Abstract

The use of phase masks is necessary for wavefront coding, and these are often based on optical path differences. However, the optical dispersion constrains the resulting device to operate within a restricted spectral bandwidth. Here we propose to remove this constraint due to sub-wavelength structuration of the surface. The use of spatial and spectral co-localization properties of these structures allows the production of various spectrally exclusive phase masks on the same area.

© 2021 Optical Society of America

COACH-based Shack–Hartmann wavefront sensor with an array of phase coded masks

Nitin Dubey, Ravi Kumar, and Joseph Rosen
Opt. Express 29(20) 31859-31874 (2021)

Wavefront-coded phase measuring deflectometry for the all-focused measurement

Zhenqi Niu, Junhua Wang, Yuhan Tian, Zhen Wu, Chaoyang Wei, and Jianda Shao
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Effect of surface manufacturing error of cubic phase mask in wavefront coding system

Chuan-Chung Chang and Cheng-Chung Lee
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Wavefront coding with Jacobi–Fourier phase masks for retinal imaging

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Appl. Opt. 59(22) G234-G238 (2020)

Nonaxial Strehl ratio of wavefront coding systems with a cubic phase mask

Shouqian Chen, Zhigang Fan, Hong Chang, and Zhigao Xu
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