David J. Hagan, Editor-in-Chief
David Hagan, Editor-in-Chief
Nanosecond laser induced damage thresholds in KTiOPO4 and Rb:KTiOPO4 at 1 µm and 2 µm
R.S. Coetzee, N. Thilmann, A. Zukauskas, C. Canalias, and V. Pasiskevicius
Opt. Mater. Express 5(9), 2090-2095 (2015) View:
This figure shows SEM images of fabricated devices. The inset is the cross sectional
SEM image part of an elliptical air hole photonic crystal (EPC). See Xie et al. Opt. Mater. Express 5, 1998-2005 (2015).