due to simple shear of a polymer layer sandwiched between two glass plates. The regions between 0 and 1 mm and between 2.2 and 3 mm correspond to the cross correlation terms and to the polymer layer, respectively.

Fig. 4
Fig. 4

In-plane and out-of-plane displacement profiles through the thickness of a polymer layer under pure shear.

Equations (3)

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Δ ϕ ( x , y , z ) = 2 π λ [ v ( x , y , z ) n 0 sin θ + w ( x , y , z ) n 1 ( 1 + cos θ r ) ] ,
v ( x , y , z ) = λ Δ ϕ y ( x , y , z ) 4 π n 0 sin θ ,
w ( x , y , z ) = λ Δ ϕ z ( x , y , z ) 4 π n 1 ( 1 + cos θ r ) .

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