Abstract

Temperature-induced redshift of the V-O charge transfer band edge and the temperature quenching effect were combined for designing ratiometric optical thermometry. Following this approach, opposite thermal behaviors of ${{\rm Tm}^{3 +}}$ and ${{\rm Eu}^{3 +}}$ emissions were realized in the range of 300 to 380 K in ${{\rm Tm}^{3 +}}/{{\rm Eu}^{3 +}}$ co-doped ${{\rm YVO}_4}$. Applying the temperature dependent fluorescence intensity ratio of ${{\rm Eu}^{3 +}}$ to ${{\rm Tm}^{3 +}}$ as temperature readout, the maximal relative sensitivity reaches up to ${4.6}\% \;{{\rm K}^{- 1}}$ around 330 K. This result makes our proposed strategy an excellent candidate for developing high-sensitivity optical thermometry.

© 2021 Optical Society of America

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2020 (7)

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2019 (3)

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X. G. Zhang, Z. P. Zhu, Z. Y. Guo, Z. S. Sun, and Y. B. Chen, Chem. Eng. J. 356, 413 (2019).
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J. K. Zaręba, M. Nyk, J. Janczak, and M. Samoć, ACS Appl. Mater. Interfaces 11, 10435 (2019).
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2018 (3)

J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
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S. S. Zhou, C. K. Duan, M. Yin, X. L. Liu, S. Han, S. B. Zhang, and X. M. Li, Opt. Express 26, 27339 (2018).
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2017 (2)

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[Crossref]

X. Y. Liu, G. H. Chen, Y. Chen, and T. Yang, J. Non-Cryst. Solids 476, 100 (2017).
[Crossref]

2016 (1)

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

2014 (2)

2003 (1)

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M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
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M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
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[Crossref]

M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
[Crossref]

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
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J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
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S. A. Wade, S. F. Collins, and G. W. Baxter, J. Appl. Phys. 94, 4743 (2003).
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M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
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M. Back, J. Ueda, M. G. Brik, and S. Tanabe, ACS Appl. Mater. Interfaces 12, 38325 (2020).
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J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
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E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

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[Crossref]

Chen, D. Q.

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

Chen, G. H.

X. Y. Liu, G. H. Chen, Y. Chen, and T. Yang, J. Non-Cryst. Solids 476, 100 (2017).
[Crossref]

Chen, Y.

X. Y. Liu, G. H. Chen, Y. Chen, and T. Yang, J. Non-Cryst. Solids 476, 100 (2017).
[Crossref]

Chen, Y. B.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
[Crossref]

X. G. Zhang, Z. P. Zhu, Z. Y. Guo, Z. S. Sun, and Y. B. Chen, Chem. Eng. J. 356, 413 (2019).
[Crossref]

Chen, Y. H.

S. S. Zhou, X. T. Wei, X. Y. Li, Y. H. Chen, C. K. Duan, and M. Yin, Sens. Actuators B Chem. 246, 352 (2017).
[Crossref]

S. S. Zhou, G. C. Jiang, X. Y. Li, S. Jiang, X. T. Wei, Y. H. Chen, M. Yin, and C. K. Duan, Opt. Lett. 39, 6687 (2014).
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Cheng, Y.

Y. Cheng, Y. Gao, H. Lin, F. Huang, and Y. S. Wang, J. Mater. Chem. C 6, 7462 (2018).
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Collins, S. F.

S. A. Wade, S. F. Collins, and G. W. Baxter, J. Appl. Phys. 94, 4743 (2003).
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Cristofori, D.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
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S. S. Zhou, C. K. Duan, M. Yin, S. B. Zhang, and C. Wang, J. Alloys Compd. 784, 970 (2019).
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S. S. Zhou, C. K. Duan, M. Yin, X. L. Liu, S. Han, S. B. Zhang, and X. M. Li, Opt. Express 26, 27339 (2018).
[Crossref]

S. S. Zhou, X. T. Wei, X. Y. Li, Y. H. Chen, C. K. Duan, and M. Yin, Sens. Actuators B Chem. 246, 352 (2017).
[Crossref]

S. S. Zhou, G. C. Jiang, X. Y. Li, S. Jiang, X. T. Wei, Y. H. Chen, M. Yin, and C. K. Duan, Opt. Lett. 39, 6687 (2014).
[Crossref]

Gao, Y.

Y. Cheng, Y. Gao, H. Lin, F. Huang, and Y. S. Wang, J. Mater. Chem. C 6, 7462 (2018).
[Crossref]

Grinberg, M.

J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
[Crossref]

Guo, Z. Y.

X. G. Zhang, Z. P. Zhu, Z. Y. Guo, Z. S. Sun, and Y. B. Chen, Chem. Eng. J. 356, 413 (2019).
[Crossref]

Han, S.

He, J.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
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Huang, F.

Y. Cheng, Y. Gao, H. Lin, F. Huang, and Y. S. Wang, J. Mater. Chem. C 6, 7462 (2018).
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Huang, P.

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

Janczak, J.

