Abstract

Single crystal lanthanum strontium aluminum tantalum oxide, (LaAlO3)0.29(SrTa1/2Al1/2O3)0.71 or (La0.29Sr0.71)(Al0.65Ta0.36)O3 (LSAT), is a substrate for the epitaxial growth of oxide thin films. Optical properties in the form of the complex dielectric function (ε = ε1 + iε2) and index of refraction (N = n + ik) of LSAT from 0.033 to 5.887 eV are determined from spectroscopic ellipsometry measurements. The indirect band gap and lowest direct gap energies are identified at 4.72 and 5.70 eV, respectively. Eight infrared active phonon modes are identified in the 283 to 1127 cm−1 spectral range and ascribed to chemical bonding.

© 2016 Optical Society of America

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References

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  3. A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
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  4. C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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    [Crossref]
  6. R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
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    [Crossref]
  8. J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
    [Crossref]
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    [Crossref]
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  14. L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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    [Crossref]
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2015 (1)

A. Verma, S. Raghavan, S. Stemmer, and D. Jena, “Ferroelectric transition in compressively strained SrTiO3 thin films,” Appl. Phys. Lett. 107(19), 192908 (2015).
[Crossref]

2014 (3)

L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
[Crossref]

C. J. Zollner, T. I. Willett-Gies, S. Zollner, and S. Choi, “Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4),” Thin Solid Films 571(3), 689–694 (2014).
[Crossref]

H. Haneef and N. J. Podraza, “Optical properties of single crystal Bi4Ge3O12 from the infrared to ultraviolet,” J. Appl. Phys. 116(16), 163507 (2014).
[Crossref]

2013 (2)

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

2010 (1)

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
[Crossref]

2009 (1)

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

2008 (2)

B. Johs and C. M. Herzinger, “Quantifying the accuracy of ellipsometer systems,” Phys. Stat. Solidi c 5(5), 1031–1035 (2008).
[Crossref]

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

2002 (1)

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
[Crossref]

2001 (2)

J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
[Crossref]

B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
[Crossref]

2000 (4)

H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, “Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films,” Phys. Rev. B 61(16), 10832–10844 (2000).
[Crossref]

M. Schubert, T. E. Tiwald, and C. M. Herzinger, “Infrared dielectric anisotropy and phonon modes of sapphire,” Phys. Rev. B 61(12), 8187–8201 (2000).
[Crossref]

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
[Crossref]

H. Ono and K. Koyanagi, “Infrared absorption peak due to Ta=O bonds in Ta2O5 thin films,” Appl. Phys. Lett. 77(10), 1431–1433 (2000).
[Crossref]

1999 (1)

B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

1998 (1)

J. Lee, P. I. Rovira, I. An, and R. W. Collins, “Rotating-compensator multichannel ellipsometry: applications for real time Stokes vector spectroscopy of thin film growth,” Rev. Sci. Instrum. 69(4), 1800–1810 (1998).
[Crossref]

1997 (1)

B. J. Gibbons and S. Trolier-McKinstry, “Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry,” IEEE Trans. Appl. Supercond. 7(2), 2177–2180 (1997).
[Crossref]

1996 (1)

H. Y. Chen, J. Lin, K. L. Tan, and Z. C. Feng, “Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD,” Thin Solid Films 289(1−2), 59–64 (1996).
[Crossref]

1994 (1)

R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
[Crossref]

1992 (1)

L. Andrews, T. R. Burkholder, and J. T. Yustein, “Reactions of pulsed-laser evaporated aluminum atoms with oxygen: infrared spectra of the reaction products in solid argon,” J. Phys. Chem. 96(25), 10182–10189 (1992).
[Crossref]

1991 (1)

D. Mateika, H. Kohler, H. Laudan, and E. Völkel, “Mixed-perovskite substrates for high-Tc superconductors,” J. Cryst. Growth 109(1−4), 441–446 (1991).
[Crossref]

1970 (1)

R. P. Lowndes, “Influence of lattice anharmonicity on the longitudinal optic modes of cubic ionic solids,” Phys. Rev. B 1(6), 2754–2763 (1970).
[Crossref]

1969 (1)

W. G. Oldham, “Numerical techniques for the analysis of lossy films,” Surf. Sci. 16, 97–103 (1969).
[Crossref]

1964 (1)

N. T. McDevitt and W. L. Baun, “Infrared absorption study of metal oxides in the frequency region (700−240 cm−1),” Spectrochimica Acta 20(5), 799–808 (1964).
[Crossref]

Adamo, C.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

An, I.

