Abstract

A computationally efficient algorithm based on the reduced Rayleigh equation, combined with an optimization scheme, is used to accurately retrieve the morphological parameters of a two-dimensional plasmonic photonic crystal from angle-resolved spectroscopic Mueller matrix ellipsometric measurements. The numerical method is successfully tested against experimental data and gives morphological parameters consistent with SEM and AFM measurements.

© 2017 Optical Society of America

Dispersion of polarization coupling, localized and collective plasmon modes in a metallic photonic crystal mapped by Mueller Matrix Ellipsometry

Thomas Brakstad, Morten Kildemo, Zahra Ghadyani, and Ingve Simonsen
Opt. Express 23(17) 22800-22815 (2015)

Optical response of rectangular array of elliptical plasmonic particles on glass revealed by Mueller matrix ellipsometry and finite element modeling

Per Magnus Walmsness, Thomas Brakstad, Brage B. Svendsen, Jean-Philippe Banon, John C. Walmsley, and Morten Kildemo
J. Opt. Soc. Am. B 36(7) E78-E87 (2019)

Spectroscopic Mueller matrix ellipsometry of a gap surface plasmon array at conical incidences

Per Magnus Walmsness, Nathan Hale, and Morten Kildemo
J. Opt. Soc. Am. B 38(9) 2551-2561 (2021)

Optimization of instrument matrix for Mueller matrix ellipsometry based on partial elements analysis of the Mueller matrix

Xiaobo Li, Haofeng Hu, Lan Wu, and Tiegen Liu
Opt. Express 25(16) 18872-18884 (2017)

Characterization of pixelated nanogratings in 3D holographic display by an imaging Mueller matrix ellipsometry

Chao Chen, Xiuguo Chen, Zhongwen Xia, Jiacheng Shi, Sheng Sheng, Wen Qiao, and Shiyuan Liu
Opt. Lett. 47(14) 3580-3583 (2022)