Abstract

The negative Goos–Hänchen shift (GHS) on a two-dimensional photonic crystal with an effective negative refractive index is investigated by simulation and experiment. The measured refractive index of the fabricated photonic crystal is nearly 0.44. The difference between the Goos–Hänchen shift of the transverse electric wave GTE and that of the transverse magnetic wave GTM (DGHS) in the height direction of a silicon rod is measured at three incident angles. The result shows that DGHS is always smaller than GTM, thus GTE<0; therefore, the negative GHS does occur on the surface of the photonic crystal with a negative refractive index.

© 2017 Optical Society of America

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