Abstract

We propose a novel and simple snapshot phase-shifting diffraction phase microscope with a polarization grating and spatial phase-shifting technology. Polarization grating separates the incident beam into left and right circular polarization beams, one of which is used as the reference beam after passing through a pinhole. Four phase-shifted interferograms can be captured simultaneously from the polarization camera to reconstruct the high spatial resolution phase map. The principle is presented in this Letter, and the performance of the proposed system is demonstrated experimentally. Due to the near-common-path configuration and snapshot feature, the proposed system provides a feasible way for real-time quantitative phase measurement with minimal sensitivity to vibration and thermal disturbance.

© 2020 Optical Society of America

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