Abstract

We demonstrate experimentally that spurious effects caused by interference can be eliminated in passive near-field imaging by implementing a simple random illumination. We show that typical imaging artifacts are effectively eliminated when the radiation emitted by a pseudo-thermal source illuminates the sample and the scattered field is collected by an aperture probe over essentially all angles of incidence. This novel pseudo-thermal source can be easily implemented and significantly enhances the performance of passive near-field imaging.

© 2017 Optical Society of America

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