Abstract

A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10−7 and 10−8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed.

© 1980 Optical Society of America

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Errata

A. C. Boccara, Warren Jackson, Nabil M. Amer, and D. Fournier, "Sensitive photothermal deflection technique for measuring absorption in optically thin media: erratum," Opt. Lett. 6, 51-51 (1981)
https://www.osapublishing.org/ol/abstract.cfm?uri=ol-6-1-51

References

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  1. A. Hordvik, Appl. Opt. 16, 2827 (1977).
    [CrossRef] [PubMed]
  2. See, for example, D. C. Smith, IEEE J. Quantum Electron. QE-5, 600 (1969).
    [CrossRef]
  3. D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).
  4. W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.
  5. Silicon Detector Corporation, Newbury Park, California.
  6. J. Stone, Appl. Opt. 17, 2876 (1978).
    [CrossRef] [PubMed]
  7. A. C. Tam, C. K. N. Patel, R. J. Kerl, Opt. Lett. 4, 81 (1979).
    [CrossRef] [PubMed]
  8. M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
    [CrossRef]
  9. R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
    [CrossRef]
  10. R. Swofford, J. Morrell, J. Appl. Phys. 49, 3667 (1978):
    [CrossRef]
  11. C. Hu, J. R. Whinnery, Appl. Opt. 12, 72 (1973).
    [CrossRef] [PubMed]

1979

A. C. Tam, C. K. N. Patel, R. J. Kerl, Opt. Lett. 4, 81 (1979).
[CrossRef] [PubMed]

M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
[CrossRef]

1978

R. Swofford, J. Morrell, J. Appl. Phys. 49, 3667 (1978):
[CrossRef]

J. Stone, Appl. Opt. 17, 2876 (1978).
[CrossRef] [PubMed]

1977

1976

R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
[CrossRef]

1973

1969

See, for example, D. C. Smith, IEEE J. Quantum Electron. QE-5, 600 (1969).
[CrossRef]

Albrecht, A.

R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
[CrossRef]

Albrecht, A. C.

M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
[CrossRef]

Amer, N. M.

D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).

W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.

Boccara, A. C.

W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.

D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).

Burberry, M. S.

M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
[CrossRef]

Fournier, D.

D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).

W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.

Gerlach, R.

D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).

Hordvik, A.

Hu, C.

Jackson, W.

W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.

Kerl, R. J.

Long, M.

R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
[CrossRef]

Morrell, J.

R. Swofford, J. Morrell, J. Appl. Phys. 49, 3667 (1978):
[CrossRef]

Morrell, J. A.

M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
[CrossRef]

Patel, C. K. N.

Smith, D. C.

See, for example, D. C. Smith, IEEE J. Quantum Electron. QE-5, 600 (1969).
[CrossRef]

Stone, J.

Swofford, R.

R. Swofford, J. Morrell, J. Appl. Phys. 49, 3667 (1978):
[CrossRef]

R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
[CrossRef]

Tam, A. C.

Whinnery, J. R.

Appl. Opt.

IEEE J. Quantum Electron.

See, for example, D. C. Smith, IEEE J. Quantum Electron. QE-5, 600 (1969).
[CrossRef]

J. Appl. Phys.

R. Swofford, J. Morrell, J. Appl. Phys. 49, 3667 (1978):
[CrossRef]

J. Chem. Phys.

M. S. Burberry, J. A. Morrell, A. C. Albrecht, J. Chem. Phys. 70, 5522 (1979).
[CrossRef]

R. Swofford, M. Long, A. Albrecht, J. Chem. Phys. 65, 179 (1976).
[CrossRef]

Opt. Lett.

Other

D. Fournier, A. C. Boccara, N. M. Amer, R. Gerlach, Appl. Phys. Lett. (to be published, September15, 1980).

W. Jackson, N. M. Amer, A. C. Boccara, D. Fournier, in preparation.

Silicon Detector Corporation, Newbury Park, California.

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Figures (3)

Fig. 1
Fig. 1

Experimental setup. 1, Position sensor; 2, lock-in amplifier; 3, modulator; 4, power meter; L1, 12-cm focal-length lens; L2, 6-cm focal-length lens; B1, beam splitter.

Fig. 2
Fig. 2

Thermal-deflection signal versus the separation between the pump and probe beams. The solid lines are the results of the theory given in Ref. 4.

Fig. 3
Fig. 3

(A) absorption spectrum of the sixth harmonic of the C—H stretching excitation of neat benzene. l = 0.5 mm; beam power, 60 mW. (B) the absorption of 0.7% benzene in CCl4 l = 0.5 mm; beam power, 60 mW; lock-in-amplifier time constant, 0.3 sec. Bar represents typical errors of ±2 × 10−6 cm−1.

Equations (2)

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ϕ = ( dn / dT ) ( P / ωρc π 2 a 2 ) [ 1 exp ( αl ) ] × [ 2 ( x 0 / a 2 ) exp ( x 0 / a 2 ) ] ,
ϕ = ( dn / dT ) ( P / k π 2 x 0 ) [ 1 exp ( αl ) ] × [ 1 exp ( x 0 2 / a 2 ) ] ,

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