Abstract

We report on the first, to the best of our knowledge, sub-second, sub-mm2 infrared (IR) spectroscopic measurements of thin organic films employing a laser-based phase–amplitude polarimeter in reflection geometry. The polarimeter uses a broadband mid-IR quantum cascade laser tunable between 1318cm1 and 1765cm1, as well as a single-shot beam division scheme for simultaneous single-pulse phase and amplitude measurements. The instrument achieves 120 μm spatial and <0.5cm1 spectral resolution, while providing unrivaled performance in terms of acquisition times. Spectral measurements within 100 ms and single-wavelength tracking at 16 μs are now possible. Investigating the vibrational properties accessible in the mid-IR, the polarimeter was applied for monitoring changes in molecular interactions of a 150 nm thin myristic acid film during its thermal phase transition around 55°C.

© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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References

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  1. H. G. Tompkins and E. A. Irene, Handbook of Ellipsometry (William Andrew, 2005).
  2. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, 2007).
  3. M. Losurdo and K. Hingerl, Ellipsometry at the Nanoscale (Springer, 2013).
  4. K. Hinrichs and K.-J. Eichhorn, Ellipsometry of Functional Organic Surfaces and Films (Springer, 2018).
  5. M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
    [Crossref]
  6. C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
    [Crossref]
  7. K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
    [Crossref]
  8. T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
    [Crossref]
  9. S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
    [Crossref]
  10. P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
    [Crossref]
  11. J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
    [Crossref]
  12. A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
    [Crossref]
  13. A. Ebner, R. Zimmerleiter, C. Cobet, K. Hingerl, M. Brandstetter, and J. Kilgus, Opt. Lett. 44, 3426 (2019).
    [Crossref]
  14. R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
    [Crossref]
  15. I. Matai and P. Gopinath, RSC Adv. 6, 24808 (2016).
    [Crossref]
  16. J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
    [Crossref]
  17. K. Pielichowska and K. Pielichowski, Prog. Mater. Sci. 65, 67 (2014).
    [Crossref]
  18. S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
    [Crossref]
  19. A. Furchner, C. Walder, M. Zellmeier, J. Rappich, and K. Hinrichs, Appl. Opt. 57, 7895 (2018).
    [Crossref]
  20. A. Röseler and E.-H. Korte, Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths, eds. (Wiley, 2006).
  21. A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
    [Crossref]
  22. E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
    [Crossref]
  23. Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
    [Crossref]
  24. L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
    [Crossref]

2019 (2)

A. Ebner, R. Zimmerleiter, C. Cobet, K. Hingerl, M. Brandstetter, and J. Kilgus, Opt. Lett. 44, 3426 (2019).
[Crossref]

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

2018 (1)

2017 (5)

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
[Crossref]

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

2016 (1)

I. Matai and P. Gopinath, RSC Adv. 6, 24808 (2016).
[Crossref]

2014 (2)

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
[Crossref]

K. Pielichowska and K. Pielichowski, Prog. Mater. Sci. 65, 67 (2014).
[Crossref]

2013 (1)

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

2012 (1)

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

2011 (1)

S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
[Crossref]

2008 (1)

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

2004 (1)

C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
[Crossref]

2003 (1)

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

2000 (1)

Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
[Crossref]

1993 (1)

R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
[Crossref]

Akkache, S.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Andrade-Filho, T.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Araújo, A. C.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Azzam, R. M. A.

R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
[Crossref]

Badens, E.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Basistyy, R.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Bassan, P.

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
[Crossref]

Benson, M. R.

J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
[Crossref]

Bernhard, C.

C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
[Crossref]

Bittrich, E.

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

Brandstetter, M.

Burkert, S.

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

Carr, G.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Chee, S. Y.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Cobet, C.

da Silva, L. F. L.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

da Silva Filho, J. G.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

de Sousa, F. F.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Duarte, A. R. C.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Ebner, A.

Eichhorn, K.-J.

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

K. Hinrichs and K.-J. Eichhorn, Ellipsometry of Functional Organic Surfaces and Films (Springer, 2018).

Esser, N.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Filho, J. M.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Fischer, P.

S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
[Crossref]

Freire, P. T. C.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Fujiwara, H.

H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, 2007).

Furchner, A.

A. Furchner, C. Walder, M. Zellmeier, J. Rappich, and K. Hinrichs, Appl. Opt. 57, 7895 (2018).
[Crossref]

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

Gardner, P.

