Abstract

The photothermal deflection technique allows us to highlight the presence of inhomogeneities of absorption in optical components. This nondestructive tool is of great interest to the study of the role of contaminants, inclusions, and impurities in the laser-induced damage process. We show that the detection of nanometer-sized isolated absorbing defects requires the development of an adapted photothermal setup with high detectivity and high spatial resolution. Thus it is essential to improve the resolving power up to its theoretical limit.

© 2006 Optical Society of America

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  1. K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
    [CrossRef]
  2. C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
    [CrossRef]
  3. A. Bettinger and M. Decroisette, 'Laser megajoule project and impact on the inertial fusion program,' Fusion Eng. Design 46, 457-460 (1999).
    [CrossRef]
  4. N. Bloembergen, 'Role of cracks, pores and absorbing inclusions on laser induced damage threshold at surfaces of transparent dielectrics,' Appl. Opt. 12, 661-664 (1973).
  5. A. E. Chmel, 'Fatigue laser-induced damage in transparent materials,' Mater. Sci. Eng. B 49, 175-190 (1997).
    [CrossRef]
  6. J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
    [CrossRef]
  7. E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
    [CrossRef]
  8. B. Bertussi, J. Y. Natoli, and M. Commandré, 'Effect of polishing process on silica surface laser-induced damage threshold at 355 nm,' Opt. Commun. 242, 227-231 (2004).
    [CrossRef]
  9. J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).
  10. L. Gallais, P. Voarino, and C. Amra, 'Optical measurement of size and complex index of laser damage precursors: the inverse problem,' J. Opt. Soc. Am. B 21, 1073-1080 (2004).
    [CrossRef]
  11. M. R. Kozlowski and R. Chow, 'The role of defects in laser multilayer coatings,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
    [CrossRef]
  12. M. Poulingue, 'Le role des nodules dans l'endommagement laser de miroirs 1.06 m,' Ph.D. thesis (Institut National Polytechnique de Grenoble, Grenoble, France, 1999).
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    [CrossRef]
  14. M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
    [CrossRef]
  15. S. Demos, M. Nostrand, M. Staggs, and C. Carr, 'Investigation of fluorescence mi croscopy as a tool for noninvasive detection of surface contamination and precursors to laser-induced damage,' Appl. Opt. 41, 1977-1983 (2002).
  16. C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
    [CrossRef]
  17. A. During, C. Fossati, and M. Commandre, 'Photothermal microscopy for imaging sub-micronic defects in optical material,' Opt. Commun. 36, 279-286 (2004).
    [CrossRef]
  18. F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
    [CrossRef]
  19. D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
    [CrossRef]
  20. A. During, 'Microscopie phothermique et endommagement laser,' Ph.D. thesis (Universite Aix-Marseille III, Marseille, France, 2002).
  21. M. Commandre and P. Roche, 'Characterization of optical coatings by photothermal deflection,' Appl. Opt. 35, 5021-5034 (1996).
  22. A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

2004

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

B. Bertussi, J. Y. Natoli, and M. Commandré, 'Effect of polishing process on silica surface laser-induced damage threshold at 355 nm,' Opt. Commun. 242, 227-231 (2004).
[CrossRef]

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

A. During, C. Fossati, and M. Commandre, 'Photothermal microscopy for imaging sub-micronic defects in optical material,' Opt. Commun. 36, 279-286 (2004).
[CrossRef]

L. Gallais, P. Voarino, and C. Amra, 'Optical measurement of size and complex index of laser damage precursors: the inverse problem,' J. Opt. Soc. Am. B 21, 1073-1080 (2004).
[CrossRef]

2003

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

2002

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

2001

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

2000

M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
[CrossRef]

1999

A. Bettinger and M. Decroisette, 'Laser megajoule project and impact on the inertial fusion program,' Fusion Eng. Design 46, 457-460 (1999).
[CrossRef]

1997

A. E. Chmel, 'Fatigue laser-induced damage in transparent materials,' Mater. Sci. Eng. B 49, 175-190 (1997).
[CrossRef]

J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
[CrossRef]

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

1996

1994

M. R. Kozlowski and R. Chow, 'The role of defects in laser multilayer coatings,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
[CrossRef]

1973

Amra, C.

L. Gallais, P. Voarino, and C. Amra, 'Optical measurement of size and complex index of laser damage precursors: the inverse problem,' J. Opt. Soc. Am. B 21, 1073-1080 (2004).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

Battersby, L.

M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
[CrossRef]

Bercegol, H.

