Abstract

A highly sensitive and simple photothermal scheme for determining optical absorptions in condensed-matter samples is presented. αl values as low as 10−7 and 10−8 were measured for thin films and coatings and for liquids, respectively. A comparison with the thermal lens effect is given, and the experimental factors limiting our sensitivity are discussed.

© 1980 Optical Society of America

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Corrections

A. C. Boccara, Warren Jackson, Nabil M. Amer, and D. Fournier, "Sensitive photothermal deflection technique for measuring absorption in optically thin media: erratum," Opt. Lett. 6, 51-51 (1981)
https://www.osapublishing.org/ol/abstract.cfm?uri=ol-6-1-51

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