Abstract

A method for high-resolution imaging that we call virtual fluorescence emission difference microscopy (vFED) is presented. In vFED the analyzed samples are scanned only by a doughnut-shaped pattern and imaged by a detector array, which is very different from the previous FED system. By using photon reassignment, we can obtain imaging results with matched solid and hollow point spread functions, and the difference between them is used to estimate the spatial distribution of the analyzed sample. This method results in greatly simplified equipment in the configuration and enhanced imaging speed. Results show that the resolution can be enhanced by at least 27% compared with that in confocal microscopy with a point detector, or is 1.8–2-fold higher than that in wide-field microscopy. Plus, negative intensities can be avoided by using vFED during the subtraction process, leading to the elimination of the deformation in reconstructed images.

© 2015 Optical Society of America

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