Abstract
InP-based avalanche photodiodes (APDs) are widely used in short-wave infrared (SWIR) communications. In this work, a thin (200 nm nominal) InAlAs digital alloy layer consisting of two monolayer (ML) InAs and two ML AlAs was grown on InP substrate and investigated in detail. APDs with p-i-n and n-i-p structures were fabricated and characterized. The current-voltage, capacitance-voltage characteristics, and excess noise were measured at room temperature with different laser wavelengths, and the measured effective ${k}$ value (ratio of impact ionization coefficients) is about 0.15 with the multiplication gain up to 12. The randomly-generated path length (RPL) model was carried out to analyze the dead space effect. Our thin digital alloy successfully reduced excess noise compared with conventional ${{\rm In}_{0.52}}{{\rm Al}_{0.48}}{\rm As}$ random alloy without introducing new elements and shows the potential for high-speed, low noise APD applications.
© 2021 Optical Society of America
Full Article | PDF ArticleMore Like This
Yuan Yuan, Jiyuan Zheng, Yaohua Tan, Yiwei Peng, Ann-Kathryn Rockwell, Seth R. Bank, Avik Ghosh, and Joe C. Campbell
Photon. Res. 6(8) 794-799 (2018)
Yuan Yuan, Daehwan Jung, Keye Sun, Jiyuan Zheng, Andrew H. Jones, John E. Bowers, and Joe C. Campbell
Opt. Lett. 44(14) 3538-3541 (2019)
Jishen Zhang, Haibo Wang, Gong Zhang, Kian Hua Tan, Satrio Wicaksono, Haiwen Xu, Chao Wang, Yue Chen, Yan Liang, Charles Ci Wen Lim, Soon-Fatt Yoon, and Xiao Gong
Opt. Lett. 46(11) 2670-2673 (2021)