Abstract

A method for real-time observation of speckle movement for the analysis of lateral motions is suggested. The method involves significant magnification using lenses and a TV-camera monitor system. This approach has the advantages of conventional speckle photography without the need for any chemical processing.

© 1981 Optical Society of America

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References

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  1. See, for example, R. K. Erf, Speckle Metrology (Academic, New York, 1978).
  2. S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
    [CrossRef]
  3. T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
    [CrossRef]
  4. H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
    [CrossRef]
  5. H. J. Tiziani, J. Klenk, Appl. Opt. 20, 1467 (1981).
    [CrossRef] [PubMed]
  6. C. P. Grover, H. M. vanDriel, in Proceedings of the International Conference on Lasers 1978, V. J. Corcoran, ed. (STS Press, McLean, Va., 1979), pp. 650–654.
  7. G. H. Kaufmann, Opt. Laser Technol. 12, 207 (1980).
    [CrossRef]
  8. C. S. Vikram, K. Vedam, Opt. Lett. 5, 441 (1980).
    [CrossRef] [PubMed]

1981 (1)

1980 (5)

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
[CrossRef]

H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
[CrossRef]

G. H. Kaufmann, Opt. Laser Technol. 12, 207 (1980).
[CrossRef]

C. S. Vikram, K. Vedam, Opt. Lett. 5, 441 (1980).
[CrossRef] [PubMed]

Erf, R. K.

See, for example, R. K. Erf, Speckle Metrology (Academic, New York, 1978).

Grover, C. P.

C. P. Grover, H. M. vanDriel, in Proceedings of the International Conference on Lasers 1978, V. J. Corcoran, ed. (STS Press, McLean, Va., 1979), pp. 650–654.

Kaufmann, G. H.

G. H. Kaufmann, Opt. Laser Technol. 12, 207 (1980).
[CrossRef]

Klenk, J.

H. J. Tiziani, J. Klenk, Appl. Opt. 20, 1467 (1981).
[CrossRef] [PubMed]

H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
[CrossRef]

Kobayashi, N.

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

Leonhardt, K.

H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
[CrossRef]

Saito, T.

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

Takemori, T.

T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
[CrossRef]

Tiziani, H. J.

H. J. Tiziani, J. Klenk, Appl. Opt. 20, 1467 (1981).
[CrossRef] [PubMed]

H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
[CrossRef]

Tsujiuchi, J.

T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
[CrossRef]

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

Ueha, S.

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
[CrossRef]

vanDriel, H. M.

C. P. Grover, H. M. vanDriel, in Proceedings of the International Conference on Lasers 1978, V. J. Corcoran, ed. (STS Press, McLean, Va., 1979), pp. 650–654.

Vedam, K.

Vikram, C. S.

Appl. Opt. (1)

Opt. Commun. (3)

S. Ueha, N. Kobayashi, T. Saito, J. Tsujiuchi, Opt. Commun. 34, 340 (1980).
[CrossRef]

T. Takemori, S. Ueha, J. Tsujiuchi, Opt. Commun. 32, 24 (1980).
[CrossRef]

H. J. Tiziani, K. Leonhardt, J. Klenk, Opt. Commun. 34, 327 (1980).
[CrossRef]

Opt. Laser Technol. (1)

G. H. Kaufmann, Opt. Laser Technol. 12, 207 (1980).
[CrossRef]

Opt. Lett. (1)

Other (2)

See, for example, R. K. Erf, Speckle Metrology (Academic, New York, 1978).

C. P. Grover, H. M. vanDriel, in Proceedings of the International Conference on Lasers 1978, V. J. Corcoran, ed. (STS Press, McLean, Va., 1979), pp. 650–654.

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Figures (4)

Fig. 1
Fig. 1

A typical arrangement with two microscope objectives showing magnified speckles on the monitor screen.

Fig. 2
Fig. 2

Speckle patterns with 10,000× magnification at the screen of the TV monitor. Three microscope objectives were used. A typical speckle is marked with an asterisk, (a) Is the original pattern, whereas (b) shows 1-μm lateral shift at the object plane.

Fig. 3
Fig. 3

System using ground glass for the final observation. There are three microscope objectives, and the net magnification was 1000×.

Fig. 4
Fig. 4

Speckle pattern on the ground glass corresponding to Fig. 3. A typical speckle is circled, (a) Shows the original pattern and (b) is the shifted pattern that is due to 10-μm lateral displacement of the object.

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S 0 1.2 λ f ( m + 1 ) ,

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