J. Lee, P. I. Rovira, I. An, and R. W. Collins, “Rotating-compensator multichannel ellipsometry: applications for real time Stokes vector spectroscopy of thin film growth,” Rev. Sci. Instrum. 69(4), 1800–1810 (1998).
[Crossref]

Andrews, L.

L. Andrews, T. R. Burkholder, and J. T. Yustein, “Reactions of pulsed-laser evaporated aluminum atoms with oxygen: infrared spectra of the reaction products in solid argon,” J. Phys. Chem. 96(25), 10182–10189 (1992).
[Crossref]

Baun, W. L.

N. T. McDevitt and W. L. Baun, “Infrared absorption study of metal oxides in the frequency region (700−240 cm−1),” Spectrochimica Acta 20(5), 799–808 (1964).
[Crossref]

Berger, R. F.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Bhalla, A. S.

R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
[Crossref]

Brillson, L. J.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Bungay, C. L.

B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

Burkholder, T. R.

L. Andrews, T. R. Burkholder, and J. T. Yustein, “Reactions of pulsed-laser evaporated aluminum atoms with oxygen: infrared spectra of the reaction products in solid argon,” J. Phys. Chem. 96(25), 10182–10189 (1992).
[Crossref]

Chen, H. Y.

H. Y. Chen, J. Lin, K. L. Tan, and Z. C. Feng, “Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD,” Thin Solid Films 289(1−2), 59–64 (1996).
[Crossref]

Chen, X.-L.

B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
[Crossref]

Choi, S.

C. J. Zollner, T. I. Willett-Gies, S. Zollner, and S. Choi, “Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4),” Thin Solid Films 571(3), 689–694 (2014).
[Crossref]

Chu, Y.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Collins, R. W.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, “Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films,” Phys. Rev. B 61(16), 10832–10844 (2000).
[Crossref]

J. Lee, P. I. Rovira, I. An, and R. W. Collins, “Rotating-compensator multichannel ellipsometry: applications for real time Stokes vector spectroscopy of thin film growth,” Rev. Sci. Instrum. 69(4), 1800–1810 (1998).
[Crossref]

Cross, L. E.

R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
[Crossref]

Denev, S.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Einfeldt, S.

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
[Crossref]

Feng, Z. C.

H. Y. Chen, J. Lin, K. L. Tan, and Z. C. Feng, “Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD,” Thin Solid Films 289(1−2), 59–64 (1996).
[Crossref]

Fujioka, H.

J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
[Crossref]

Fujiwara, H.

H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, “Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films,” Phys. Rev. B 61(16), 10832–10844 (2000).
[Crossref]

Gibbons, B. J.

B. J. Gibbons and S. Trolier-McKinstry, “Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry,” IEEE Trans. Appl. Supercond. 7(2), 2177–2180 (1997).
[Crossref]

Gopalan, V.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Guo, R.

R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
[Crossref]

Haneef, H.

L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
[Crossref]

H. Haneef and N. J. Podraza, “Optical properties of single crystal Bi4Ge3O12 from the infrared to ultraviolet,” J. Appl. Phys. 116(16), 163507 (2014).
[Crossref]

Herzinger, C. M.

B. Johs and C. M. Herzinger, “Quantifying the accuracy of ellipsometer systems,” Phys. Stat. Solidi c 5(5), 1031–1035 (2008).
[Crossref]

M. Schubert, T. E. Tiwald, and C. M. Herzinger, “Infrared dielectric anisotropy and phonon modes of sapphire,” Phys. Rev. B 61(12), 8187–8201 (2000).
[Crossref]

B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

Hilfiker, J.

B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

Hillsberry, D. A.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Hommel, D.

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
[Crossref]

Hu, B.-Q.