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
[Crossref]

Gensch, M.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

Gkogkou, D.

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

Gopinath, P.

I. Matai and P. Gopinath, RSC Adv. 6, 24808 (2016).
[Crossref]

Higuchi, T.

Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
[Crossref]

Hingerl, K.

Hinrichs, K.

A. Furchner, C. Walder, M. Zellmeier, J. Rappich, and K. Hinrichs, Appl. Opt. 57, 7895 (2018).
[Crossref]

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

K. Hinrichs and K.-J. Eichhorn, Ellipsometry of Functional Organic Surfaces and Films (Springer, 2018).

Humlicek, J.

C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
[Crossref]

Ikeda, I.

Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
[Crossref]

Ionov, L.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Irene, E. A.

H. G. Tompkins and E. A. Irene, Handbook of Ellipsometry (William Andrew, 2005).

Kang, T.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Kee, S. Y.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Keimer, B.

C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
[Crossref]

Ketelsen, H.

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

Kilgus, J.

Korte, E.-H.

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

A. Röseler and E.-H. Korte, Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths, eds. (Wiley, 2006).

Kotelyanskii, A.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Kotelyanskii, M.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Kratz, C.

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

Kroning, A.

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

Lai, K. C.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Losurdo, M.

M. Losurdo and K. Hingerl, Ellipsometry at the Nanoscale (Springer, 2013).

Lüdeke, S.

S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
[Crossref]

Maeda, Y.

Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
[Crossref]

Marciniak, M. A.

J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
[Crossref]

Masmoudi, Y.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Matai, I.

I. Matai and P. Gopinath, RSC Adv. 6, 24808 (2016).
[Crossref]

Metselaar, C.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Mikhaylova, Y.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Minko, S.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Moreira, S. G. C.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Müller, M.

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

Munusamy, Y.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Nauyoks, S. E.

J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
[Crossref]

Nita, G.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Ong, K. S.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Pfeifer, M.

S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
[Crossref]

Pielichowska, K.

K. Pielichowska and K. Pielichowski, Prog. Mater. Sci. 65, 67 (2014).
[Crossref]

Pielichowski, K.

K. Pielichowska and K. Pielichowski, Prog. Mater. Sci. 65, 67 (2014).
[Crossref]

Rappich, J.

Rauch, S.

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

Reis, R. L.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Rogers, P.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Roodenko, K.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Röseler, A.

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

A. Röseler and E.-H. Korte, Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths, eds. (Wiley, 2006).

Rowlette, J.

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
[Crossref]

Saraiva, G. D.

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Schade, U.

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

Silva, J. M.

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Simon, H.

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Sirenko, A.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Stamm, M.

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Standard, C.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Stanislavchuk, T.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Tompkins, H. G.

H. G. Tompkins and E. A. Irene, Handbook of Ellipsometry (William Andrew, 2005).

Uhlmann, P.

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
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E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
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J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
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Walder, C.

Weida, M. J.

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
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Zhou, T.

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

Zimmerleiter, R.

Anal. Chem. (1)

A. Furchner, A. Kroning, S. Rauch, P. Uhlmann, K.-J. Eichhorn, and K. Hinrichs, Anal. Chem. 89, 3240 (2017).
[Crossref]

Analyst (1)

P. Bassan, M. J. Weida, J. Rowlette, and P. Gardner, Analyst 139, 3856 (2014).
[Crossref]

Analytical and Bioanalytical Chemistry (1)

M. Gensch, K. Hinrichs, A. Röseler, E.-H. Korte, and U. Schade, Analytical and Bioanalytical Chemistry 376, 626 (2003).
[Crossref]

Appl. Opt. (1)

Appl. Phys. Lett. (1)

K. Roodenko, Y. Mikhaylova, L. Ionov, M. Gensch, M. Stamm, S. Minko, U. Schade, K.-J. Eichhorn, N. Esser, and K. Hinrichs, Appl. Phys. Lett. 92, 103102 (2008).
[Crossref]

Appl. Surf. Sci. (1)

