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Dynamic white-light interferometry via multiwavelength tilt iteration and sliding local least squares

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Abstract

The growing interest in microprofile measurements for advanced semiconductor manufacturing and electronic glass screens has stimulated the demand for in situ dynamic white-light interferometry (DWLI). However, it is challenging to perform vibration-insensitive measurements because of the broad-spectrum interference. In this Letter, we report a vertical scanning DWLI using multiwavelength tilt iteration and sliding local least squares. Numerical simulations and comparative experiments were conducted to verify the principle and performance of the proposed method. To the best of our knowledge, this is the first time such a DWLI has been proposed to achieve excellent vibration-resistant performance without using complex photoelectric compensation systems.

© 2021 Optical Society of America

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Supplementary Material (1)

NameDescription
Visualization 1       The jitter in the fringe patterns of the main channel and assistant channel due to environmental vibrations in the step measurement experiment.

Data availability

Data underlying the results presented in this Letter are not publicly available at this time but may be obtained from the authors upon reasonable request.

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