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A. Verma, S. Raghavan, S. Stemmer, and D. Jena, “Ferroelectric transition in compressively strained SrTiO3 thin films,” Appl. Phys. Lett. 107(19), 192908 (2015).
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B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

Junda, M. M.

L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
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Kamba, S.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
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L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
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Kasic, A.

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
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Kawasaki, M.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
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Koh, J.

H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, “Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films,” Phys. Rev. B 61(16), 10832–10844 (2000).
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Kohler, H.

D. Mateika, H. Kohler, H. Laudan, and E. Völkel, “Mixed-perovskite substrates for high-Tc superconductors,” J. Cryst. Growth 109(1−4), 441–446 (1991).
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J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
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Koirala, P.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
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Kourkoutis, L. F.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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H. Ono and K. Koyanagi, “Infrared absorption peak due to Ta=O bonds in Ta2O5 thin films,” Appl. Phys. Lett. 77(10), 1431–1433 (2000).
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Krockenberger, Y.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
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Kumar, A.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
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Laudan, H.

D. Mateika, H. Kohler, H. Laudan, and E. Völkel, “Mixed-perovskite substrates for high-Tc superconductors,” J. Cryst. Growth 109(1−4), 441–446 (1991).
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Lee, C.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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Lee, J.

J. Lee, P. I. Rovira, I. An, and R. W. Collins, “Rotating-compensator multichannel ellipsometry: applications for real time Stokes vector spectroscopy of thin film growth,” Rev. Sci. Instrum. 69(4), 1800–1810 (1998).
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Leszczynski, M.

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
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Levoska, J.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

Li, J.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
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Lin, J.

H. Y. Chen, J. Lin, K. L. Tan, and Z. C. Feng, “Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD,” Thin Solid Films 289(1−2), 59–64 (1996).
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T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
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Mao, Q.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
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Martin, L. W.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Mateika, D.

D. Mateika, H. Kohler, H. Laudan, and E. Völkel, “Mixed-perovskite substrates for high-Tc superconductors,” J. Cryst. Growth 109(1−4), 441–446 (1991).
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Muller, D. A.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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Mundy, J. A.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Nakamura, M.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
[Crossref]

Neaton, J. B.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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Nguyen, K.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Nuzhnyy, D.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

Ohta, J.

J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
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H. Ono and K. Koyanagi, “Infrared absorption peak due to Ta=O bonds in Ta2O5 thin films,” Appl. Phys. Lett. 77(10), 1431–1433 (2000).
[Crossref]

Oshima, M.

J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
[Crossref]

Petzelt, J.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

Piper, L. F. J.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Podraza, N. J.

L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
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H. Haneef and N. J. Podraza, “Optical properties of single crystal Bi4Ge3O12 from the infrared to ultraviolet,” J. Appl. Phys. 116(16), 163507 (2014).
[Crossref]

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Raghavan, S.

A. Verma, S. Raghavan, S. Stemmer, and D. Jena, “Ferroelectric transition in compressively strained SrTiO3 thin films,” Appl. Phys. Lett. 107(19), 192908 (2015).
[Crossref]

Ramesh, R.

A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
[Crossref]

Ratajczak, R.

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
[Crossref]

Rovira, P. I.

H. Fujiwara, J. Koh, P. I. Rovira, and R. W. Collins, “Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films,” Phys. Rev. B 61(16), 10832–10844 (2000).
[Crossref]

J. Lee, P. I. Rovira, I. An, and R. W. Collins, “Rotating-compensator multichannel ellipsometry: applications for real time Stokes vector spectroscopy of thin film growth,” Rev. Sci. Instrum. 69(4), 1800–1810 (1998).
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Roy, R.

R. Guo, A. S. Bhalla, L. E. Cross, and R. Roy, “Surface crystallographic structure compatibility between substrates and high Tc (YBCO) thin films,” J. Mater. Res. 9(7), 1644–1656 (1994).
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Saint John, D. B.

L. Karki Gautam, H. Haneef, M. M. Junda, D. B. Saint John, and N. J. Podraza, “Approach for extracting complex dielectric function spectra in weakly-absorbing regions,” Thin Solid Films 571(3), 548–553 (2014).
[Crossref]

Sakowska, H.

