Abstract

We show that Fourier-plane imaging in conjunction with the Kretschmann–Raether configuration can be used for measuring polariton dispersion with spatial discrimination of the sample, over the whole visible spectral range. We demonstrate the functionality of our design on several architectures, including plasmonic waveguides, and show that our new design enables the measurement of plasmonic dispersion curves of spatially inhomogeneous structures with features as small as 3 μm, in a single shot.

© 2018 Chinese Laser Press

Full Article  |  PDF Article
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References

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  1. H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics (Springer Berlin Heidelberg, 1988), Vol. 111.
  2. S. A. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007), Vol. 58.
  3. J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108, 462–493 (2008).
    [Crossref]
  4. J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
    [Crossref]
  5. S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
    [Crossref]
  6. C. H. Park, J. W. Choi, and Y.-H. Cho, “Real-time surface plasmon resonance dispersion imaging with a wide range of incident angles and detection wavelengths,” Appl. Opt. 49, 2470–2474 (2010).
    [Crossref]
  7. C. J. Alleyne, P. J. R. Roche, S. Filion-Côté, and A. G. Kirk, “Analysis of surface plasmon spectro-angular reflectance spectrum: real-time measurement, resolution limits, and applications to biosensing,” Opt. Lett. 36, 46–48 (2011).
    [Crossref]
  8. M. Ives, T. M. Autry, S. T. Cundiff, and G. Nardin, “Direct imaging of surface plasmon polariton dispersion in gold and silver thin films,” J. Opt. Soc. Am. B 33, C17–C21 (2016).
    [Crossref]
  9. R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
    [Crossref]
  10. Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
    [Crossref]
  11. S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
    [Crossref]
  12. J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
    [Crossref]
  13. T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
    [Crossref]
  14. P. Törmä and W. L. Barnes, “Strong coupling between surface plasmon polaritons and emitters: a review,” Rep. Prog. Phys. 78, 013901 (2015).
    [Crossref]
  15. T. W. Ebbesen, “Hybrid light-matter states in a molecular and material science perspective,” Acc. Chem. Res. 49, 2403–2412 (2016).
    [Crossref]
  16. J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
    [Crossref]
  17. T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
    [Crossref]
  18. W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
    [Crossref]
  19. S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
    [Crossref]
  20. H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
    [Crossref]
  21. R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
    [Crossref]
  22. C. J. Alleyne, A. G. Kirk, W.-Y. Chien, and P. G. Charette, “Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems,” Opt. Express 16, 19493–19503 (2008).
    [Crossref]
  23. A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
    [Crossref]
  24. A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
    [Crossref]

2017 (1)

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

2016 (3)

T. W. Ebbesen, “Hybrid light-matter states in a molecular and material science perspective,” Acc. Chem. Res. 49, 2403–2412 (2016).
[Crossref]

H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
[Crossref]

M. Ives, T. M. Autry, S. T. Cundiff, and G. Nardin, “Direct imaging of surface plasmon polariton dispersion in gold and silver thin films,” J. Opt. Soc. Am. B 33, C17–C21 (2016).
[Crossref]

2015 (1)

P. Törmä and W. L. Barnes, “Strong coupling between surface plasmon polaritons and emitters: a review,” Rep. Prog. Phys. 78, 013901 (2015).
[Crossref]

2014 (1)

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

2013 (1)

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

2011 (3)

2010 (1)

2008 (3)

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

C. J. Alleyne, A. G. Kirk, W.-Y. Chien, and P. G. Charette, “Numerical method for high accuracy index of refraction estimation for spectro-angular surface plasmon resonance systems,” Opt. Express 16, 19493–19503 (2008).
[Crossref]

J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108, 462–493 (2008).
[Crossref]

2007 (3)

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

2005 (1)

R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
[Crossref]

2004 (1)

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

2003 (1)

W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
[Crossref]

1996 (1)

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

1980 (1)

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Alleyne, C. J.

Atay, T.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Aussenegg, F. R.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Autry, T. M.

Barnes, W. L.

P. Törmä and W. L. Barnes, “Strong coupling between surface plasmon polaritons and emitters: a review,” Rep. Prog. Phys. 78, 013901 (2015).
[Crossref]

W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
[Crossref]

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

Baumberg, J. J.

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

Bellessa, J.

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

Bonnand, C.

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

Bouhelier, A.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Bradberry, G. W.

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

Brillante, A.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Brongersma, M. L.

R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
[Crossref]

Bulovic, V.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Charette, P. G.

Chien, W.-Y.

Cho, Y.-H.

Choi, J. W.

Colas des Francs, G.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Cundiff, S. T.

Dehmel, R.

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

Dereux, A.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
[Crossref]

Ditlbacher, H.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Drezet, A.

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
[Crossref]

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Ebbesen, T. W.

T. W. Ebbesen, “Hybrid light-matter states in a molecular and material science perspective,” Acc. Chem. Res. 49, 2403–2412 (2016).
[Crossref]

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
[Crossref]

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
[Crossref]

W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
[Crossref]

Filion-Côté, S.