A. Furchner, C. Kratz, D. Gkogkou, H. Ketelsen, and K. Hinrichs, Appl. Surf. Sci. 421, 440 (2017).
[Crossref]

J. Am. Chem. Soc. (1)

S. Lüdeke, M. Pfeifer, and P. Fischer, J. Am. Chem. Soc. 133, 5704 (2011).
[Crossref]

J. Phys. Chem. A (1)

L. F. L. da Silva, T. Andrade-Filho, P. T. C. Freire, J. M. Filho, J. G. da Silva Filho, G. D. Saraiva, S. G. C. Moreira, and F. F. de Sousa, J. Phys. Chem. A 121, 4830 (2017).
[Crossref]

Langmuir (2)

E. Bittrich, S. Burkert, M. Müller, K.-J. Eichhorn, M. Stamm, and P. Uhlmann, Langmuir 28, 3439 (2012).
[Crossref]

Y. Maeda, T. Higuchi, and I. Ikeda, Langmuir 16, 7503 (2000).
[Crossref]

Mater. Sci. Eng. C (1)

J. M. Silva, S. Akkache, A. C. Araújo, Y. Masmoudi, R. L. Reis, E. Badens, and A. R. C. Duarte, Mater. Sci. Eng. C 99, 599 (2019).
[Crossref]

Materials (1)

S. Y. Kee, Y. Munusamy, K. S. Ong, H. Simon, C. Metselaar, S. Y. Chee, and K. C. Lai, Materials 10, 873 (2017).
[Crossref]

Opt. Lett. (1)

Prog. Mater. Sci. (1)

K. Pielichowska and K. Pielichowski, Prog. Mater. Sci. 65, 67 (2014).
[Crossref]

Rev. Sci. Instrum. (2)

J. C. Vap, S. E. Nauyoks, M. R. Benson, and M. A. Marciniak, Rev. Sci. Instrum. 88, 103104 (2017).
[Crossref]

T. Stanislavchuk, T. Kang, P. Rogers, C. Standard, R. Basistyy, A. Kotelyanskii, G. Nita, T. Zhou, G. Carr, M. Kotelyanskii, and A. Sirenko, Rev. Sci. Instrum. 84, 023901 (2013).
[Crossref]

RSC Adv. (1)

I. Matai and P. Gopinath, RSC Adv. 6, 24808 (2016).
[Crossref]

Thin Solid Films (2)

R. M. A. Azzam, Thin Solid Films 234, 371 (1993).
[Crossref]

C. Bernhard, J. Humliček, and B. Keimer, Thin Solid Films 455–456, 143 (2004).
[Crossref]

Other (5)

H. G. Tompkins and E. A. Irene, Handbook of Ellipsometry (William Andrew, 2005).

H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, 2007).

M. Losurdo and K. Hingerl, Ellipsometry at the Nanoscale (Springer, 2013).

K. Hinrichs and K.-J. Eichhorn, Ellipsometry of Functional Organic Surfaces and Films (Springer, 2018).

A. Röseler and E.-H. Korte, Handbook of Vibrational Spectroscopy, J. M. Chalmers and P. R. Griffiths, eds. (Wiley, 2006).

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Figures (4)

Fig. 1.
Fig. 1. Schematic of the four-channel single-shot IR laser ellipsometer.
Fig. 2.
Fig. 2. Overview of polarimetric amplitude ( tan Ψ ) and phase ( cos Δ ) spectra of a 150 nm MA film compared with data from high-sensitivity FT-IR ellipsometry. The FT-IR set-up needed to be purged with dried air ( r.H. 0.1 % ), whereas the QCL single-shot set-up was operated under ambient conditions ( r.H. > 20 % ). The inset shows MA’s chemical structure.
Fig. 3.
Fig. 3. Top: Time-resolved polarimetric spectra of the MA film’s ν ( C = O ) band during heating above MA’s phase-transition temperature. Data were recorded in 0.056 cm 1 steps and smoothed with a 4 cm 1 moving-average filter. Bottom: optical images ( 140 μm × 80 μm within the measured area) of the film’s crystallized state below and liquid-like state above the transition.
Fig. 4.
Fig. 4. Fitted time-resolved evolution of the two ν ( C = O ) band components with heating temperature. Slightly higher than expected, the apparent sharp phase-transition temperature is observed at about 55.9°C due to the delayed heat transfer through the thick glass substrate.

Equations (2)

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ϱ = tan Ψ · e i Δ = r p r s
cos 2 Ψ = I 90 ° I 0 ° I 90 ° + I 0 ° , sin 2 Ψ cos Δ = I 45 ° I 135 ° I 45 ° + I 135 ° .

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