Abstract

Longitudinal averaging of the interference pattern in a compensated backscattering interferometer provides improved compensation for temperature induced refractive index perturbations. Fringe pattern likeness between two discrete detection regions of an off-the-shelf microfluidic chip illuminated by an inexpensive diode laser scales with interrogation length. Averaging the intensity distribution along a 2.75 mm length of the channel results in a 750-fold reduction in sensitivity to temperature and a baseline noise level of 3×108 refractive index units (RIU). These observations enable nanoliter-volume interferometric measurements at a level of 107  RIU in the presence of a 2°C temperature variation without the need for temperature control.

© 2018 Optical Society of America

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