Abstract

We observed an induced thermal effect in Er3+/Yb3+-codoped silicate fibers (EYDFs) after gamma radiation. It is further found that the induced thermal effect is reversible under room temperature. This is the first report, to the best of our knowledge, on such a radiation-induced reversible thermal effect on EYDFs. This phenomenon, ascribed to radiation effect on EYDFs, can be used to design a novel fiber-optic temperature sensor with tailored properties.

© 2018 Optical Society of America

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References

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2016 (4)

J. Jin, C. Liu, J. Liu, and Y. Hou, Chin. Opt. Lett. 14, 030601 (2016).
[Crossref]

D. Sporea, L. Mihai, D. Neguţ, Y. Luo, B. Yan, M. Ding, S. Wei, and G.-D. Peng, Sci. Rep. 6, 29827 (2016).
[Crossref]

J. Jin, H. Zhang, J. Liu, and Y. Li, IEEE Sens. J. 16, 8928 (2016).
[Crossref]

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

2015 (3)

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

J. Jin, Y. Hou, and C. Liu, Appl. Opt. 54, 940 (2015).
[Crossref]

J. Wen, W. Liu, Y. Dong, Y. Luo, G.-D. Peng, N. Chen, F. Pang, Z. Chen, and T. Wang, Opt. Express 23, 29004 (2015).
[Crossref]

2014 (3)

J. Jin, R. Xu, J. Liu, and N. Song, Opt. Fiber Technol. 20, 110 (2014).
[Crossref]

A. L. Tomashuk, M. V. Grekov, S. A. Vasiliev, and V. V. Svetukhin, Opt. Express 22, 16778 (2014).
[Crossref]

M. Chiesa, K. Mattsson, S. Taccheo, T. Robin, L. Lablonde, D. Mechin, and D. Milanese, J. Non-Cryst. Solids 403, 97 (2014).
[Crossref]

2013 (3)

T. Deschamps, H. Vezin, C. Gonnet, and N. Ollier, Opt. Express 21, 8382 (2013).
[Crossref]

J. Jin, J. Liu, X. Wang, J. Guo, and N. Song, J. Lightwave Technol. 31, 839 (2013).
[Crossref]

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

2012 (2)

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Y. Luo, J. Wen, J. Zhang, J. Canning, and G.-D. Peng, Opt. Lett. 37, 3447 (2012).
[Crossref]

2011 (2)

A. V. Kir’yanov, V. V. Dvoyrin, V. M. Mashinsky, N. N. Il’ichev, N. S. Kozlova, and E. M. Dianov, Opt. Express 19, 6599 (2011).
[Crossref]

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

2010 (1)

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Proc. SPIE 7580, 75800B (2010).
[Crossref]

2009 (5)

M. C. Paul, D. Bohra, A. Dhar, R. Sen, P. Bhatnagar, and K. Dasgupta, J. Non-Cryst. Solids 355, 1496 (2009).
[Crossref]

B. Fox, K. Simmons-Potter, S. Moore, J. Fisher, and D. Meister, Proc. SPIE 7434, 74340C (2009).
[Crossref]

M. Leich, U. Röpke, S. Jetschke, S. Unger, V. Reichel, and J. Kirchhof, Opt. Express 17, 12588 (2009).
[Crossref]

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Opt. Express 17, 9940 (2009).
[Crossref]

M. Peng, Q. Zhao, J. Qiu, and L. Wondraczek, J. Am. Ceram. Soc. 92, 542 (2009).
[Crossref]

2008 (1)

S. O’Keeffe, C. Fitzpatrick, E. Lewis, and A. Al-Shamma’a, Sens. Rev. 28, 136 (2008).
[Crossref]

1998 (1)

D. L. Griscom and M. Mizuguchi, J. Non-Cryst. Solids 239, 66 (1998).
[Crossref]

1994 (1)

H. Hideo and K. Hiroshi, Nucl. Instrum. Methods Phys. Res. Sect. B 91, 395 (1994).
[Crossref]

1984 (1)

K. Nagasawa, M. Tanabe, K. Yahagi, A. Iino, and T. Kuroha, Jpn. J. Appl. Phys. 23, 606 (1984).
[Crossref]

1983 (2)

M. Jani, R. Bossoli, and L. Halliburton, Phys. Rev. B 27, 2285 (1983).
[Crossref]

D. L. Griscom, E. Friebele, K. Long, and J. Fleming, J. Appl. Phys. 54, 3743 (1983).
[Crossref]

Al-Shamma’a, A.

