November 2009
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High-resolution total-internal-reflection fluorescence microscopy using periodically nanostructured glass slides
The resolution of conventional microscopy is limited by diffraction. In recent years a number of techniques involving both nonlinear microscopy and near-field microscopy have provided resolution beyond the far-field diffraction limit. This paper develops an approach to further improve the resolution of evanescent field microscopy using optimized nanostructured substrates.
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Article Information
High-resolution total-internal-reflection fluorescence microscopy using periodically nanostructured glass slides
Anne Sentenac, Kamal Belkebir, Hugues Giovannini, and Patrick C. Chaumet
J. Opt. Soc. Am. A 26(12) 2550-2557 (2009) View: Abstract | HTML | PDF