Abstract

Imaging in the terahertz (THz) range of the electromagnetic spectrum is difficult owing to the lack of high-power sources and efficient detectors. For decades, there has been tremendous effort to fashion focal plane arrays for THz imaging owing to the great number of potential applications. Here, we propose and demonstrate an alternative approach which utilizes all-dielectric metasurface absorbers that act as universal converters of radiation. Incident THz waves are absorbed by the metasurface, converted to heat, and subsequently detected by an infrared camera. We realize a metasurface consisting of sub-wavelength cylindrical resonators that achieve diffraction-limited imaging at THz frequencies without cooling. The low thermal conductivity and diffusivity significantly limit the thermal conduction between neighboring pixels, thus improving the spatial resolution and imaging time. Similar to conventional metallic-based metamaterials, our all-dielectric metasurface absorber can be scaled to other bands of the electromagnetic spectrum, offering a blueprint to achieve novel uncooled bolometric imaging.

© 2017 Optical Society of America

Full Article  |  PDF Article
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References

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    [Crossref]
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2017 (1)

2016 (4)

K. Fan, J. Suen, X. Wu, and W. J. Padilla, Opt. Express 24, 25189 (2016).
[Crossref]

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

2015 (3)

Y. Y. Choporova, B. A. Knyazev, and M. S. Mitkov, IEEE Trans. Terahertz Sci. Technol. 5, 836 (2015).
[Crossref]

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

2013 (2)

X. Liu and W. J. Padilla, Adv. Opt. Mater. 1, 559 (2013).
[Crossref]

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

2012 (1)

C. M. Watts, X. Liu, and W. J. Padilla, Adv. Mater. 24, OP98 (2012).
[Crossref]

2011 (2)

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[Crossref]

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

2010 (1)

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

2008 (2)

A. Podzorov and G. Gallot, Appl. Opt. 47, 3254 (2008).
[Crossref]

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[Crossref]

1999 (2)

J. Pendry, A. Holden, D. Robbins, and W. J. Stewart, IEEE Trans. Microw. Theory Tech. 47, 2075 (1999).
[Crossref]

K. Kurabayashi, M. Asheghi, M. Touzelbaev, and K. E. Goodson, J. Microelectromech. Syst. 8, 180 (1999).
[Crossref]

1996 (1)

J. Pendry, A. J. Holden, W. J. Stewart, and I. Youngs, Phys. Rev. Lett. 76, 4773 (1996).
[Crossref]

1994 (1)

R. K. Mongia and P. Bhartia, Int. J. Microw. Millim.-Wave Comput.-Aided Eng. 4, 230 (1994).
[Crossref]

Abbott, D.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Albella, P.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Asheghi, M.

K. Kurabayashi, M. Asheghi, M. Touzelbaev, and K. E. Goodson, J. Microelectromech. Syst. 8, 180 (1999).
[Crossref]

Averitt, R. D.

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

Bhartia, P.

R. K. Mongia and P. Bhartia, Int. J. Microw. Millim.-Wave Comput.-Aided Eng. 4, 230 (1994).
[Crossref]

Bhaskaran, M.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Bingham, C. M.

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

Brener, I.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Carrasco, E.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Cheng, Y.

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Choporova, Y. Y.

Y. Y. Choporova, B. A. Knyazev, and M. S. Mitkov, IEEE Trans. Terahertz Sci. Technol. 5, 836 (2015).
[Crossref]

Decker, M.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Dominguez, J.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Falkner, M.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

Fan, K.

X. Liu, K. Fan, I. V. Shadrivov, and W. J. Padilla, Opt. Express 25, 191 (2017).
[Crossref]

K. Fan, J. Suen, X. Wu, and W. J. Padilla, Opt. Express 24, 25189 (2016).
[Crossref]

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

Fedorinin, V. N.

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

Fofang, N. T.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Fumeaux, C.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Gallot, G.

Gelfand, A. V.

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

Gong, R. Z.

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Gong, Y.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Gonzales, E.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Goodson, K. E.

K. Kurabayashi, M. Asheghi, M. Touzelbaev, and K. E. Goodson, J. Microelectromech. Syst. 8, 180 (1999).
[Crossref]

Gutruf, P.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Hanham, S. M.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Headland, D.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Holden, A.

J. Pendry, A. Holden, D. Robbins, and W. J. Stewart, IEEE Trans. Microw. Theory Tech. 47, 2075 (1999).
[Crossref]

Holden, A. J.