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Bertussi, B.

Bettinger, A.

A. Bettinger and M. Decroisette, 'Laser megajoule project and impact on the inertial fusion program,' Fusion Eng. Design 46, 457-460 (1999).
[CrossRef]

Bigarre, J.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

Blanaru, C.

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

Bloembergen, N.

Bonneau, F.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Bouchut, P.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

Boyer, D.

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Broyer, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Carr, C.

Chinn, D.

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Chmel, A. E.

A. E. Chmel, 'Fatigue laser-induced damage in transparent materials,' Mater. Sci. Eng. B 49, 175-190 (1997).
[CrossRef]

Choi, K. H.

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

Chow, R.

M. R. Kozlowski and R. Chow, 'The role of defects in laser multilayer coatings,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
[CrossRef]

Combis, P.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Commandre, M.

A. During, C. Fossati, and M. Commandre, 'Photothermal microscopy for imaging sub-micronic defects in optical material,' Opt. Commun. 36, 279-286 (2004).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

M. Commandre and P. Roche, 'Characterization of optical coatings by photothermal deflection,' Appl. Opt. 35, 5021-5034 (1996).

Commandré, M.

B. Bertussi, J. Y. Natoli, and M. Commandré, 'Effect of polishing process on silica surface laser-induced damage threshold at 355 nm,' Opt. Commun. 242, 227-231 (2004).
[CrossRef]

Cottancin, E.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Dabu, R.

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

Decroisette, M.

A. Bettinger and M. Decroisette, 'Laser megajoule project and impact on the inertial fusion program,' Fusion Eng. Design 46, 457-460 (1999).
[CrossRef]

Demos, S.

M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
[CrossRef]

S. Demos, M. Nostrand, M. Staggs, and C. Carr, 'Investigation of fluorescence mi croscopy as a tool for noninvasive detection of surface contamination and precursors to laser-induced damage,' Appl. Opt. 41, 1977-1983 (2002).

Desrumaux, C.

J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
[CrossRef]

Dijon, J.

J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
[CrossRef]

Donohue, J.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Duchesne, J.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

During, A.

A. During, C. Fossati, and M. Commandre, 'Photothermal microscopy for imaging sub-micronic defects in optical material,' Opt. Commun. 36, 279-286 (2004).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

A. During, 'Microscopie phothermique et endommagement laser,' Ph.D. thesis (Universite Aix-Marseille III, Marseille, France, 2002).

Fenic, C.

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

Fossati, C.

Gallais, L.

L. Gallais, P. Voarino, and C. Amra, 'Optical measurement of size and complex index of laser damage precursors: the inverse problem,' J. Opt. Soc. Am. B 21, 1073-1080 (2004).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Gogoll, S.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Huber, R.

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Huisinga, M.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Johansen, H.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Kästner, G.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Kim, D. H.

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

Kozlowski, M.

M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
[CrossRef]

Kozlowski, M. R.

M. R. Kozlowski and R. Chow, 'The role of defects in laser multilayer coatings,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
[CrossRef]

Lamaignere, L.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

Lamaignère, L.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Loiseau, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Lounis, B.

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Luculescu, C.

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

Maali, A.

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Matthias, E.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Meijer, J.

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

Msuzawa, T.

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

Natoli, J. Y.

B. Bertussi, J. Y. Natoli, and M. Commandré, 'Effect of polishing process on silica surface laser-induced damage threshold at 355 nm,' Opt. Commun. 242, 227-231 (2004).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Neauport, J.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

Nostrand, M.

Orrit, M.

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Pellarin, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Pellin, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Perra, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Poiroux, T.

J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
[CrossRef]

Poulingue, M.

M. Poulingue, 'Le role des nodules dans l'endommagement laser de miroirs 1.06 m,' Ph.D. thesis (Institut National Polytechnique de Grenoble, Grenoble, France, 1999).

Riechling, M.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Roche, P.

Rullier, J. L.

A. During, M. Commandre, C. Fossati, B. Bertussi, J. Y. Natoli, J. L. Rullier, H. Bercegol, and P. Bouchut, 'Integrated photothermal microscope and laser damage test facility for in-situ investigation of nanodefect induced damage,' Opt. Express 11, 2497-2501 (2003).

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Savina, M.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Staggs, M.

Stenzel, E.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Stolz, C.

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Tamarat, P.

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Tuaillon, J.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Valla, D.

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

Vierne, J.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Voarino, P.

Ward, H.

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Weinzapfel, L.

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Wu, Z.

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Appl. Opt.