S. O’Keeffe, C. Fitzpatrick, E. Lewis, and A. Al-Shamma’a, Sens. Rev. 28, 136 (2008).
[Crossref]

Arai, T.

T. Arai, K. Ichii, S. Tanigawa, and M. Fujimaki, in Conference on Optical Fiber Communication—Incudes Post Deadline Papers (IEEE, 2009), pp. 1–3.

Assmann, W.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Bhatnagar, P.

M. C. Paul, D. Bohra, A. Dhar, R. Sen, P. Bhatnagar, and K. Dasgupta, J. Non-Cryst. Solids 355, 1496 (2009).
[Crossref]

Bigot, L.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Bohra, D.

M. C. Paul, D. Bohra, A. Dhar, R. Sen, P. Bhatnagar, and K. Dasgupta, J. Non-Cryst. Solids 355, 1496 (2009).
[Crossref]

Boo, S.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Bossoli, R.

M. Jani, R. Bossoli, and L. Halliburton, Phys. Rev. B 27, 2285 (1983).
[Crossref]

Bouazaoui, M.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Boukenter, A.

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

Brichard, B.

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

Canning, J.

Chen, N.

Chen, Z.

Chiesa, M.

M. Chiesa, K. Mattsson, S. Taccheo, T. Robin, L. Lablonde, D. Mechin, and D. Milanese, J. Non-Cryst. Solids 403, 97 (2014).
[Crossref]

Dasgupta, K.

M. C. Paul, D. Bohra, A. Dhar, R. Sen, P. Bhatnagar, and K. Dasgupta, J. Non-Cryst. Solids 355, 1496 (2009).
[Crossref]

Denker, B.

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

Deschamps, T.

Dhar, A.

M. C. Paul, D. Bohra, A. Dhar, R. Sen, P. Bhatnagar, and K. Dasgupta, J. Non-Cryst. Solids 355, 1496 (2009).
[Crossref]

Dianov, E.

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

Dianov, E. M.

Ding, M.

D. Sporea, L. Mihai, D. Neguţ, Y. Luo, B. Yan, M. Ding, S. Wei, and G.-D. Peng, Sci. Rep. 6, 29827 (2016).
[Crossref]

Dong, Y.

Dvoyrin, V. V.

Ekström, C.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

El Hamzaoui, H.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Fisher, J.

B. Fox, K. Simmons-Potter, S. Moore, J. Fisher, and D. Meister, Proc. SPIE 7434, 74340C (2009).
[Crossref]

Fitzpatrick, C.

S. O’Keeffe, C. Fitzpatrick, E. Lewis, and A. Al-Shamma’a, Sens. Rev. 28, 136 (2008).
[Crossref]

Fleming, J.

D. L. Griscom, E. Friebele, K. Long, and J. Fleming, J. Appl. Phys. 54, 3743 (1983).
[Crossref]

Fox, B.

B. Fox, K. Simmons-Potter, S. Moore, J. Fisher, and D. Meister, Proc. SPIE 7434, 74340C (2009).
[Crossref]

Friebele, E.

D. L. Griscom, E. Friebele, K. Long, and J. Fleming, J. Appl. Phys. 54, 3743 (1983).
[Crossref]

Fujimaki, M.

T. Arai, K. Ichii, S. Tanigawa, and M. Fujimaki, in Conference on Optical Fiber Communication—Incudes Post Deadline Papers (IEEE, 2009), pp. 1–3.

Galagan, B.

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

Girard, S.

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

Gonnet, C.

Greiter, M.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Grekov, M. V.

Griscom, D. L.

D. L. Griscom and M. Mizuguchi, J. Non-Cryst. Solids 239, 66 (1998).
[Crossref]

D. L. Griscom, E. Friebele, K. Long, and J. Fleming, J. Appl. Phys. 54, 3743 (1983).
[Crossref]

Guo, J.

Gusarov, A.

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

Habs, D.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Halliburton, L.

M. Jani, R. Bossoli, and L. Halliburton, Phys. Rev. B 27, 2285 (1983).
[Crossref]

Han, W.-T.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Hänsch, T. W.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Hari Babu, B.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Hideo, H.

H. Hideo and K. Hiroshi, Nucl. Instrum. Methods Phys. Res. Sect. B 91, 395 (1994).
[Crossref]

Hiroshi, K.

H. Hideo and K. Hiroshi, Nucl. Instrum. Methods Phys. Res. Sect. B 91, 395 (1994).
[Crossref]

Hoeschen, C.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Holzwarth, R.