J. Pendry, A. J. Holden, W. J. Stewart, and I. Youngs, Phys. Rev. Lett. 76, 4773 (1996).
[Crossref]

Hong, M.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Jokerst, N. M.

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[Crossref]

Kivshar, Y.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Kivshar, Y. S.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

Knyazev, B. A.

Y. Y. Choporova, B. A. Knyazev, and M. S. Mitkov, IEEE Trans. Terahertz Sci. Technol. 5, 836 (2015).
[Crossref]

Krishna, S.

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

Kurabayashi, K.

K. Kurabayashi, M. Asheghi, M. Touzelbaev, and K. E. Goodson, J. Microelectromech. Syst. 8, 180 (1999).
[Crossref]

Kuznetsov, S. A.

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

Landy, N. I.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[Crossref]

Lazorskiy, P. A.

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

Liu, S.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Liu, X.

X. Liu, K. Fan, I. V. Shadrivov, and W. J. Padilla, Opt. Express 25, 191 (2017).
[Crossref]

X. Liu and W. J. Padilla, Adv. Opt. Mater. 1, 559 (2013).
[Crossref]

C. M. Watts, X. Liu, and W. J. Padilla, Adv. Mater. 24, OP98 (2012).
[Crossref]

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[Crossref]

Lu, H. T.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Luk, T. S.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Ma, Z.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Maier, S. A.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Miroshnichenko, A. E.

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Mitkov, M. S.

Y. Y. Choporova, B. A. Knyazev, and M. S. Mitkov, IEEE Trans. Terahertz Sci. Technol. 5, 836 (2015).
[Crossref]

Mock, J. J.

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[Crossref]

Mongia, R. K.

R. K. Mongia and P. Bhartia, Int. J. Microw. Millim.-Wave Comput.-Aided Eng. 4, 230 (1994).
[Crossref]

Montoya, J. A.

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

Nadell, C. C.

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

Neshev, D. N.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
[Crossref]

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
[Crossref]

Ng, B.

Z. Ma, S. M. Hanham, P. Albella, B. Ng, H. T. Lu, Y. Gong, S. A. Maier, and M. Hong, ACS Photon. 3, 1010 (2016).
[Crossref]

Nie, Y.

Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
[Crossref]

Nirantar, S.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
[Crossref]

Padilla, W. J.

X. Liu, K. Fan, I. V. Shadrivov, and W. J. Padilla, Opt. Express 25, 191 (2017).
[Crossref]

K. Fan, J. Suen, X. Wu, and W. J. Padilla, Opt. Express 24, 25189 (2016).
[Crossref]

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

X. Liu and W. J. Padilla, Adv. Opt. Mater. 1, 559 (2013).
[Crossref]

C. M. Watts, X. Liu, and W. J. Padilla, Adv. Mater. 24, OP98 (2012).
[Crossref]

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[Crossref]

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[Crossref]

Paulish, A. G.

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

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D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
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Pertsch, T.

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
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J. Pendry, A. Holden, D. Robbins, and W. J. Stewart, IEEE Trans. Microw. Theory Tech. 47, 2075 (1999).
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N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
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Schwarz, J.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
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Shrekenhamer, D.

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
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N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
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Sriram, S.

D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
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X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
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M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
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I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
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J. Pendry, A. Holden, D. Robbins, and W. J. Stewart, IEEE Trans. Microw. Theory Tech. 47, 2075 (1999).
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H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
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Y. Cheng, W. Withayachumnankul, A. Upadhyay, D. Headland, Y. Nie, R. Z. Gong, M. Bhaskaran, S. Sriram, and D. Abbott, Adv. Opt. Mater. 3, 376 (2015).
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C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
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C. M. Watts, X. Liu, and W. J. Padilla, Adv. Mater. 24, OP98 (2012).
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D. Headland, E. Carrasco, S. Nirantar, W. Withayachumnankul, P. Gutruf, J. Schwarz, D. Abbott, M. Bhaskaran, S. Sriram, J. Perruisseau-Carrier, and C. Fumeaux, ACS Photon. 3, 1019 (2016).
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H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
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ACS Nano (1)

I. Staude, A. E. Miroshnichenko, M. Decker, N. T. Fofang, S. Liu, E. Gonzales, J. Dominguez, T. S. Luk, D. N. Neshev, I. Brener, and Y. Kivshar, ACS Nano 7, 7824 (2013).
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[Crossref]