J. K. Zaręba, M. Nyk, J. Janczak, and M. Samoć, ACS Appl. Mater. Interfaces 11, 10435 (2019).
[Crossref]

Ji, Z. G.

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

Jiang, G. C.

Jiang, S.

Kudrawiec, R.

M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
[Crossref]

Li, X. M.

Li, X. Y.

S. S. Zhou, X. T. Wei, X. Y. Li, Y. H. Chen, C. K. Duan, and M. Yin, Sens. Actuators B Chem. 246, 352 (2017).
[Crossref]

S. S. Zhou, G. C. Jiang, X. Y. Li, S. Jiang, X. T. Wei, Y. H. Chen, M. Yin, and C. K. Duan, Opt. Lett. 39, 6687 (2014).
[Crossref]

Li, Y. X.

Y. Zhao, X. S. Wang, Y. Zhang, Y. X. Li, and X. Yao, J. Alloys Compd. 817, 152691 (2020).
[Crossref]

Liao, M.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Lin, H.

Y. Cheng, Y. Gao, H. Lin, F. Huang, and Y. S. Wang, J. Mater. Chem. C 6, 7462 (2018).
[Crossref]

Lin, Q. M.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Liu, S.

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

Liu, X. L.

Liu, X. Y.

X. Y. Liu, G. H. Chen, Y. Chen, and T. Yang, J. Non-Cryst. Solids 476, 100 (2017).
[Crossref]

Liu, Z. Q.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
[Crossref]

Mu, Z. F.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Nyk, M.

M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
[Crossref]

J. K. Zaręba, M. Nyk, J. Janczak, and M. Samoć, ACS Appl. Mater. Interfaces 11, 10435 (2019).
[Crossref]

Oliva, R.

M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
[Crossref]

Palazzolo, S.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

Riello, P.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

Rizzolio, F.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

Rong, M. C.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
[Crossref]

Samoc, M.

J. K. Zaręba, M. Nyk, J. Janczak, and M. Samoć, ACS Appl. Mater. Interfaces 11, 10435 (2019).
[Crossref]

Sun, Z. S.

X. G. Zhang, Z. P. Zhu, Z. Y. Guo, Z. S. Sun, and Y. B. Chen, Chem. Eng. J. 356, 413 (2019).
[Crossref]

Tanabe, S.

M. Back, J. Ueda, M. G. Brik, and S. Tanabe, ACS Appl. Mater. Interfaces 12, 38325 (2020).
[Crossref]

M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
[Crossref]

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
[Crossref]

Trave, E.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

Ueda, J.

E. Casagrande, M. Back, D. Cristofori, J. Ueda, S. Tanabe, S. Palazzolo, F. Rizzolio, V. Canzonieri, E. Trave, and P. Riello, J. Mater. Chem. C 8, 7828 (2020).
[Crossref]

M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
[Crossref]

M. Back, J. Ueda, M. G. Brik, and S. Tanabe, ACS Appl. Mater. Interfaces 12, 38325 (2020).
[Crossref]

J. Ueda, M. Back, M. G. Brik, Y. X. Zhuang, M. Grinberg, and S. Tanabe, Opt. Mater. 85, 510 (2018).
[Crossref]

Wade, S. A.

S. A. Wade, S. F. Collins, and G. W. Baxter, J. Appl. Phys. 94, 4743 (2003).
[Crossref]

Wan, Z. Y.

D. Q. Chen, S. Liu, Y. Zhou, Z. Y. Wan, P. Huang, and Z. G. Ji, J. Mater. Chem. C 4, 9044 (2016).
[Crossref]

Wang, C.

S. S. Zhou, C. K. Duan, M. Yin, S. B. Zhang, and C. Wang, J. Alloys Compd. 784, 970 (2019).
[Crossref]

Wang, J.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
[Crossref]

Wang, Q.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Wang, R.

Wang, X. S.

Y. Zhao, X. S. Wang, Y. Zhang, Y. X. Li, and X. Yao, J. Alloys Compd. 817, 152691 (2020).
[Crossref]

Wang, Y. S.

Y. Cheng, Y. Gao, H. Lin, F. Huang, and Y. S. Wang, J. Mater. Chem. C 6, 7462 (2018).
[Crossref]

Wei, X. T.

S. S. Zhou, X. T. Wei, X. Y. Li, Y. H. Chen, C. K. Duan, and M. Yin, Sens. Actuators B Chem. 246, 352 (2017).
[Crossref]

S. S. Zhou, G. C. Jiang, X. Y. Li, S. Jiang, X. T. Wei, Y. H. Chen, M. Yin, and C. K. Duan, Opt. Lett. 39, 6687 (2014).
[Crossref]

Wu, F. G.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Xia, Z. G.

Y. B. Chen, J. He, X. G. Zhang, M. C. Rong, Z. G. Xia, J. Wang, and Z. Q. Liu, Inorg. Chem. 59, 1383 (2020).
[Crossref]

Xing, L. L.

Xiong, M. X.

Q. Wang, M. Liao, Q. M. Lin, M. X. Xiong, Z. F. Mu, and F. G. Wu, J. Alloys Compd. 850, 156744 (2021).
[Crossref]

Xu, J.

