Abstract

This Letter uses polarized Raman spectroscopy as a “strain rosette” to quantitatively determine all the in-plane components of the stress tensor for (110) silicon. Through polarized Raman spectroscopy, Raman wavenumber shifts can be obtained at the same point with different polarization directions of the incident and/or scattered light. With at least three measured Raman shifts in different polarized directions, the three stress components of a surface that contains two non-equal normal stresses and one shear stress can be calculated accordingly. We develop an analytical and linear Raman wavenumber shift–stress relationship when shear stress is considered. The experimental results verify the theoretical predictions. It shows that the simple stress condition assumption may lead to erroneous results.

© 2019 Optical Society of America

Full Article  |  PDF Article
More Like This
Continuous-wave coherent Raman spectroscopy for improving the accuracy of Raman shifts

Hugo Kerdoncuff, Mikael Lassen, and Jan C. Petersen
Opt. Lett. 44(20) 5057-5060 (2019)

Sagnac-enhanced impulsive stimulated Raman scattering for highly sensitive low-frequency Raman spectroscopy

Walker Peterson, Kotaro Hiramatsu, and Keisuke Goda
Opt. Lett. 44(21) 5282-5285 (2019)

Highly efficient tunable picosecond deep ultraviolet laser system for Raman spectroscopy

Anton D. Shutov, Georgi V. Petrov, Da-Wei Wang, Marlan O. Scully, and Vladislav V. Yakovlev
Opt. Lett. 44(23) 5760-5763 (2019)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (4)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (16)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription