Expand this Topic clickable element to expand a topic
OSA Publishing

15 March 2021, Volume 4, Issue 3, pp. 774-1124   28 articles

Sort:

Materials

Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

OSA Continuum 4(3), 879-895 (2021)  View: HTML | PDF  [Suppl. Mat. (1)]

Select as filters


    Select Topics Cancel
    © Copyright 2021 | The Optical Society. All Rights Reserved