Abstract

By employing the Gaussian decomposition method, the analytical formulas of the Gaussian-beam Z-scan traces have been derived for an optically thin material exhibiting both refractive and absorptive parts of third-order nonlinearity, with Gaussian or hyperbolic secant squared laser pulses of femtosecond duration. The formulas have been verified experimentally with femtosecond-pulsed Z scans on a carbon disulfide and acetone solution of a chalcone derivative (0.95C18H17ClO4·0.05C17H14Cl2O3). An efficient yet accurate analytical technique has been demonstrated for extracting both the nonlinear refraction coefficient and the nonlinear absorption coefficient from a single closed-aperture Z-scan trace.

© 2008 Optical Society of America

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2007 (3)

2006 (3)

S. L. Ng, I. A. Razak, H. K. Fun, P. S. Patil, S. M Dharmaprakash, and V. Shettigar, “A cocrystal of 1-(4-chlorophenyl)-3-(3,4,5-trimethoxyphenyl)prop-2-en-1-one and 3-(3-chloro-4,5-dimethoxyphenyl)-1-(4-chlorophenyl)prop-2-en-1-one (0.95:0.05),” Acta Crystallogr., Sect E: Struct. Rep. Online E62, o2611-o2613 (2006).

Y. Zhu, H. I. Elim, Y. L. Foo, T. Yu, Y. Liu, W. Ji, J. Y. Lee, Z. Shen, A. T. S. Wee, J. T. L. Thong, and C. H. Sow, “Multiwalled carbon nanotubes beaded with ZnO nanoparticles for ultrafast nonlinear optical switching,” Adv. Mater. 18, 587-592 (2006).
[CrossRef]

H. Pan, W. Z. Chen, Y. P. Feng, W. Ji, and J. Lin, “Optical limiting properties of metal nanowires,” Appl. Phys. Lett. 88, 223106 (2006).
[CrossRef]

2005 (3)

2004 (3)

2000 (1)

M. Yin, H. P. Li, S. H. Tang, and W. Ji, “Determination of nonlinear absorption and refraction by single Z-scan method, ” Appl. Phys. B 70, 587-591 (2000).

1997 (2)

P. B. Chapple, J. Staromlynska, J. A. Hermann, and T. J. Mckay, “Single-beam Z-scan: measurement techniques and analysis,” J. Nonlinear Opt. Phys. Mater. 6, 251-293 (1997).
[CrossRef]

F. E. Hernandez, A. O. Marcano, and H. Maillotte, “Sensitivity of the total beam profile distortion Z-scan for the measurement of nonlinear refraction,” Opt. Commun. 134, 529-536 (1997).
[CrossRef]

1996 (1)

1990 (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

Acta Crystallogr., Sect E: Struct. Rep. Online (1)

S. L. Ng, I. A. Razak, H. K. Fun, P. S. Patil, S. M Dharmaprakash, and V. Shettigar, “A cocrystal of 1-(4-chlorophenyl)-3-(3,4,5-trimethoxyphenyl)prop-2-en-1-one and 3-(3-chloro-4,5-dimethoxyphenyl)-1-(4-chlorophenyl)prop-2-en-1-one (0.95:0.05),” Acta Crystallogr., Sect E: Struct. Rep. Online E62, o2611-o2613 (2006).

Adv. Mater. (1)

Y. Zhu, H. I. Elim, Y. L. Foo, T. Yu, Y. Liu, W. Ji, J. Y. Lee, Z. Shen, A. T. S. Wee, J. T. L. Thong, and C. H. Sow, “Multiwalled carbon nanotubes beaded with ZnO nanoparticles for ultrafast nonlinear optical switching,” Adv. Mater. 18, 587-592 (2006).
[CrossRef]

Appl. Opt. (1)

Appl. Phys. B (2)

M. Yin, H. P. Li, S. H. Tang, and W. Ji, “Determination of nonlinear absorption and refraction by single Z-scan method, ” Appl. Phys. B 70, 587-591 (2000).

R. A. Ganeev, A. I. Ryasnyansky, M. Baba, M. Suzuki, N. Ishizawa, M. Turu, S. Sakakibara, and H. Kuroda, “Nonlinear refraction in CS2,” Appl. Phys. B 78, 433-438 (2004).

Appl. Phys. Lett. (1)

H. Pan, W. Z. Chen, Y. P. Feng, W. Ji, and J. Lin, “Optical limiting properties of metal nanowires,” Appl. Phys. Lett. 88, 223106 (2006).
[CrossRef]

IEEE J. Quantum Electron. (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760-769 (1990).
[CrossRef]

J. Nonlinear Opt. Phys. Mater. (1)

P. B. Chapple, J. Staromlynska, J. A. Hermann, and T. J. Mckay, “Single-beam Z-scan: measurement techniques and analysis,” J. Nonlinear Opt. Phys. Mater. 6, 251-293 (1997).
[CrossRef]

J. Opt. Soc. Am. B (5)

Opt. Commun. (2)

B. Gu, X. Q. Huang, S. Q. Tan, and H. T. Wang, “A precise data processing method for extracting χ(3) from Z-scan technique,” Opt. Commun. 277, 209-213 (2007).
[CrossRef]

F. E. Hernandez, A. O. Marcano, and H. Maillotte, “Sensitivity of the total beam profile distortion Z-scan for the measurement of nonlinear refraction,” Opt. Commun. 134, 529-536 (1997).
[CrossRef]

Opt. Express (2)

Other (2)

R. L. Sutherland with contributions by D. G. McLean and S. Kikpatrick, Handbook of Nonlinear Optics, 2nd ed.(Dekker, 2003).

Mathematica 4.0, Wolfram Research, Inc., 1999.

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