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
[Crossref]

Sallis, S.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Schlom, D. G.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Scholm, D. G.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Schubert, M.

M. Schubert, T. E. Tiwald, and C. M. Herzinger, “Infrared dielectric anisotropy and phonon modes of sapphire,” Phys. Rev. B 61(12), 8187–8201 (2000).
[Crossref]

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
[Crossref]

Sestak, M.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Setter, N.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

Shen, S.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
[Crossref]

Showak, M.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Stemmer, S.

A. Verma, S. Raghavan, S. Stemmer, and D. Jena, “Ferroelectric transition in compressively strained SrTiO3 thin films,” Appl. Phys. Lett. 107(19), 192908 (2015).
[Crossref]

Stoughton, S.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Sumiya, M.

J. Ohta, H. Fujioka, M. Sumiya, H. Koinuma, and M. Oshima, “Epitaxial growth of AlN on (La,Sr)(Al,Ta)O3 substrate layer by laser MBE,” J. Cryst. Growth 225(1), 73–78 (2001).
[Crossref]

Swirkowicz, M.

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
[Crossref]

Synowicki, R.

B. Johs, J. A. Woollam, C. M. Herzinger, J. Hilfiker, R. Synowicki, and C. L. Bungay, “Overview of variable angle spectroscopic ellipsometry (VASE, part II: advanced applications,” Proc. SPIE CR72, 29–58 (1999).

Tagantsev, A. K.

D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
[Crossref]

Takahashi, K. S.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
[Crossref]

Tan, K. L.

H. Y. Chen, J. Lin, K. L. Tan, and Z. C. Feng, “Characterization of lead lanthanum titanate thin films grown on fused quartz using MOCVD,” Thin Solid Films 289(1−2), 59–64 (1996).
[Crossref]

Tenne, D. A.

S. Stoughton, M. Showak, Q. Mao, P. Koirala, D. A. Hillsberry, S. Sallis, L. F. Kourkoutis, K. Nguyen, L. F. J. Piper, D. A. Tenne, N. J. Podraza, D. A. Muller, C. Adamo, and D. G. Scholm, “Absorption-controlled growth of BiVO4 by molecular-beam epitaxy,” APL Mater. 1(4), 042112 (2013).
[Crossref]

Tiwald, T. E.

M. Schubert, T. E. Tiwald, and C. M. Herzinger, “Infrared dielectric anisotropy and phonon modes of sapphire,” Phys. Rev. B 61(12), 8187–8201 (2000).
[Crossref]

A. Kasic, M. Schubert, S. Einfeldt, D. Hommel, and T. E. Tiwald, “Free-carrier and phonon properties of n- and p-type hexagonal GaN films measured by infrared ellipsometry,” Phys. Rev. B 62(11), 7365–7377 (2000).
[Crossref]

Tokura, Y.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
[Crossref]

Trolier-McKinstry, S.

B. J. Gibbons and S. Trolier-McKinstry, “Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry,” IEEE Trans. Appl. Supercond. 7(2), 2177–2180 (1997).
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Turos, A.

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
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Tyunina, M.

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Uchida, M.

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
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Verma, A.

A. Verma, S. Raghavan, S. Stemmer, and D. Jena, “Ferroelectric transition in compressively strained SrTiO3 thin films,” Appl. Phys. Lett. 107(19), 192908 (2015).
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B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
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D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
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B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
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Zhou, T.

B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
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Zhu, Y.

C. Lee, N. J. Podraza, Y. Zhu, R. F. Berger, S. Shen, M. Sestak, R. W. Collins, L. F. Kourkoutis, J. A. Mundy, H. Wang, Q. Mao, X. Xi, L. J. Brillson, J. B. Neaton, D. A. Muller, and D. G. Schlom, “Effect of reduced dimensionality on the optical gap of SrTiO3,” Appl. Phys. Lett. 102(12), 122901 (2013).
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C. J. Zollner, T. I. Willett-Gies, S. Zollner, and S. Choi, “Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4),” Thin Solid Films 571(3), 689–694 (2014).
[Crossref]

Zollner, S.

