Abstract

We present a method of performing high-speed rotational anisotropy nonlinear optical harmonic generation experiments at rotational frequencies of several hertz by projecting the harmonic light reflected at different angles from a sample onto a stationary position-sensitive detector. The high rotational speed of the technique, 103 to 104 times larger than existing methods, permits precise measurements of the crystallographic and electronic symmetries of samples by averaging over low frequency laser-power, beam-pointing, and pulse-width fluctuations. We demonstrate the sensitivity of our technique by resolving the bulk fourfold rotational symmetry of GaAs about its [001] axis using second-harmonic generation.

© 2015 Optical Society of America

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Corrections

8 October 2015: A correction was made to the acknowledgments.


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