Appl. Phys. B

F. Bonneau, P. Combis, J. L. Rullier, J. Vierne, H. Ward, M. Pellin, M. Savina, M. Broyer, E. Cottancin, J. Tuaillon, M. Pellarin, L. Gallais, J. Y. Natoli, M. Perra, H. Bercegol, L. Lamaignère, M. Loiseau, and J. Donohue, 'Study of UV laser interaction with gold nanoparticles embedded in silica,' Appl. Phys. B 75, 803-815 (2002).
[CrossRef]

Appl. Surf. Sci.

E. Stenzel, S. Gogoll, M. Huisinga, H. Johansen, G. Kästner, M. Riechling, and E. Matthias, 'Laser damage of alkaline-earth fluorides at 248 nm and the influence of polishing grades,' Appl. Surf. Sci. 109-110, 162-167 (1997).
[CrossRef]

Fusion Eng. Design

A. Bettinger and M. Decroisette, 'Laser megajoule project and impact on the inertial fusion program,' Fusion Eng. Design 46, 457-460 (1999).
[CrossRef]

J. Mater. Process. Technol.

K. H. Choi, J. Meijer, T. Msuzawa, and D. H. Kim, 'Excimer laser micromachining for 3D microstructure,' J. Mater. Process. Technol. 149, 561-566 (2004).
[CrossRef]

J. Opt. Soc. Am. B

Mater. Sci. Eng. B

A. E. Chmel, 'Fatigue laser-induced damage in transparent materials,' Mater. Sci. Eng. B 49, 175-190 (1997).
[CrossRef]

Opt. Commun.

B. Bertussi, J. Y. Natoli, and M. Commandré, 'Effect of polishing process on silica surface laser-induced damage threshold at 355 nm,' Opt. Commun. 242, 227-231 (2004).
[CrossRef]

A. During, C. Fossati, and M. Commandre, 'Photothermal microscopy for imaging sub-micronic defects in optical material,' Opt. Commun. 36, 279-286 (2004).
[CrossRef]

Opt. Express

Opt. Laser Technol.

C. Fenic, R. Dabu, C. Blanaru, and C. Luculescu, 'Preliminary studies of material surface cleaning with a multi-pulse passively Q-switched Nd:YAG laser,' Opt. Laser Technol. 36, 125-130 (2004).
[CrossRef]

Proc. SPIE

J. Dijon, T. Poiroux, and C. Desrumaux, 'Nano-absorbing centers: a key point of laser damage in thin film,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2966, 315-325 (1997).
[CrossRef]

M. R. Kozlowski and R. Chow, 'The role of defects in laser multilayer coatings,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 2114, 640-649 (1994).
[CrossRef]

M. Commandre, J. Y. Natoli, C. Amra, A. During, and L. Gallais, 'Photothermal microscopy and laser damage in optical components,' in Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, A. Duparre and B. Singh, eds., Proc. SPIE 5188, 169-181 (2003).
[CrossRef]

M. Kozlowski, L. Battersby, and S. Demos, 'Luminescence investigation of SiO2 surfaces damaged by 0.35 mm laser illumination,' in Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 3902, 138-144 (2000).
[CrossRef]

C. Stolz, D. Chinn, R. Huber, L. Weinzapfel, and Z. Wu, 'Photothermal multi-pixel imaging microscope,' In Laser-Induced Damage in Optical Materials, H. E. Bennett, H. A. Guenther, M. R. Kozlowski, B. E. Newnam, and M. J. Soileau, eds., Proc. SPIE 4347, 155-168 (2001).
[CrossRef]

Science

D. Boyer, P. Tamarat, A. Maali, B. Lounis, and M. Orrit, 'Photothermal imaging nanometer-sized metal particles among scatterers,' Science 297, 1160-1163 (2002).
[CrossRef]

Other

A. During, 'Microscopie phothermique et endommagement laser,' Ph.D. thesis (Universite Aix-Marseille III, Marseille, France, 2002).

M. Poulingue, 'Le role des nodules dans l'endommagement laser de miroirs 1.06 m,' Ph.D. thesis (Institut National Polytechnique de Grenoble, Grenoble, France, 1999).

J. Neauport, D. Valla, J. Duchesne, P. Bouchut, L. Lamaignere, J. Bigarre, and N. Daurios, 'Building high damage threshold surfaces at 351 nm,' in Optical Fabrication Testing and Metrology, R. Geyl, D. Rimmer, and L. Wang eds., Proc. SPIE 5252, 131-139 (2004).

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