M. Back, J. Ueda, J. Xu, K. Asami, M. G. Brik, and S. Tanabe, Adv. Opt. Mater. 8, 2000124 (2020).
[Crossref]

Xu, W.

Xu, Y. L.

Yang, T.

X. Y. Liu, G. H. Chen, Y. Chen, and T. Yang, J. Non-Cryst. Solids 476, 100 (2017).
[Crossref]

Yao, X.

Y. Zhao, X. S. Wang, Y. Zhang, Y. X. Li, and X. Yao, J. Alloys Compd. 817, 152691 (2020).
[Crossref]

Yin, M.

S. S. Zhou, C. K. Duan, M. Yin, S. B. Zhang, and C. Wang, J. Alloys Compd. 784, 970 (2019).
[Crossref]

S. S. Zhou, C. K. Duan, M. Yin, X. L. Liu, S. Han, S. B. Zhang, and X. M. Li, Opt. Express 26, 27339 (2018).
[Crossref]

S. S. Zhou, X. T. Wei, X. Y. Li, Y. H. Chen, C. K. Duan, and M. Yin, Sens. Actuators B Chem. 246, 352 (2017).
[Crossref]

S. S. Zhou, G. C. Jiang, X. Y. Li, S. Jiang, X. T. Wei, Y. H. Chen, M. Yin, and C. K. Duan, Opt. Lett. 39, 6687 (2014).
[Crossref]

Zak, A.

M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
[Crossref]

Zareba, J. K.

J. K. Zaręba, M. Nyk, J. Janczak, and M. Samoć, ACS Appl. Mater. Interfaces 11, 10435 (2019).
[Crossref]

Zelewski, S. J.

M. A. Antoniak, S. J. Zelewski, R. Oliva, A. Żak, R. Kudrawiec, and M. Nyk, ACS Appl. Nano Mater. 3, 4209 (2020).
[Crossref]

Zhang, S. B.

Zhang, X. G.

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Figures (6)

Fig. 1.
Fig. 1. XRD patterns of our samples and the standard data of ${{\rm YVO}_4}$ (JCPDS No. 17-341).
Fig. 2.
Fig. 2. (a) Variations of emission intensities of ${{\rm Tm}^{3 +}}$ and ${{\rm Eu}^{3 +}}$ with changing ${{\rm Tm}^{3 +}}$ concentration from 0.5% to 15%. (b) Emission spectra of the samples with $x$ values of 0.5 and 15. The spectra are normalized to ${^1{{\rm G}}_{4}} \to {^3{{\rm H}}_6}$ emission.
Fig. 3.
Fig. 3. (a) Emission spectra of ${{\rm YVO}_4}:{15}\% \;{{\rm Tm}^{3 +}}$ , 1% ${{\rm Eu}^{3 +}}$ sample under 360 nm excitation from 300 to 380 K. (b) Temperature dependent intensity ratios ${R_1}$ of ${I_{592 - 597}}$ ( ${{\rm Eu}^{3 +}}{^5{{\rm D}}_0}\; \to {^7{{\rm F}}_1}$ ) to ${I_{449 - 460}}$ ( ${{\rm Tm}^{3 +}}{^1{{\rm D}}_2} \to {^3{{\rm F}}_4}$ ) and ${R_2}$ of ${I_{465 - 490}}$ ( ${{\rm Tm}^{3 +}}{^1{{\rm G}}_4} \to {^3{{\rm H}}_6}$ ) to ${I_{449 - 460}}$ ( ${{\rm Tm}^{3 +}}{^1{{\rm D}}_2} \to {^3{{\rm F}}_4}$ ). (c)  ${S_R}$ curves obtained according to the respective fitting line.
Fig. 4.
Fig. 4. Temperature dependent excitation spectra of ${{\rm YVO}_4}:{15}\% \;{{\rm Tm}^{3 +}}$ , 1% ${{\rm Eu}^{3 +}}$ sample monitored at (a)  ${{\rm Eu}^{3 +}}$ 595 nm emission, (b)  ${{\rm Tm}^{3 +}}$ 453 nm emission, and (c)  ${{\rm Tm}^{3 +}}$ 476 nm emission.
Fig. 5.
Fig. 5. Schematic of the excitation, energy transfer, and emission processes under 360 nm excitation.
Fig. 6.
Fig. 6. Decay curves of ${{\rm YVO}_4}:{15}\% \;{{\rm Tm}^{3 +}}$ , 1% ${{\rm Eu}^{3 +}}$ sample recorded at different temperatures monitored at (a)  ${{\rm Eu}^{3 +}}$ 619 nm emission, (b)  ${{\rm Tm}^{3 +}}$ 648 nm emission, and (c)  ${{\rm Tm}^{3 +}}$ 453 nm emission.

Tables (1)

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Table 1. Parameters of Several Optical Temperature Sensing Materials

Equations (2)

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R 1 = 4.65 × 10 6 × exp ( 5709 T ) + 0.02.
δ T = 1 S R δ FIR FIR ,

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