C. J. Zollner, T. I. Willett-Gies, S. Zollner, and S. Choi, “Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4),” Thin Solid Films 571(3), 689–694 (2014).
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A. Kumar, N. J. Podraza, S. Denev, J. Li, L. W. Martin, Y. Chu, R. Ramesh, R. W. Collins, and V. Gopalan, “Linear and nonlinear optical properties of multifunctional PbVO3 thin films,” Appl. Phys. Lett. 92(23), 231915 (2008).
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[Crossref]

Y. Krockenberger, M. Uchida, K. S. Takahashi, M. Nakamura, M. Kawasaki, and Y. Tokura, “Growth of superconducting Sr2RuO4 thin films,” Appl. Phys. Lett. 97(8), 082502 (2010).
[Crossref]

Chin. Phys. Lett. (1)

B.-Q. Hu, X.-M. Wang, T. Zhou, Z.-Y. Zhao, X. Wu, and X.-L. Chen, “Transmittance and refractive index of te Lanthanum Strontium Aluminum Tantalum Oxide Crystal,” Chin. Phys. Lett. 18(2), 278–279 (2001).
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D. Mateika, H. Kohler, H. Laudan, and E. Völkel, “Mixed-perovskite substrates for high-Tc superconductors,” J. Cryst. Growth 109(1−4), 441–446 (1991).
[Crossref]

T. Łukasiewicz, M. Świrkowicz, H. Sakowska, A. Turos, M. Leszczynski, and R. Ratajczak, “New oxide crystal (La,Sr)(Al,Ta)O3 as substrate for GaN epitaxy,” J. Cryst. Growth 237–239, 1118–1123 (2002).
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D. Nuzhnyy, J. Petzelt, S. Kamba, T. Yamada, M. Tyunina, A. K. Tagantsev, J. Levoska, and N. Setter, “Polar phonons in some compressively stressed epitaxial and polycrystalline SrTiO3 thin films,” J. Electroceram. 22(1-3), 297–301 (2009).
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C. J. Zollner, T. I. Willett-Gies, S. Zollner, and S. Choi, “Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4),” Thin Solid Films 571(3), 689–694 (2014).
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Figures (4)

Fig. 1
Fig. 1

(a) Experimental ellipsometric spectra (open circles) and model fit (solid lines) of (LaAlO3)0.29(SrTa1/2Al1/2O3)0.71 or (La0.29Sr0.71)(Al0.65Ta0.36)O3 (LSAT) single crystal from 0.742 to 5.887 eV. (b) Complex dielectric function (ε = ε1 + iε2) spectra for LSAT from 0.742 to 5.887 eV obtained by numerical inversion (open circles) and parametric fits (solid lines) in the non-absorbing and heavily absorbing spectral ranges.

Fig. 2
Fig. 2

Indirect (a) and direct (b) band gaps of LSAT found using the absorption coefficient (α). The indirect band gap is found by extrapolating the two slopes of α1/2 and averaging the zero intercepts. The direct band gap is found by linear extrapolation of α2 to the zero intercept. Error bars listed are from the linear fits.

Fig. 3
Fig. 3

Spectra in ε for LSAT obtained by numerical inversion (open circles) and factorized model parameterization (solid lines) from 0.033 to 0.15 eV. Inset uses a log energy scale to highlight lower amplitude features in inverted ε2 and additional peaks are marked with arrows.

Fig. 4
Fig. 4

Spectra in (a) ε from 0.033 to 5.887 eV and (b) complex index of refraction, N = n + ik, from 211 nm to 38 μm for LSAT spanning the infrared (solid circles) to near infrared – ultraviolet (open circles) range.

Tables (1)

Tables Icon

Table 1 Parameters describing the transverse optical (TO) and longitudinal optical (LO) infrared phonon modes identified for LSAT using the factorized model (σ = 1.67 x 10−2, ε* = 0.654 ± 0.001, Sellmeier parameters are A = 0.00077 ± 0.00025 eV2 and E0 fixed at 0. Parameters ωTO and ωLO are the TO and LO resonance frequencies; γTO and γLO are the corresponding broadenings.

Equations (1)

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ε( ω )= ε i ω i,LO 2 ω 2 i γ i,LO ω ω i,TO 2 ω 2 i γ i,TO ω ,

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