M. Lezius, K. Predehl, W. Stöwer, A. Türler, M. Greiter, C. Hoeschen, P. Thirolf, W. Assmann, D. Habs, A. Prokofiev, C. Ekström, T. W. Hänsch, and R. Holzwarth, IEEE Trans. Nucl. Sci. 59, 425 (2012).
[Crossref]

Honkanen, S.

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Proc. SPIE 7580, 75800B (2010).
[Crossref]

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Opt. Express 17, 9940 (2009).
[Crossref]

Hou, Y.

i Ponsoda, J. J. M.

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Proc. SPIE 7580, 75800B (2010).
[Crossref]

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Opt. Express 17, 9940 (2009).
[Crossref]

Ibarra, A.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Ichii, K.

T. Arai, K. Ichii, S. Tanigawa, and M. Fujimaki, in Conference on Optical Fiber Communication—Incudes Post Deadline Papers (IEEE, 2009), pp. 1–3.

Iino, A.

K. Nagasawa, M. Tanabe, K. Yahagi, A. Iino, and T. Kuroha, Jpn. J. Appl. Phys. 23, 606 (1984).
[Crossref]

Il’ichev, N. N.

Jani, M.

M. Jani, R. Bossoli, and L. Halliburton, Phys. Rev. B 27, 2285 (1983).
[Crossref]

Jeong, H.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Jeong, S.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Jetschke, S.

Jin, J.

Ju, S.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Kim, Y.

S. Jeong, S. Ju, Y. Kim, H. Jeong, S. Boo, and W.-T. Han, J. Nanosci. Nanotechnol. 16, 6378 (2016).
[Crossref]

Kir’yanov, A. V.

Kirchhof, J.

Kononenko, V.

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

Konov, V.

V. Kononenko, V. Pashinin, B. Galagan, S. Sverchkov, B. Denker, V. Konov, and E. Dianov, Laser Phys. 21, 1585 (2011).
[Crossref]

Koplow, J. P.

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Proc. SPIE 7580, 75800B (2010).
[Crossref]

M. J. Söderlund, J. J. M. i Ponsoda, J. P. Koplow, and S. Honkanen, Opt. Express 17, 9940 (2009).
[Crossref]

Kozlova, N. S.

Kuhnhenn, J.

S. Girard, J. Kuhnhenn, A. Gusarov, B. Brichard, M. Van Uffelen, Y. Ouerdane, A. Boukenter, and C. Marcandella, IEEE Trans. Nucl. Sci. 60, 2015 (2013).
[Crossref]

Kuroha, T.

K. Nagasawa, M. Tanabe, K. Yahagi, A. Iino, and T. Kuroha, Jpn. J. Appl. Phys. 23, 606 (1984).
[Crossref]

Lablonde, L.

M. Chiesa, K. Mattsson, S. Taccheo, T. Robin, L. Lablonde, D. Mechin, and D. Milanese, J. Non-Cryst. Solids 403, 97 (2014).
[Crossref]

Lancry, M.

B. Hari Babu, N. Ollier, M. León Pichel, H. El Hamzaoui, B. Poumellec, L. Bigot, I. Savelii, M. Bouazaoui, A. Ibarra, and M. Lancry, J. Appl. Phys. 118, 123107 (2015).
[Crossref]

Leich, M.

León Pichel, M.

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Figures (7)

Fig. 1.
Fig. 1. RIA spectrum of 200 Gy gamma-radiation-irradiated EYDF with Gaussian fitting.
Fig. 2.
Fig. 2. Experimental configuration for the reversible thermal effect measurements.
Fig. 3.
Fig. 3. Thermal processes for thermal effect study including two consecutive heat treatments and data measurement point.
Fig. 4.
Fig. 4. Spectral comparison of RIA at different temperatures.
Fig. 5.
Fig. 5. Comparison of thermal effect between preheat-treated irradiated and nonirradiated samples. Inset shows RIA of irradiated sample at 1300 nm as a function of temperature during the whole process.
Fig. 6.
Fig. 6. Thermal effect during consecutive step-wise heat treatment between RT and 500°C for sample preheat treated between RT and 600°C.
Fig. 7.
Fig. 7. Repeatability of induced thermal effect for sample preheat treated between RT and 300°C.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

RIA(λ)=αirr(λ)αnon-irr(λ),
RIA(λ,T,t)=RIA(λ,T0,t0)+ΔαT(λ,T,t),
ΔαT(λ,T,t)=10/L×log(PT(λ,t)/P0(λ,t0)),