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

C. J. Alleyne, P. J. R. Roche, S. Filion-Côté, and A. G. Kirk, “Analysis of surface plasmon spectro-angular reflectance spectrum: real-time measurement, resolution limits, and applications to biosensing,” Opt. Lett. 36, 46–48 (2011).
[Crossref]

Foudeh, A. M.

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

Genet, C.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
[Crossref]

T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
[Crossref]

Gonzàlez, M. U.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Gordon, J. G.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Grandidier, J.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Haacke, S.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

Hohenau, A.

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
[Crossref]

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Homola, J.

J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108, 462–493 (2008).
[Crossref]

Honma, I.

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

Huant, S.

Hutchison, J. A.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
[Crossref]

Ives, M.

Kirk, A. G.

Kitson, S. C.

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

Koller, D.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Krenn, J. R.

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, “Surface plasmon leakage radiation microscopy at the diffraction limit,” Opt. Express 19, 25749–25762 (2011).
[Crossref]

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Leitner, A.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Leonard, J.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

Léonard, J.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

Li, Q.

H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
[Crossref]

Maier, S. A.

S. A. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007), Vol. 58.

Markey, L.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Massenot, S.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Matsuda, H.

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

Mollet, O.

Mugnier, J.

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

Nardin, G.

Nurmikko, A.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Park, C. H.

Philpott, M. R.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Plenet, J. C.

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

Pockrand, I.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Qi, Z.

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

Qiu, M.

H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
[Crossref]

Quidant, R.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Raether, H.

H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics (Springer Berlin Heidelberg, 1988), Vol. 111.

Renger, J.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Roche, P. J. R.

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

C. J. Alleyne, P. J. R. Roche, S. Filion-Côté, and A. G. Kirk, “Analysis of surface plasmon spectro-angular reflectance spectrum: real-time measurement, resolution limits, and applications to biosensing,” Opt. Lett. 36, 46–48 (2011).
[Crossref]

Sambles, J. R.

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

Santo, R.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Schwartz, T.

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
[Crossref]

Scott Bradley, M.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Selker, M. D.

R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
[Crossref]

Stein, B.

Steinberger, B.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Steiner, U.

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

Stepanov, A.

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Swalen, J. D.

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Tabrizian, M.

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

Tischler, J. R.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Törmä, P.

P. Törmä and W. L. Barnes, “Strong coupling between surface plasmon polaritons and emitters: a review,” Rep. Prog. Phys. 78, 013901 (2015).
[Crossref]

Weeber, J.-C.

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Wei, M.

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

Wilts, B. D.

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

Yang, H.

H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
[Crossref]

Zhang, Q.

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Zhou, H.

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

Zia, R.

R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
[Crossref]

Acc. Chem. Res. (1)

T. W. Ebbesen, “Hybrid light-matter states in a molecular and material science perspective,” Acc. Chem. Res. 49, 2403–2412 (2016).
[Crossref]

Am. J. Phys. (1)

J. D. Swalen, J. G. Gordon, M. R. Philpott, A. Brillante, I. Pockrand, and R. Santo, “Plasmon surface polariton dispersion by direct optical observation,” Am. J. Phys. 48, 669–672 (1980).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Lett. (3)

R. Dehmel, J. J. Baumberg, U. Steiner, and B. D. Wilts, “Spectrally resolved surface plasmon resonance dispersion using half-ball optics,” Appl. Phys. Lett. 111, 201102 (2017).
[Crossref]

Z. Qi, M. Wei, H. Matsuda, I. Honma, and H. Zhou, “Broadband surface plasmon resonance spectroscopy for determination of refractive-index dispersion of dielectric thin films,” Appl. Phys. Lett. 90, 181112 (2007).
[Crossref]

S. Massenot, J. Grandidier, A. Bouhelier, G. Colas des Francs, L. Markey, J.-C. Weeber, A. Dereux, J. Renger, M. U. Gonzàlez, and R. Quidant, “Polymer-metal waveguides characterization by Fourier plane leakage radiation microscopy,” Appl. Phys. Lett. 91, 243102 (2007).
[Crossref]

Chem. Rev. (1)

J. Homola, “Surface plasmon resonance sensors for detection of chemical and biological species,” Chem. Rev. 108, 462–493 (2008).
[Crossref]

ChemPhysChem (1)

T. Schwartz, J. A. Hutchison, J. Leonard, C. Genet, S. Haacke, T. W. Ebbesen, and J. Léonard, “Polariton dynamics under strong light-molecule coupling,” ChemPhysChem 14, 125–131 (2013).
[Crossref]

J. Appl. Phys. (1)

S. C. Kitson, W. L. Barnes, G. W. Bradberry, and J. R. Sambles, “Surface profile dependence of surface plasmon band gaps on metallic gratings,” J. Appl. Phys. 79, 7383–7385 (1996).
[Crossref]