Adv. Mater. (1)

C. M. Watts, X. Liu, and W. J. Padilla, Adv. Mater. 24, OP98 (2012).
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Adv. Opt. Mater. (4)

C. C. Nadell, C. M. Watts, J. A. Montoya, S. Krishna, and W. J. Padilla, Adv. Opt. Mater. 4, 66 (2016).
[Crossref]

X. Liu and W. J. Padilla, Adv. Opt. Mater. 1, 559 (2013).
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[Crossref]

M. Decker, I. Staude, M. Falkner, J. Dominguez, D. N. Neshev, I. Brener, T. Pertsch, and Y. S. Kivshar, Adv. Opt. Mater. 3, 813 (2015).
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Appl. Opt. (1)

Appl. Phys. Lett. (1)

S. A. Kuznetsov, A. G. Paulish, A. V. Gelfand, P. A. Lazorskiy, and V. N. Fedorinin, Appl. Phys. Lett. 99, 023501 (2011).
[Crossref]

IEEE Trans. Microw. Theory Tech. (1)

J. Pendry, A. Holden, D. Robbins, and W. J. Stewart, IEEE Trans. Microw. Theory Tech. 47, 2075 (1999).
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IEEE Trans. Terahertz Sci. Technol. (1)

Y. Y. Choporova, B. A. Knyazev, and M. S. Mitkov, IEEE Trans. Terahertz Sci. Technol. 5, 836 (2015).
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K. Kurabayashi, M. Asheghi, M. Touzelbaev, and K. E. Goodson, J. Microelectromech. Syst. 8, 180 (1999).
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J. Phys. D (1)

H. Tao, C. M. Bingham, D. Pilon, K. Fan, A. C. Strikwerda, D. Shrekenhamer, W. J. Padilla, X. Zhang, and R. D. Averitt, J. Phys. D 43, 225102 (2010).
[Crossref]

Opt. Express (2)

Phys. Rev. Lett. (3)

X. Liu, T. Tyler, T. Starr, A. F. Starr, N. M. Jokerst, and W. J. Padilla, Phys. Rev. Lett. 107, 045901 (2011).
[Crossref]

N. I. Landy, S. Sajuyigbe, J. J. Mock, D. R. Smith, and W. J. Padilla, Phys. Rev. Lett. 100, 207402 (2008).
[Crossref]

J. Pendry, A. J. Holden, W. J. Stewart, and I. Youngs, Phys. Rev. Lett. 76, 4773 (1996).
[Crossref]

Supplementary Material (1)

NameDescription
» Supplement 1: PDF (501 KB)      Supplementary material

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Figures (4)

Fig. 1.
Fig. 1.

(a) Scanning electron microscopic image of fabricated cylinder array before substrate transfer. The periodicity p=330  μm, cylinder height h=85  μm, radius r=106  μm, and the substrate thickness t=8  μm. The scale bar shown is 300 μm. (b) Oblique view of the transferred cylinders. (c) 3D view of the simulated power loss density in the absorber. Incident radiation is polarized in the x- direction. (d) Measured reflectance R (blue), transmittance T (green), and absorbance A (red) of the dielectric absorber. (e) Numerically simulated R, T, and A.

Fig. 2.
Fig. 2.

(a) Schematic of the optical setup for THz imaging. (b) 3D plot (offset by 3 K) of the relative temperature profile of a focused THz beam on the all-dielectric absorber captured by an IR camera. The red and blue lines show a cross section of the temperature profiles across the peak.

Fig. 3.
Fig. 3.

Dynamic thermal response of THz to infrared conversion. (a) The red curve shows the peak-to-peak temperature change as a function of the frequency, and the source power spectrum is plotted as the black curve. The measured absorbance of the metasurface is also shown as the blue curve. (b) Normalized thermal response versus the modulation frequency of the source. The inset shows the normalized temperature change on the absorber with a source modulation frequency of 1/16 Hz.

Fig. 4.
Fig. 4.

False-color THz images. (a) Object is a “D” letter (inset) with a linewidth of 5 mm. (b) Smiley face object (inset) with a smallest feature size of 5 mm. The color bar shows the relative temperature scale for both images.

Equations (3)

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r=0.61λ0(n21)1/2,
h=λ02n.
ΔT=ϵmPmGT2+ω2C2,

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