Abstract

This study describes a new approach for material decomposition in x-ray imaging, utilizing phase contrast both to increase sensitivity to weakly attenuating samples and to act as a complementary measurement to attenuation, therefore allowing two overlaid materials to be separated. The measurements are captured using the single-exposure, single-grid x-ray phase contrast imaging technique, with a novel correction that aims to remove propagation-based phase effects seen at sharp edges in the attenuation image. The use of a single-exposure technique means that images can be collected in a high-speed sequence. Results are shown for both a known two-material sample and for a biological specimen.

© 2020 Optical Society of America

Tomographic phase and attenuation extraction for a sample composed of unknown materials using x-ray propagation-based phase-contrast imaging

S. J. Alloo, D. M. Paganin, K. S. Morgan, T. E. Gureyev, S. C. Mayo, S. Mohammadi, D. Lockie, R. H. Menk, F. Arfelli, F. Zanconati, G. Tromba, and K. M. Pavlov
Opt. Lett. 47(8) 1945-1948 (2022)

A sensitive x-ray phase contrast technique for rapid imaging using a single phase grid analyzer

Kaye S. Morgan, Peter Modregger, Sarah C. Irvine, Simon Rutishauser, Vitaliy A. Guzenko, Marco Stampanoni, and Christian David
Opt. Lett. 38(22) 4605-4608 (2013)

Quantitative single-exposure x-ray phase contrast imaging using a single attenuation grid

Kaye S. Morgan, David M. Paganin, and Karen K. W. Siu
Opt. Express 19(20) 19781-19789 (2011)

Model-driven phase retrieval network for single-shot x-ray Talbot–Lau interferometer imaging

Peizhen Liu, Jiecheng Yang, Jianwei Chen, Ting Su, Jinchuan Guo, Hairong Zheng, Dong Liang, and Yongshuai Ge
Opt. Lett. 45(22) 6314-6317 (2020)

Capturing and visualizing transient X-ray wavefront topological features by single-grid phase imaging

Kaye S. Morgan, Timothy C. Petersen, Martin Donnelley, Nigel Farrow, David W. Parsons, and David M. Paganin
Opt. Express 24(21) 24435-24450 (2016)