J. Opt. Soc. Am. B (1)

Laser Photon. Rev. (1)

H. Yang, M. Qiu, and Q. Li, “Identification and control of multiple leaky plasmon modes in silver nanowires,” Laser Photon. Rev. 10, 278–286 (2016).
[Crossref]

Mater. Sci. Eng. B (1)

A. Drezet, A. Hohenau, D. Koller, A. Stepanov, H. Ditlbacher, B. Steinberger, F. R. Aussenegg, A. Leitner, and J. R. Krenn, “Leakage radiation microscopy of surface plasmon polaritons,” Mater. Sci. Eng. B 149, 220–229 (2008).
[Crossref]

Nature (1)

W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature 424, 824–830 (2003).
[Crossref]

Opt. Express (2)

Opt. Lett. (1)

Org. Electron. (1)

J. R. Tischler, M. Scott Bradley, Q. Zhang, T. Atay, A. Nurmikko, and V. Bulović, “Solid state cavity QED: strong coupling in organic thin films,” Org. Electron. 8, 94–113 (2007).
[Crossref]

Phys. Rev. B (1)

R. Zia, M. D. Selker, and M. L. Brongersma, “Leaky and bound modes of surface plasmon waveguides,” Phys. Rev. B 71, 165431 (2005).
[Crossref]

Phys. Rev. Lett. (2)

J. Bellessa, C. Bonnand, J. C. Plenet, and J. Mugnier, “Strong coupling between surface plasmons and excitons in an organic semiconductor,” Phys. Rev. Lett. 93, 036404 (2004).
[Crossref]

T. Schwartz, J. A. Hutchison, C. Genet, and T. W. Ebbesen, “Reversible switching of ultrastrong light-molecule coupling,” Phys. Rev. Lett. 106, 196405 (2011).
[Crossref]

Rep. Prog. Phys. (1)

P. Törmä and W. L. Barnes, “Strong coupling between surface plasmon polaritons and emitters: a review,” Rep. Prog. Phys. 78, 013901 (2015).
[Crossref]

Rev. Sci. Instrum. (1)

S. Filion-Côté, P. J. R. Roche, A. M. Foudeh, M. Tabrizian, and A. G. Kirk, “Design and analysis of a spectro-angular surface plasmon resonance biosensor operating in the visible spectrum,” Rev. Sci. Instrum. 85, 093107 (2014).
[Crossref]

Other (2)

H. Raether, Surface Plasmons on Smooth and Rough Surfaces and on Gratings, Springer Tracts in Modern Physics (Springer Berlin Heidelberg, 1988), Vol. 111.

S. A. Maier, Plasmonics: Fundamentals and Applications (Springer, 2007), Vol. 58.

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Figures (4)

Fig. 1.
Fig. 1. Schematic sketch of the measurement system (a) in real-space imaging mode and (b) in Fourier-plane imaging mode. The dashed red lines illustrate the evolution of a single plane wave entering the prism and propagating through the setup in Fourier-plane imaging mode. (c) A subsection of a resolution target, as imaged through the optical system in the real-space imaging mode. (d) Real-space intensity distribution at the sample plane after focusing by L1. (e) Intensity distribution in Fourier-plane imaging mode for an incoming collimated beam. The dashed vertical lines in (d) and (e) mark the edges of the spectrometer entrance slit.
Fig. 2.
Fig. 2. Reflected intensity maps recorded for an Ag film for (a) TE and (b) TM polarizations. (c) Dispersion diagram of the SPP on an Ag film, measured by Fourier-plane spectral imaging. The solid line shows the SPP dispersion curve calculated by the T-matrix method. (d) Measured dispersion curve for an Ag film covered with a PVA/TDBC layer, exhibiting normal-mode splitting as a result of strong coupling between SPPs and molecular excitons. The solid lines show the dispersion curve calculated by the T-matrix method with the PVA thickness and the molecular absorption as free parameters.
Fig. 3.
Fig. 3. (a) Optical microscope image of the fabricated metal-strip waveguides. The numbers indicate the widths of the individual waveguides. (b) A schematic sketch of a waveguide cross section.
Fig. 4.
Fig. 4. SPP dispersion measured by Fourier-plane spectral imaging (a) for a 200  μm×200  μm Ag patch covered with Al2O3 and for metal-strip waveguides of widths (b) w=50  μm, (c) w=10  μm, and (d) w=3  μm. The solid lines correspond to the simulated dispersion with an Al2O3 layer in the range of 7.5–10 nm, and the dashed line in (a) corresponds to the dispersion curve calculated for a bare Ag film.

Equations (5)

Equations on this page are rendered with MathJax. Learn more.

y=y0+1.5×fC2sinθa,
θi=45°+arcsin(1npsinθa),
kspp=k0npsinθi,
neff=ksppk0=npsinθi.
neff=npsin[45°+arcsin(1np×yy01.5fC2)].